KR101159495B1 - 파면 조정 및 향상된 3?ｄ 측정을 위한 방법 및 장치 - Google Patents

파면 조정 및 향상된 3?ｄ 측정을 위한 방법 및 장치 Download PDF

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Publication number
KR101159495B1
KR101159495B1 KR1020117027171A KR20117027171A KR101159495B1 KR 101159495 B1 KR101159495 B1 KR 101159495B1 KR 1020117027171 A KR1020117027171 A KR 1020117027171A KR 20117027171 A KR20117027171 A KR 20117027171A KR 101159495 B1 KR101159495 B1 KR 101159495B1
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phase
wavefront
different
amplitude
image
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KR20110130532A (ko
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요엘 아리엘리
샤이 울핑
엠마누엘 란쯔만
가브리엘 페이긴
탈 구쯔니
요람 사반
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이코스비젼 시스팀스 엔.브이.
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0675—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02087—Combining two or more images of the same region
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020117027171A 2004-03-11 2005-03-11 파면 조정 및 향상된 3?ｄ 측정을 위한 방법 및 장치 Expired - Fee Related KR101159495B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US55257004P 2004-03-11 2004-03-11
US60/552,570 2004-03-11
PCT/IL2005/000285 WO2005086582A2 (en) 2004-03-11 2005-03-11 Methods and apparatus for wavefront manipulations and improved 3-d measurements

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020067018549A Division KR101159380B1 (ko) 2004-03-11 2005-03-11 파면 조정 및 향상된 3?ｄ 측정을 위한 방법 및 장치

Publications (2)

Publication Number Publication Date
KR20110130532A KR20110130532A (ko) 2011-12-05
KR101159495B1 true KR101159495B1 (ko) 2012-06-22

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KR1020067018549A Expired - Fee Related KR101159380B1 (ko) 2004-03-11 2005-03-11 파면 조정 및 향상된 3?ｄ 측정을 위한 방법 및 장치
KR1020117027171A Expired - Fee Related KR101159495B1 (ko) 2004-03-11 2005-03-11 파면 조정 및 향상된 3?ｄ 측정을 위한 방법 및 장치

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Country Status (7)

Country Link
US (1) US8319975B2 (enExample)
EP (1) EP1751492A4 (enExample)
JP (2) JP2007533977A (enExample)
KR (2) KR101159380B1 (enExample)
CN (1) CN100485312C (enExample)
CA (1) CA2559324A1 (enExample)
WO (1) WO2005086582A2 (enExample)

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EP1751492A4 (en) 2016-07-20
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CA2559324A1 (en) 2005-09-22
JP2007533977A (ja) 2007-11-22
WO2005086582A2 (en) 2005-09-22
EP1751492A2 (en) 2007-02-14
CN100485312C (zh) 2009-05-06
KR20110130532A (ko) 2011-12-05
US8319975B2 (en) 2012-11-27
HK1119231A1 (zh) 2009-02-27
CN101076705A (zh) 2007-11-21
WO2005086582A3 (en) 2007-06-14
KR101159380B1 (ko) 2012-06-27
US20100002950A1 (en) 2010-01-07

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