KR101036068B1 - 완충 산 에칭 용액을 위한 플루오르화 계면활성제 - Google Patents

완충 산 에칭 용액을 위한 플루오르화 계면활성제 Download PDF

Info

Publication number
KR101036068B1
KR101036068B1 KR1020057008079A KR20057008079A KR101036068B1 KR 101036068 B1 KR101036068 B1 KR 101036068B1 KR 1020057008079 A KR1020057008079 A KR 1020057008079A KR 20057008079 A KR20057008079 A KR 20057008079A KR 101036068 B1 KR101036068 B1 KR 101036068B1
Authority
KR
South Korea
Prior art keywords
etching
solution
group
acid
etching solution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020057008079A
Other languages
English (en)
Korean (ko)
Other versions
KR20050072795A (ko
Inventor
마이클 제이. 패런트
패트리샤 엠. 사부
리챠드 엠. 플린
Original Assignee
쓰리엠 이노베이티브 프로퍼티즈 컴파니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 쓰리엠 이노베이티브 프로퍼티즈 컴파니 filed Critical 쓰리엠 이노베이티브 프로퍼티즈 컴파니
Publication of KR20050072795A publication Critical patent/KR20050072795A/ko
Application granted granted Critical
Publication of KR101036068B1 publication Critical patent/KR101036068B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/04Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/08Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/20Dry etching; Plasma etching; Reactive-ion etching
    • H10P50/28Dry etching; Plasma etching; Reactive-ion etching of insulating materials
    • H10P50/282Dry etching; Plasma etching; Reactive-ion etching of insulating materials of inorganic materials
    • H10P50/283Dry etching; Plasma etching; Reactive-ion etching of insulating materials of inorganic materials by chemical means
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • C09K13/04Etching, surface-brightening or pickling compositions containing an inorganic acid
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/60Wet etching
    • H10P50/64Wet etching of semiconductor materials
    • H10P50/642Chemical etching

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • ing And Chemical Polishing (AREA)
KR1020057008079A 2002-11-08 2003-09-11 완충 산 에칭 용액을 위한 플루오르화 계면활성제 Expired - Fee Related KR101036068B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/290,765 US7169323B2 (en) 2002-11-08 2002-11-08 Fluorinated surfactants for buffered acid etch solutions
US10/290,765 2002-11-08

Publications (2)

Publication Number Publication Date
KR20050072795A KR20050072795A (ko) 2005-07-12
KR101036068B1 true KR101036068B1 (ko) 2011-05-19

Family

ID=32229103

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020057008079A Expired - Fee Related KR101036068B1 (ko) 2002-11-08 2003-09-11 완충 산 에칭 용액을 위한 플루오르화 계면활성제

Country Status (9)

