KR100646887B1 - 일체식 창을 갖는 성형된 연마 패드의 제조방법 - Google Patents
일체식 창을 갖는 성형된 연마 패드의 제조방법 Download PDFInfo
- Publication number
- KR100646887B1 KR100646887B1 KR1020027002004A KR20027002004A KR100646887B1 KR 100646887 B1 KR100646887 B1 KR 100646887B1 KR 1020027002004 A KR1020027002004 A KR 1020027002004A KR 20027002004 A KR20027002004 A KR 20027002004A KR 100646887 B1 KR100646887 B1 KR 100646887B1
- Authority
- KR
- South Korea
- Prior art keywords
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- polymeric material
- forming region
- transparent
- flowable polymeric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 56
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 239000000463 material Substances 0.000 claims abstract description 53
- 230000009969 flowable effect Effects 0.000 claims abstract description 27
- 239000000203 mixture Substances 0.000 claims abstract description 15
- 238000000465 moulding Methods 0.000 claims abstract description 12
- 239000012815 thermoplastic material Substances 0.000 claims abstract description 9
- 229920001187 thermosetting polymer Polymers 0.000 claims abstract description 9
- 238000001816 cooling Methods 0.000 claims description 15
- 229920000642 polymer Polymers 0.000 claims description 11
- 238000002425 crystallisation Methods 0.000 claims description 8
- 230000008025 crystallization Effects 0.000 claims description 8
- 229920001169 thermoplastic Polymers 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 2
- 239000002905 metal composite material Substances 0.000 claims description 2
- 230000007704 transition Effects 0.000 claims description 2
- 238000005191 phase separation Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 13
- 235000012431 wafers Nutrition 0.000 description 10
- 239000012071 phase Substances 0.000 description 8
- 150000002009 diols Chemical class 0.000 description 4
- 150000004985 diamines Chemical class 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 229920002635 polyurethane Polymers 0.000 description 3
- 239000004814 polyurethane Substances 0.000 description 3
- 239000002002 slurry Substances 0.000 description 3
- UPMLOUAZCHDJJD-UHFFFAOYSA-N 4,4'-Diphenylmethane Diisocyanate Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=C(N=C=O)C=C1 UPMLOUAZCHDJJD-UHFFFAOYSA-N 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 125000005442 diisocyanate group Chemical group 0.000 description 2
- 238000001746 injection moulding Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 238000007517 polishing process Methods 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000007711 solidification Methods 0.000 description 2
- 230000008023 solidification Effects 0.000 description 2
- 239000004416 thermosoftening plastic Substances 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000000748 compression moulding Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 125000004427 diamine group Chemical group 0.000 description 1
- 239000000499 gel Substances 0.000 description 1
- 238000001879 gelation Methods 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- 230000003301 hydrolyzing effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000010102 injection blow moulding Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000012948 isocyanate Substances 0.000 description 1
- 150000002513 isocyanates Chemical class 0.000 description 1
- 238000004556 laser interferometry Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000013081 microcrystal Substances 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920002959 polymer blend Polymers 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 150000003077 polyols Chemical class 0.000 description 1
