KR101066341B1 - 고체 촬상 장치 - Google Patents

고체 촬상 장치 Download PDF

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Publication number
KR101066341B1
KR101066341B1 KR1020107019369A KR20107019369A KR101066341B1 KR 101066341 B1 KR101066341 B1 KR 101066341B1 KR 1020107019369 A KR1020107019369 A KR 1020107019369A KR 20107019369 A KR20107019369 A KR 20107019369A KR 101066341 B1 KR101066341 B1 KR 101066341B1
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register
charge
output
corner
multiplication
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Korean (ko)
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KR20100107067A (ko
Inventor
히사노리 스즈키
야스히토 요네타
신-이치로 다카기
겐타로 마에타
마사하루 무라마츠
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하마마츠 포토닉스 가부시키가이샤
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/72—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors using frame transfer [FT]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00—Charge transfer devices
    • H10D44/40—Charge-coupled devices [CCD]
    • H10D44/45—Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • H10D44/454—Output structures
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/15—Charge-coupled device [CCD] image sensors
    • H10F39/158—Charge-coupled device [CCD] image sensors having arrangements for blooming suppression

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
KR1020107019369A 2009-01-30 2010-01-22 고체 촬상 장치 Active KR101066341B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009020453A JP5270392B2 (ja) 2009-01-30 2009-01-30 固体撮像装置
JPJP-P-2009-020453 2009-01-30

Publications (2)

Publication Number Publication Date
KR20100107067A KR20100107067A (ko) 2010-10-04
KR101066341B1 true KR101066341B1 (ko) 2011-09-20

Family

ID=42395541

Family Applications (1)

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KR1020107019369A Active KR101066341B1 (ko) 2009-01-30 2010-01-22 고체 촬상 장치

Country Status (7)

Country Link
US (1) US8552352B2 (https=)
EP (1) EP2249390B1 (https=)
JP (1) JP5270392B2 (https=)
KR (1) KR101066341B1 (https=)
CN (1) CN101960597B (https=)
TW (1) TWI499294B (https=)
WO (1) WO2010087279A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5243983B2 (ja) * 2009-01-30 2013-07-24 浜松ホトニクス株式会社 電子増倍機能内蔵型の固体撮像素子
JP5330001B2 (ja) * 2009-01-30 2013-10-30 浜松ホトニクス株式会社 固体撮像装置
US8411189B2 (en) * 2011-05-25 2013-04-02 Truesense Imaging, Inc. Multi-purpose architecture for CCD image sensors
US8800130B2 (en) 2011-05-25 2014-08-12 Truesense Imaging, Inc. Methods for producing image sensors having multi-purpose architecture
US8773563B2 (en) 2011-05-25 2014-07-08 Truesense Imaging, Inc. Multi-purpose architecture for CCD image sensors
CN110335882B (zh) * 2019-06-25 2021-05-07 中国电子科技集团公司第四十四研究所 一种可提高帧转移ccd响应度像元结构
DE112020006344T5 (de) * 2019-12-26 2022-10-27 Hamamatsu Photonics K.K. Range-Imaging-Sensor und Verfahren zur Herstellung dieses Sensors

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0530432A (ja) * 1991-07-19 1993-02-05 Sharp Corp 固体撮像装置
JP2002218327A (ja) 2001-01-15 2002-08-02 Sony Corp 固体撮像装置およびカメラシステム
JP2002325720A (ja) 2001-04-27 2002-11-12 Fuji Photo Film Co Ltd 内視鏡装置
JP2006227315A (ja) 2005-02-17 2006-08-31 Hamamatsu Photonics Kk 撮像装置、撮像システム、共焦点顕微鏡、及び撮像方法

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DE69231482T2 (de) * 1991-07-11 2001-05-10 Texas Instruments Inc Für einen CCD-Bildsensor mit kleiner Bildpunktgrösse geeigneter Ladungsvervielfachungsdetektor (CMD)
GB2323471B (en) * 1997-03-22 2002-04-17 Eev Ltd CCd imagers
US6278142B1 (en) * 1999-08-30 2001-08-21 Isetex, Inc Semiconductor image intensifier
JP5026641B2 (ja) 2000-04-28 2012-09-12 テキサス インスツルメンツ インコーポレイテッド 固体撮像センサ
US6509616B2 (en) * 2000-09-29 2003-01-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and its manufacturing method
US7420605B2 (en) * 2001-01-18 2008-09-02 E2V Technologies (Uk) Limited Solid state imager arrangements
US7190400B2 (en) * 2001-06-04 2007-03-13 Texas Instruments Incorporated Charge multiplier with logarithmic dynamic range compression implemented in charge domain
US7184085B2 (en) * 2001-08-20 2007-02-27 Fuji Photo Film Co., Ltd. Charge multiplying solid-state electronic image sensing device and method of controlling same
JP2003158679A (ja) * 2001-08-20 2003-05-30 Fuji Photo Film Co Ltd 電荷増倍型固体電子撮像装置およびその制御方法
US6784412B2 (en) * 2001-08-29 2004-08-31 Texas Instruments Incorporated Compact image sensor layout with charge multiplying register
US6917041B2 (en) 2002-03-18 2005-07-12 Massachusetts Institute Of Technology Event-driven charge-coupled device design and applications therefor
JP3689866B2 (ja) * 2002-05-30 2005-08-31 日本テキサス・インスツルメンツ株式会社 Ｃｍｄ及びｃｍｄ搭載ｃｃｄ装置
US20050029553A1 (en) * 2003-08-04 2005-02-10 Jaroslav Hynecek Clocked barrier virtual phase charge coupled device image sensor
GB2413007A (en) * 2004-04-07 2005-10-12 E2V Tech Uk Ltd Multiplication register for amplifying signal charge
US7522205B2 (en) * 2004-09-10 2009-04-21 Eastman Kodak Company Image sensor with charge multiplication
GB2424758A (en) * 2005-03-31 2006-10-04 E2V Tech CCD device
GB2431538B (en) * 2005-10-24 2010-12-22 E2V Tech CCD device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0530432A (ja) * 1991-07-19 1993-02-05 Sharp Corp 固体撮像装置
JP2002218327A (ja) 2001-01-15 2002-08-02 Sony Corp 固体撮像装置およびカメラシステム
JP2002325720A (ja) 2001-04-27 2002-11-12 Fuji Photo Film Co Ltd 内視鏡装置
JP2006227315A (ja) 2005-02-17 2006-08-31 Hamamatsu Photonics Kk 撮像装置、撮像システム、共焦点顕微鏡、及び撮像方法

Also Published As

Publication number Publication date
EP2249390B1 (en) 2013-10-09
JP2010177564A (ja) 2010-08-12
US20110024606A1 (en) 2011-02-03
CN101960597B (zh) 2012-07-04
WO2010087279A1 (ja) 2010-08-05
TWI499294B (zh) 2015-09-01
TW201119373A (en) 2011-06-01
KR20100107067A (ko) 2010-10-04
JP5270392B2 (ja) 2013-08-21
EP2249390A1 (en) 2010-11-10
CN101960597A (zh) 2011-01-26
US8552352B2 (en) 2013-10-08
EP2249390A4 (en) 2012-03-07

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