Country Link
US (1) US7169323B2 (https=)
EP (1) EP1558697B1 (https=)
JP (1) JP4160562B2 (https=)
KR (1) KR101036068B1 (https=)
CN (1) CN1324110C (https=)
AT (1) ATE345375T1 (https=)
AU (1) AU2003272331A1 (https=)
DE (1) DE60309738T2 (https=)
WO (1) WO2004044091A1 (https=)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6890452B2 (en) * 2002-11-08 2005-05-10 3M Innovative Properties Company Fluorinated surfactants for aqueous acid etch solutions
WO2005045895A2 (en) * 2003-10-28 2005-05-19 Sachem, Inc. Cleaning solutions and etchants and methods for using same
US7294610B2 (en) * 2004-03-03 2007-11-13 3M Innovative Properties Company Fluorinated sulfonamide surfactants for aqueous cleaning solutions
JP4677890B2 (ja) * 2005-11-29 2011-04-27 信越半導体株式会社 埋め込み拡散エピタキシャルウエーハの製造方法および埋め込み拡散エピタキシャルウエーハ
JP2008124135A (ja) * 2006-11-09 2008-05-29 Stella Chemifa Corp 微細加工処理剤、及びそれを用いた微細加工処理方法
EP2139030B1 (en) * 2007-04-13 2014-05-14 Daikin Industries, Ltd. Etching solution
KR101030057B1 (ko) * 2008-07-16 2011-04-22 (주) 이피웍스 실리콘 폐기물의 재생방법 및 그 방법으로 재생된 실리콘조성물
US20100160458A1 (en) * 2008-12-23 2010-06-24 3M Innovative Properties Company Method of making a composition and aqueous composition preparable thereby
US20100155657A1 (en) * 2008-12-23 2010-06-24 3M Innovative Properties Company Aqueous composition containing fluorinated sulfonamide and sulfonamidate compounds
WO2010113744A1 (ja) * 2009-03-30 2010-10-07 東レ株式会社 導電膜除去剤および導電膜除去方法
US8030112B2 (en) * 2010-01-22 2011-10-04 Solid State System Co., Ltd. Method for fabricating MEMS device
WO2013022673A2 (en) * 2011-08-10 2013-02-14 3M Innovative Properties Company Perfluoroalkyl sulfonamides surfactants for photoresist rinse solutions
RU2015128132A (ru) * 2012-12-14 2017-01-18 Басф Се Применение композиций, содержащих поверхностно-активное вещество и средство придания гидрофобности, для предохранения рельефа от разрушения при обработке рельефных материалов с линейными размерами, равными 50 нм или менее
JP6444316B2 (ja) 2013-01-29 2018-12-26 スリーエム イノベイティブ プロパティズ カンパニー 界面活性剤並びにその製造及び使用方法
KR101530606B1 (ko) * 2014-03-18 2015-07-01 주식회사 스노젠 인산 및 황산계 과불소화알킬 에스테르 계면 활성제와 이를 함유하는 크롬 식각액 및 저온 공정용 소핑제
JP6433730B2 (ja) * 2014-09-08 2018-12-05 東芝メモリ株式会社 半導体装置の製造方法及び半導体製造装置
EP3191532B1 (en) 2014-09-11 2019-08-28 3M Innovative Properties Company Fluorinated surfactant containing compositions
CN104388091B (zh) * 2014-10-25 2016-06-01 江阴市化学试剂厂有限公司 缓冲氧化腐蚀液制备方法
US11193059B2 (en) 2016-12-13 2021-12-07 Current Lighting Solutions, Llc Processes for preparing color stable red-emitting phosphor particles having small particle size
KR102460326B1 (ko) * 2018-06-28 2022-10-31 오씨아이 주식회사 실리콘 기판 식각 용액
TW202035361A (zh) * 2018-12-12 2020-10-01 美商3M新設資產公司 氟化胺氧化物界面活性劑
CN111171965B (zh) * 2020-01-20 2021-07-20 安徽建筑大学 一种运行清洗多功能复合清洗液
CN112939804B (zh) * 2021-02-04 2022-11-15 济宁康德瑞化工科技有限公司 一种有机胺氧化物的制备方法
CN116590020A (zh) 2021-05-20 2023-08-15 斯泰拉化工公司 微细加工处理剂、和微细加工处理方法
DE102021116206B3 (de) * 2021-06-23 2022-09-29 Infineon Technologies Bipolar Gmbh & Co. Kg Verfahren und Vorrichtung zur Herstellung einer Randstruktur eines Halbleiterbauelements

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4370254A (en) * 1979-05-25 1983-01-25 Bayer Aktiengesellschaft Use of perfluoroalkane sulphonamide salts as surface active agents