- 229920006380 polyphenylene oxide Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920003226 polyurethane urea Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000010107 reaction injection moulding Methods 0.000 description 1
- 229920013730 reactive polymer Polymers 0.000 description 1
- 229920006135 semi-crystalline thermoplastic polymer Polymers 0.000 description 1
- 229920006126 semicrystalline polymer Polymers 0.000 description 1
- 238000010583 slow cooling Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000004634 thermosetting polymer Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/205—Lapping pads for working plane surfaces provided with a window for inspecting the surface of the work being lapped
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/375,962 | 1999-08-17 | ||
| US09/375,962 US6171181B1 (en) | 1999-08-17 | 1999-08-17 | Molded polishing pad having integral window |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20020020816A KR20020020816A (ko) | 2002-03-15 |
| KR100646887B1 true KR100646887B1 (ko) | 2006-11-17 |
Family
ID=23483104
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020027002004A Expired - Lifetime KR100646887B1 (ko) | 1999-08-17 | 2000-08-10 | 일체식 창을 갖는 성형된 연마 패드의 제조방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6171181B1 (enExample) |
| EP (1) | EP1210209A4 (enExample) |
| JP (1) | JP4519385B2 (enExample) |
| KR (1) | KR100646887B1 (enExample) |
| TW (1) | TW470688B (enExample) |
| WO (1) | WO2001012387A1 (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101890331B1 (ko) | 2017-10-16 | 2018-08-21 | 에스케이씨 주식회사 | 누수 방지된 연마패드 및 이의 제조방법 |
| KR20190006703A (ko) | 2017-07-11 | 2019-01-21 | 에스케이씨 주식회사 | 연마패드의 비파괴 누수 검사 방법 |
| KR20190114264A (ko) | 2018-03-29 | 2019-10-10 | 에스케이씨 주식회사 | 누수 방지된 연마패드 및 이의 제조방법 |
| US11267098B2 (en) | 2017-10-16 | 2022-03-08 | Skc Solmics Co., Ltd. | Leakage-proof polishing pad and process for preparing the same |
| US11571783B2 (en) | 2017-08-07 | 2023-02-07 | Skc Solmics Co., Ltd. | Polishing pad having excellent airtightness |
Families Citing this family (93)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69632490T2 (de) * | 1995-03-28 | 2005-05-12 | Applied Materials, Inc., Santa Clara | Verfahren und Vorrichtung zur In-Situ-Kontrolle und Bestimmung des Endes von chemisch-mechanischen Planiervorgängen |
| US6876454B1 (en) | 1995-03-28 | 2005-04-05 | Applied Materials, Inc. | Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
| US5893796A (en) * | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
| US6716085B2 (en) | 2001-12-28 | 2004-04-06 | Applied Materials Inc. | Polishing pad with transparent window |
| US6179709B1 (en) * | 1999-02-04 | 2001-01-30 | Applied Materials, Inc. | In-situ monitoring of linear substrate polishing operations |
| US6524164B1 (en) * | 1999-09-14 | 2003-02-25 | Applied Materials, Inc. | Polishing pad with transparent window having reduced window leakage for a chemical mechanical polishing apparatus |
| EP1257386A1 (en) | 2000-02-25 | 2002-11-20 | Rodel Holdings, Inc. | Polishing pad with a transparent portion |
| KR100789663B1 (ko) * | 2000-03-15 | 2007-12-31 | 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스 인코포레이티드 | 연마층에 투명 윈도우 부분을 갖는 연마 패드 |
| US7374477B2 (en) * | 2002-02-06 | 2008-05-20 | Applied Materials, Inc. | Polishing pads useful for endpoint detection in chemical mechanical polishing |
| US8485862B2 (en) * | 2000-05-19 | 2013-07-16 | Applied Materials, Inc. | Polishing pad for endpoint detection and related methods |
