KR100816271B1 - 디스플레이 패널, 디스플레이 패널 검사 방법, 및 디스플레이 패널 제조 방법 - Google Patents
디스플레이 패널, 디스플레이 패널 검사 방법, 및 디스플레이 패널 제조 방법 Download PDFInfo
- Publication number
- KR100816271B1 KR100816271B1 KR1020010031504A KR20010031504A KR100816271B1 KR 100816271 B1 KR100816271 B1 KR 100816271B1 KR 1020010031504 A KR1020010031504 A KR 1020010031504A KR 20010031504 A KR20010031504 A KR 20010031504A KR 100816271 B1 KR100816271 B1 KR 100816271B1
- Authority
- KR
- South Korea
- Prior art keywords
- thin film
- film transistor
- signal line
- conductive film
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
- G09G2300/0809—Several active elements per pixel in active matrix panels
- G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
- G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
- G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Thin Film Transistor (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000-168214 | 2000-06-05 | ||
| JP2000168203 | 2000-06-05 | ||
| JP2000-168203 | 2000-06-05 | ||
| JP2000168214 | 2000-06-05 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060050349A Division KR100816277B1 (ko) | 2000-06-05 | 2006-06-05 | 디스플레이 패널, 디스플레이 패널 검사 방법, 및디스플레이 패널 제조 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010112090A KR20010112090A (ko) | 2001-12-20 |
| KR100816271B1 true KR100816271B1 (ko) | 2008-03-25 |
Family
ID=26593355
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020010031504A Expired - Fee Related KR100816271B1 (ko) | 2000-06-05 | 2001-06-05 | 디스플레이 패널, 디스플레이 패널 검사 방법, 및 디스플레이 패널 제조 방법 |
| KR1020060050349A Expired - Fee Related KR100816277B1 (ko) | 2000-06-05 | 2006-06-05 | 디스플레이 패널, 디스플레이 패널 검사 방법, 및디스플레이 패널 제조 방법 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060050349A Expired - Fee Related KR100816277B1 (ko) | 2000-06-05 | 2006-06-05 | 디스플레이 패널, 디스플레이 패널 검사 방법, 및디스플레이 패널 제조 방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US7189585B2 (enExample) |
| JP (1) | JP4849739B2 (enExample) |
| KR (2) | KR100816271B1 (enExample) |
| TW (1) | TW538246B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12322663B2 (en) | 2023-05-10 | 2025-06-03 | Samsung Display Co., Ltd. | Display device and method of fabricating the same |
Families Citing this family (42)
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|---|---|---|---|---|
| TW523724B (en) * | 2001-08-09 | 2003-03-11 | Chi Mei Electronics Corp | Display panel with time domain multiplex driving circuit |
| US6773944B2 (en) | 2001-11-07 | 2004-08-10 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
| KR20030044661A (ko) * | 2001-11-30 | 2003-06-09 | 오리온전기 주식회사 | 칼라 유기 el 소자의 전류·전압 측정 장치 |
| EP1488455B1 (en) * | 2002-03-20 | 2010-08-11 | Koninklijke Philips Electronics N.V. | Active matrix electroluminescent display devices and their manufacture |
| JP3527726B2 (ja) | 2002-05-21 | 2004-05-17 | ウインテスト株式会社 | アクティブマトリクス基板の検査方法及び検査装置 |