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1037857A (en) 1963-07-11 1966-08-03 Pennsalt Chemicals Corp Method and composition for cleaning resin coated substrates
US4055458A (en) 1975-08-07 1977-10-25 Bayer Aktiengesellschaft Etching glass with HF and fluorine-containing surfactant
DE3038985A1 (de) * 1980-10-15 1982-05-27 Bayer Ag, 5090 Leverkusen Verfahren zum saeurepolieren von glas
EP0073863B1 (en) 1981-09-08 1985-07-03 Dainippon Ink And Chemicals, Inc. Fluorine-containing aminosulfonate
JPS6039176A (ja) 1983-08-10 1985-02-28 Daikin Ind Ltd エッチング剤組成物
US4585624A (en) * 1984-11-19 1986-04-29 Young Galen F Paraformaldehyde gas generator for fumigating animal houses
IN161639B (https=) * 1985-05-23 1988-01-09 Hollandse Signaalapparaten Bv
JPS63283028A (ja) 1986-09-29 1988-11-18 Hashimoto Kasei Kogyo Kk 微細加工表面処理剤
US5350489A (en) * 1990-10-19 1994-09-27 Purex Co., Ltd. Treatment method of cleaning surface of plastic molded item
US5085786A (en) 1991-01-24 1992-02-04 Minnesota Mining And Manufacturing Company Aqueous film-forming foamable solution useful as fire extinguishing concentrate
US6201122B1 (en) * 1992-12-08 2001-03-13 3M Innovative Properties Company Fluoroaliphatic radical-containing anionic sulfonamido compounds
DE69418458T2 (de) 1993-02-04 2000-01-27 Daikin Industries, Ltd. Nassaetzungsverbindung fuer halbleiter mit ausgezeichneten befeuchtungseigenschaften
US5803956A (en) 1994-07-28 1998-09-08 Hashimoto Chemical Company, Ltd. Surface treating composition for micro processing
US5478436A (en) 1994-12-27 1995-12-26 Motorola, Inc. Selective cleaning process for fabricating a semiconductor device
JP3923097B2 (ja) 1995-03-06 2007-05-30 忠弘 大見 洗浄装置
US5688884A (en) 1995-08-31 1997-11-18 E. I. Du Pont De Nemours And Company Polymerization process
JP3332700B2 (ja) 1995-12-22 2002-10-07 キヤノン株式会社 堆積膜形成方法及び堆積膜形成装置
AU2830997A (en) 1996-06-06 1998-01-05 Minnesota Mining And Manufacturing Company Fire-fighting agents containing adsorbable fluorocarbon surfactants
US6630074B1 (en) * 1997-04-04 2003-10-07 International Business Machines Corporation Etching composition and use thereof
US6348157B1 (en) 1997-06-13 2002-02-19 Tadahiro Ohmi Cleaning method
JP2000164586A (ja) * 1998-11-24 2000-06-16 Daikin Ind Ltd エッチング液
US6807824B1 (en) 1999-04-27 2004-10-26 Hiroshi Miwa Glass etching composition and method for frosting using the same
US6600557B1 (en) 1999-05-21 2003-07-29 Memc Electronic Materials, Inc. Method for the detection of processing-induced defects in a silicon wafer
EP1246856B1 (en) 1999-10-27 2009-07-15 3M Innovative Properties Company Fluorochemical sulfonamide surfactants
US6310018B1 (en) 2000-03-31 2001-10-30 3M Innovative Properties Company Fluorinated solvent compositions containing hydrogen fluoride
US20020089044A1 (en) 2001-01-09 2002-07-11 3M Innovative Properties Company Hermetic mems package with interlocking layers
JP2002256460A (ja) 2001-02-09 2002-09-11 Nippon Parkerizing Co Ltd アルミニウムおよびアルミニウム合金に用いるエッチングとデスマッティング用の組成物及びその方法
US20020142619A1 (en) 2001-03-30 2002-10-03 Memc Electronic Materials, Inc. Solution composition and process for etching silicon
US6555510B2 (en) 2001-05-10 2003-04-29 3M Innovative Properties Company Bis(perfluoroalkanesulfonyl)imides and their salts as surfactants/additives for applications having extreme environments and methods therefor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4370254A (en) * 1979-05-25 1983-01-25 Bayer Aktiengesellschaft Use of perfluoroalkane sulphonamide salts as surface active agents

Also Published As

Publication number Publication date
KR20050072795A (ko) 2005-07-12
US20040089840A1 (en) 2004-05-13
EP1558697B1 (en) 2006-11-15
WO2004044091A1 (en) 2004-05-27
DE60309738D1 (de) 2006-12-28
CN1324110C (zh) 2007-07-04
CN1694939A (zh) 2005-11-09
JP2006505667A (ja) 2006-02-16
JP4160562B2 (ja) 2008-10-01
US7169323B2 (en) 2007-01-30
EP1558697A1 (en) 2005-08-03
ATE345375T1 (de) 2006-12-15
DE60309738T2 (de) 2007-09-20
AU2003272331A1 (en) 2004-06-03

Similar Documents

Publication Publication Date Title
KR101036068B1 (ko) 완충 산 에칭 용액을 위한 플루오르화 계면활성제
KR101003931B1 (ko) 수성 산 에칭 용액을 위한 플루오르화 계면활성제
CN1926227B (zh) 用于水性清洗溶液的氟化磺酰胺表面活性剂
US6310018B1 (en) Fluorinated solvent compositions containing hydrogen fluoride
JP7507155B2 (ja) フッ素化アミンオキシド界面活性剤
US4863563A (en) Etching solutions containing ammonium fluoride and a nonionic alkyl amine glycidol adduct and method of etching
JP2001040389A (ja) ウエハ洗浄液
JP2005064065A (ja) エッチング剤及びエッチング方法

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

FPAY Annual fee payment

Payment date: 20140418

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20150416

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20160419

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

FPAY Annual fee payment

Payment date: 20170420

Year of fee payment: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

FPAY Annual fee payment

Payment date: 20180417

Year of fee payment: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

FPAY Annual fee payment

Payment date: 20190417

Year of fee payment: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20220514

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20220514

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000