| AU2001291143A1 (en) | 2000-10-06 | 2002-04-22 | Cabot Microelectronics Corporation | Polishing pad comprising a filled translucent region |
| US6688956B1 (en) * | 2000-11-29 | 2004-02-10 | Psiloquest Inc. | Substrate polishing device and method |
| WO2002070200A1 (en) * | 2001-03-01 | 2002-09-12 | Cabot Microelectronics Corporation | Method for manufacturing a polishing pad having a compressed translucent region |
| US20020193058A1 (en) * | 2001-06-15 | 2002-12-19 | Carter Stephen P. | Polishing apparatus that provides a window |
| JP4570286B2 (ja) * | 2001-07-03 | 2010-10-27 | ニッタ・ハース株式会社 | 研磨パッド |
| JP2003048151A (ja) * | 2001-08-08 | 2003-02-18 | Rodel Nitta Co | 研磨パッド |
| JP2003062748A (ja) * | 2001-08-24 | 2003-03-05 | Inoac Corp | 研磨用パッド |
| US7030018B2 (en) * | 2002-02-04 | 2006-04-18 | Kla-Tencor Technologies Corp. | Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool |
| US6875077B2 (en) * | 2002-03-18 | 2005-04-05 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical/mechanical planarization of semiconductor wafers having a transparent window for end-point determination and method of making |
| US20030194959A1 (en) * | 2002-04-15 | 2003-10-16 | Cabot Microelectronics Corporation | Sintered polishing pad with regions of contrasting density |
| USD469766S1 (en) | 2002-04-25 | 2003-02-04 | Intec, Inc. | Game controller |
| US20050276967A1 (en) * | 2002-05-23 | 2005-12-15 | Cabot Microelectronics Corporation | Surface textured microporous polishing pads |
| US20040171339A1 (en) * | 2002-10-28 | 2004-09-02 | Cabot Microelectronics Corporation | Microporous polishing pads |
| US6913517B2 (en) * | 2002-05-23 | 2005-07-05 | Cabot Microelectronics Corporation | Microporous polishing pads |
| US7579071B2 (en) * | 2002-09-17 | 2009-08-25 | Korea Polyol Co., Ltd. | Polishing pad containing embedded liquid microelements and method of manufacturing the same |
| KR100465649B1 (ko) * | 2002-09-17 | 2005-01-13 | 한국포리올 주식회사 | 일체형 연마 패드 및 그 제조 방법 |
| US7267607B2 (en) * | 2002-10-28 | 2007-09-11 | Cabot Microelectronics Corporation | Transparent microporous materials for CMP |
| US7435165B2 (en) | 2002-10-28 | 2008-10-14 | Cabot Microelectronics Corporation | Transparent microporous materials for CMP |
| US7311862B2 (en) * | 2002-10-28 | 2007-12-25 | Cabot Microelectronics Corporation | Method for manufacturing microporous CMP materials having controlled pore size |
| US8845852B2 (en) * | 2002-11-27 | 2014-09-30 | Toyo Tire & Rubber Co., Ltd. | Polishing pad and method of producing semiconductor device |
| US6676483B1 (en) | 2003-02-03 | 2004-01-13 | Rodel Holdings, Inc. | Anti-scattering layer for polishing pad windows |
| US6960120B2 (en) | 2003-02-10 | 2005-11-01 | Cabot Microelectronics Corporation | CMP pad with composite transparent window |
| US6832947B2 (en) * | 2003-02-10 | 2004-12-21 | Cabot Microelectronics Corporation | CMP pad with composite transparent window |
| EP1594656B1 (en) * | 2003-02-18 | 2007-09-12 | Parker-Hannifin Corporation | Polishing article for electro-chemical mechanical polishing |
| US6991514B1 (en) | 2003-02-21 | 2006-01-31 | Verity Instruments, Inc. | Optical closed-loop control system for a CMP apparatus and method of manufacture thereof |
| US7704125B2 (en) | 2003-03-24 | 2010-04-27 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US9278424B2 (en) | 2003-03-25 | 2016-03-08 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US8864859B2 (en) | 2003-03-25 | 2014-10-21 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| SG185141A1 (en) | 2003-03-25 | 2012-11-29 | Neopad Technologies Corp | Customized polish pads for chemical mechanical planarization |