| JP2004077567A (ja) | 2002-08-09 | 2004-03-11 | Semiconductor Energy Lab Co Ltd | 表示装置及びその駆動方法 |
| JP4663224B2 (ja) * | 2002-09-20 | 2011-04-06 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| WO2004027740A1 (en) | 2002-09-20 | 2004-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Display device and manufacturing method thereof |
| US7094684B2 (en) | 2002-09-20 | 2006-08-22 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
| US7053649B1 (en) | 2002-12-06 | 2006-05-30 | Semiconductor Energy Laboratory Co., Ltd. | Image display device and method of testing the same |
| US7265572B2 (en) * | 2002-12-06 | 2007-09-04 | Semicondcutor Energy Laboratory Co., Ltd. | Image display device and method of testing the same |
| JP2004191603A (ja) * | 2002-12-10 | 2004-07-08 | Semiconductor Energy Lab Co Ltd | 表示装置およびその検査方法 |
| JP2004294457A (ja) * | 2002-12-16 | 2004-10-21 | Agilent Technologies Japan Ltd | アクティブマトリクス型の表示装置およびその検査方法 |
| US7271784B2 (en) * | 2002-12-18 | 2007-09-18 | Semiconductor Energy Laboratory Co., Ltd. | Display device and driving method thereof |
| US7316784B2 (en) * | 2003-02-10 | 2008-01-08 | Lg.Philips Lcd Co., Ltd. | Method of patterning transparent conductive film, thin film transistor substrate using the same and fabricating method thereof |
| KR100669688B1 (ko) * | 2003-03-12 | 2007-01-18 | 삼성에스디아이 주식회사 | 박막트랜지스터 및 이를 구비한 평판표시소자 |
| GB0306721D0 (en) * | 2003-03-24 | 2003-04-30 | Microemissive Displays Ltd | Method of forming a semiconductor device |
| KR100702462B1 (ko) * | 2003-05-12 | 2007-04-04 | 인터내셔널 비지네스 머신즈 코포레이션 | 액티브 매트릭스 패널의 검사 장치, 검사 방법 및 액티브매트릭스 oled 패널의 제조 방법 |
| JP3760411B2 (ja) * | 2003-05-21 | 2006-03-29 | インターナショナル・ビジネス・マシーンズ・コーポレーション | アクティブマトリックスパネルの検査装置、検査方法、およびアクティブマトリックスoledパネルの製造方法 |
| JP4017586B2 (ja) | 2003-10-29 | 2007-12-05 | 三洋電機株式会社 | 電池の充電方法 |
| JP4301498B2 (ja) | 2003-11-13 | 2009-07-22 | インターナショナル・ビジネス・マシーンズ・コーポレーション | Tftを検査する検査装置 |
| WO2005115062A1 (en) | 2004-05-20 | 2005-12-01 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting element and display device |
| KR100570777B1 (ko) * | 2004-08-05 | 2006-04-12 | 삼성에스디아이 주식회사 | 발광 표시 장치 및 그 구동 방법 |
| JP4791023B2 (ja) | 2004-11-08 | 2011-10-12 | インターナショナル・ビジネス・マシーンズ・コーポレーション | Tftの検査装置および検査方法 |
| EP2924498A1 (en) * | 2006-04-06 | 2015-09-30 | Semiconductor Energy Laboratory Co, Ltd. | Liquid crystal desplay device, semiconductor device, and electronic appliance |
| TWI764143B (zh) | 2006-05-16 | 2022-05-11 | 日商半導體能源研究所股份有限公司 | 液晶顯示裝置 |
| US7847904B2 (en) | 2006-06-02 | 2010-12-07 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and electronic appliance |
| CN101086508B (zh) * | 2006-06-07 | 2010-05-12 | 瀚斯宝丽股份有限公司 | 检测设备及其连接器及其检测方法 |
| KR100817590B1 (ko) * | 2007-02-20 | 2008-03-31 | 엘지.필립스 엘시디 주식회사 | 전계발광표시장치 |
| US10186179B2 (en) * | 2009-03-20 | 2019-01-22 | Palo Alto Research Center Incorporated | Current-actuated-display backplane tester and method |
