KR100757577B1 - 고대역폭 수동 집적회로 시험기 탐침 카드 조립체 - Google Patents

고대역폭 수동 집적회로 시험기 탐침 카드 조립체 Download PDF

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Publication number
KR100757577B1
KR100757577B1 KR1020017010746A KR20017010746A KR100757577B1 KR 100757577 B1 KR100757577 B1 KR 100757577B1 KR 1020017010746 A KR1020017010746 A KR 1020017010746A KR 20017010746 A KR20017010746 A KR 20017010746A KR 100757577 B1 KR100757577 B1 KR 100757577B1
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South Korea
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impedances
signal path
probe
conductive
terminal
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Expired - Fee Related
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KR1020017010746A
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Korean (ko)
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KR20010102357A (ko
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찰스 에이. 밀러
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폼팩터, 인크.
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020017010746A 1999-02-25 2000-02-23 고대역폭 수동 집적회로 시험기 탐침 카드 조립체 Expired - Fee Related KR100757577B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/258,186 US6218910B1 (en) 1999-02-25 1999-02-25 High bandwidth passive integrated circuit tester probe card assembly
US09/258,186 1999-02-25

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020067019906A Division KR100757578B1 (ko) 1999-02-25 2000-02-23 고대역폭 수동 집적회로 시험기 탐침 카드 조립체

Publications (2)

Publication Number Publication Date
KR20010102357A KR20010102357A (ko) 2001-11-15
KR100757577B1 true KR100757577B1 (ko) 2007-09-10

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Family Applications (3)

Application Number Title Priority Date Filing Date
KR1020017010746A Expired - Fee Related KR100757577B1 (ko) 1999-02-25 2000-02-23 고대역폭 수동 집적회로 시험기 탐침 카드 조립체
KR1020067019906A Expired - Fee Related KR100757578B1 (ko) 1999-02-25 2000-02-23 고대역폭 수동 집적회로 시험기 탐침 카드 조립체
KR1020077006242A Expired - Fee Related KR100793501B1 (ko) 1999-02-25 2000-02-23 고대역폭 수동 집적회로 시험기 탐침 카드 조립체

Family Applications After (2)

Application Number Title Priority Date Filing Date
KR1020067019906A Expired - Fee Related KR100757578B1 (ko) 1999-02-25 2000-02-23 고대역폭 수동 집적회로 시험기 탐침 카드 조립체
KR1020077006242A Expired - Fee Related KR100793501B1 (ko) 1999-02-25 2000-02-23 고대역폭 수동 집적회로 시험기 탐침 카드 조립체

Country Status (8)

Country Link
US (5) US6218910B1 (enExample)
EP (1) EP1159624B1 (enExample)
JP (2) JP2002538435A (enExample)
KR (3) KR100757577B1 (enExample)
AU (1) AU3603400A (enExample)
DE (1) DE60007516T2 (enExample)
TW (1) TW514733B (enExample)
WO (1) WO2000050905A1 (enExample)

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EP1159624B1 (en) 2004-01-02
AU3603400A (en) 2000-09-14
DE60007516D1 (de) 2004-02-05
US20040140822A1 (en) 2004-07-22
US6686754B2 (en) 2004-02-03
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DE60007516T2 (de) 2004-09-23
KR100793501B1 (ko) 2008-01-14
US20110115512A1 (en) 2011-05-19
JP2002538435A (ja) 2002-11-12
US6917210B2 (en) 2005-07-12
WO2000050905A1 (en) 2000-08-31
KR20060106938A (ko) 2006-10-12
KR20070038181A (ko) 2007-04-09
US6501343B2 (en) 2002-12-31
KR100757578B1 (ko) 2007-09-10
KR20010102357A (ko) 2001-11-15
US20030067316A1 (en) 2003-04-10
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US20010035800A1 (en) 2001-11-01
US6218910B1 (en) 2001-04-17

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