| EP1466699A1 (en) * | 2003-04-09 | 2004-10-13 | JSR Corporation | Abrasive pad, method and metal mold for manufacturing the same, and semiconductor wafer polishing method |
| US20040209066A1 (en) * | 2003-04-17 | 2004-10-21 | Swisher Robert G. | Polishing pad with window for planarization |
| US6884156B2 (en) * | 2003-06-17 | 2005-04-26 | Cabot Microelectronics Corporation | Multi-layer polishing pad material for CMP |
| US7435161B2 (en) * | 2003-06-17 | 2008-10-14 | Cabot Microelectronics Corporation | Multi-layer polishing pad material for CMP |
| US6997777B2 (en) * | 2003-06-17 | 2006-02-14 | Cabot Microelectronics Corporation | Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region |
| US7086932B2 (en) * | 2004-05-11 | 2006-08-08 | Freudenberg Nonwovens | Polishing pad |
| JP2005051237A (ja) * | 2003-07-17 | 2005-02-24 | Jsr Corp | 化学機械研磨用パッドおよび化学機械研磨方法 |
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| USD559064S1 (en) | 2004-03-17 | 2008-01-08 | Jsr Corporation | Polishing pad |
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| US7204742B2 (en) * | 2004-03-25 | 2007-04-17 | Cabot Microelectronics Corporation | Polishing pad comprising hydrophobic region and endpoint detection port |
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| US8075372B2 (en) * | 2004-09-01 | 2011-12-13 | Cabot Microelectronics Corporation | Polishing pad with microporous regions |
| US20060089095A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US20060089094A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US20060089093A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| TWI385050B (zh) * | 2005-02-18 | 2013-02-11 | Nexplanar Corp | 用於cmp之特製拋光墊及其製造方法及其用途 |
| KR101521414B1 (ko) * | 2005-08-22 | 2015-05-19 | 어플라이드 머티어리얼스, 인코포레이티드 | 화학적 기계적 폴리싱의 스펙트럼 기반 모니터링을 위한 장치 및 방법 |
| US7764377B2 (en) | 2005-08-22 | 2010-07-27 | Applied Materials, Inc. | Spectrum based endpointing for chemical mechanical polishing |
| JP2007118106A (ja) * | 2005-10-26 | 2007-05-17 | Toyo Tire & Rubber Co Ltd | 研磨パッド及びその製造方法 |
| KR100882045B1 (ko) * | 2006-02-15 | 2009-02-09 | 어플라이드 머티어리얼스, 인코포레이티드 | 그루브형 서브패드를 구비한 폴리싱 장치 |
| US20070212979A1 (en) * | 2006-03-09 | 2007-09-13 | Rimpad Tech Ltd. | Composite polishing pad |
| JP4971028B2 (ja) * | 2007-05-16 | 2012-07-11 | 東洋ゴム工業株式会社 | 研磨パッドの製造方法 |
| US8562389B2 (en) * | 2007-06-08 | 2013-10-22 | Applied Materials, Inc. | Thin polishing pad with window and molding process |
| TWI411495B (zh) * | 2007-08-16 | 2013-10-11 | Cabot Microelectronics Corp | 拋光墊 |
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| US8257544B2 (en) * | 2009-06-10 | 2012-09-04 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad having a low defect integral window |
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| US9156124B2 (en) | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
| CN102310366B (zh) * | 2010-07-08 | 2014-03-05 | 罗门哈斯电子材料Cmp控股股份有限公司 | 具有低缺陷整体窗的化学机械抛光垫 |
| US8257545B2 (en) | 2010-09-29 | 2012-09-04 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with light stable polymeric endpoint detection window and method of polishing therewith |
| WO2012068428A2 (en) * | 2010-11-18 | 2012-05-24 | Cabot Microelectronics Corporation | Polishing pad comprising transmissive region |
| US11090778B2 (en) | 2012-04-02 | 2021-08-17 | Thomas West, Inc. | Methods and systems for centrifugal casting of polymer polish pads and polishing pads made by the methods |