| JP5437895B2 (ja) | 2010-04-20 | 2014-03-12 | 株式会社ジャパンディスプレイ | 表示装置及びその製造方法 |
| WO2012056612A1 (ja) * | 2010-10-26 | 2012-05-03 | 株式会社島津製作所 | 放射線検出器および放射線検出器の製造方法 |
| US9171497B2 (en) * | 2013-05-06 | 2015-10-27 | Shenzhen China Star Optoelectronics Technology Co., Ltd | Method for inspecting packaging effectiveness of OLED panel |
| CN103730384A (zh) * | 2013-12-13 | 2014-04-16 | 深圳市华星光电技术有限公司 | 一种tft电性量测方法及装置 |
| JP6453612B2 (ja) * | 2014-10-29 | 2019-01-16 | 株式会社ジャパンディスプレイ | 表示装置 |
| CN104809970B (zh) * | 2015-05-14 | 2017-11-28 | 京东方科技集团股份有限公司 | 用于检测显示面板的方法 |
| CN109390286B (zh) * | 2017-08-09 | 2022-04-15 | 昆山国显光电有限公司 | 阵列基板及其制造方法、显示面板及其制造方法 |
| JP6983006B2 (ja) | 2017-08-23 | 2021-12-17 | 株式会社ジャパンディスプレイ | 表示装置 |
| CN110706629B (zh) * | 2019-09-27 | 2023-08-29 | 京东方科技集团股份有限公司 | 显示基板的检测方法和检测装置 |
| USD1071934S1 (en) | 2021-03-25 | 2025-04-22 | H2Vr Holdco, Inc. | Electronic display |
| USD1066336S1 (en) * | 2021-03-25 | 2025-03-11 | H2Vr Holdco, Inc. | Rear surface of a display panel |
| CN115831020B (zh) * | 2022-12-22 | 2025-11-21 | 深圳市华星光电半导体显示技术有限公司 | 显示面板及显示装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10312882A (ja) * | 1997-05-12 | 1998-11-24 | Matsushita Electric Ind Co Ltd | 有機電界発光素子 |
| JPH1131587A (ja) * | 1997-07-09 | 1999-02-02 | Futaba Corp | 有機エレクトロルミネッセンス素子及びその製造方法 |
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| JP3276545B2 (ja) * | 1995-10-03 | 2002-04-22 | シャープ株式会社 | アクティブマトリクス型液晶表示パネル及びアクティブマトリクス型液晶表示装置 |
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-
2001
- 2001-05-31 TW TW090113255A patent/TW538246B/zh not_active IP Right Cessation
- 2001-06-01 JP JP2001166198A patent/JP4849739B2/ja not_active Expired - Fee Related
- 2001-06-05 KR KR1020010031504A patent/KR100816271B1/ko not_active Expired - Fee Related
- 2001-06-05 US US09/873,447 patent/US7189585B2/en not_active Expired - Fee Related
-
2006
- 2006-06-05 KR KR1020060050349A patent/KR100816277B1/ko not_active Expired - Fee Related
- 2006-09-11 US US11/518,229 patent/US7741132B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10312882A (ja) * | 1997-05-12 | 1998-11-24 | Matsushita Electric Ind Co Ltd | 有機電界発光素子 |
| JPH1131587A (ja) * | 1997-07-09 | 1999-02-02 | Futaba Corp | 有機エレクトロルミネッセンス素子及びその製造方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12322663B2 (en) | 2023-05-10 | 2025-06-03 | Samsung Display Co., Ltd. | Display device and method of fabricating the same |
Also Published As
| Publication number | Publication date |
|---|---|
| US7741132B2 (en) | 2010-06-22 |
| TW538246B (en) | 2003-06-21 |
| JP4849739B2 (ja) | 2012-01-11 |
| KR100816277B1 (ko) | 2008-03-24 |
| US7189585B2 (en) | 2007-03-13 |
| KR20010112090A (ko) | 2001-12-20 |
| US20020044124A1 (en) | 2002-04-18 |
| KR20060084823A (ko) | 2006-07-25 |
| US20070004062A1 (en) | 2007-01-04 |
| JP2002108243A (ja) | 2002-04-10 |
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