| US10722997B2 (en) | 2012-04-02 | 2020-07-28 | Thomas West, Inc. | Multilayer polishing pads made by the methods for centrifugal casting of polymer polish pads |
| US10022842B2 (en) | 2012-04-02 | 2018-07-17 | Thomas West, Inc. | Method and systems to control optical transmissivity of a polish pad material |
| US9156125B2 (en) * | 2012-04-11 | 2015-10-13 | Cabot Microelectronics Corporation | Polishing pad with light-stable light-transmitting region |
| US20140256226A1 (en) * | 2013-03-07 | 2014-09-11 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Broad spectrum, endpoint detection window chemical mechanical polishing pad and polishing method |
| US9186772B2 (en) | 2013-03-07 | 2015-11-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with broad spectrum, endpoint detection window and method of polishing therewith |
| US9216489B2 (en) | 2014-03-28 | 2015-12-22 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with endpoint detection window |
| US9064806B1 (en) | 2014-03-28 | 2015-06-23 | Rohm and Haas Electronics Materials CMP Holdings, Inc. | Soft and conditionable chemical mechanical polishing pad with window |
| US9259820B2 (en) | 2014-03-28 | 2016-02-16 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with polishing layer and window |
| US9333620B2 (en) | 2014-04-29 | 2016-05-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with clear endpoint detection window |
| US9314897B2 (en) | 2014-04-29 | 2016-04-19 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with endpoint detection window |
| US10213894B2 (en) | 2016-02-26 | 2019-02-26 | Applied Materials, Inc. | Method of placing window in thin polishing pad |
| KR101904322B1 (ko) * | 2017-01-23 | 2018-10-04 | 에스케이씨 주식회사 | 연마패드 및 이의 제조방법 |
| KR101945878B1 (ko) * | 2017-07-11 | 2019-02-11 | 에스케이씨 주식회사 | 연마층과 유사 경도를 갖는 윈도우를 포함하는 연마패드 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4179488A (en) * | 1976-03-31 | 1979-12-18 | Yoshino Kogyosho Co., Ltd. | Method of making a frosted bottle of saturated polyester |
| US4564497A (en) * | 1982-07-28 | 1986-01-14 | Yoshino Kogyosho Co., Ltd. | Method of producing bottles of saturated polyester |
| US4728559A (en) * | 1987-07-16 | 1988-03-01 | Eastman Kodak Company | Thermoformed plastic containers with transparent windows and method of making same |
| US5182070A (en) * | 1991-04-08 | 1993-01-26 | The Torrington Company | Process for molding polymer bearing cage with amorphous case |
| US5413941A (en) | 1994-01-06 | 1995-05-09 | Micron Technology, Inc. | Optical end point detection methods in semiconductor planarizing polishing processes |
| US5893796A (en) | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
| JP2796077B2 (ja) * | 1995-06-08 | 1998-09-10 | 松下電器産業株式会社 | 基板の研磨装置及び基板の研磨方法 |
| US5605760A (en) | 1995-08-21 | 1997-02-25 | Rodel, Inc. | Polishing pads |
| US6074287A (en) * | 1996-04-12 | 2000-06-13 | Nikon Corporation | Semiconductor wafer polishing apparatus |
| JPH09277162A (ja) * | 1996-04-12 | 1997-10-28 | Nikon Corp | 半導体研磨装置 |
| CA2494248A1 (en) * | 1997-04-16 | 1998-10-22 | Husky Injection Molding Systems Ltd. | Partial crystallization method and apparatus of amorphous plastic articles |
-
1999
- 1999-08-17 US US09/375,962 patent/US6171181B1/en not_active Expired - Lifetime
-
2000
- 2000-08-10 WO PCT/US2000/021776 patent/WO2001012387A1/en not_active Ceased
- 2000-08-10 EP EP00952699A patent/EP1210209A4/en not_active Withdrawn
- 2000-08-10 JP JP2001516715A patent/JP4519385B2/ja not_active Expired - Lifetime
- 2000-08-10 TW TW089116116A patent/TW470688B/zh not_active IP Right Cessation
- 2000-08-10 KR KR1020027002004A patent/KR100646887B1/ko not_active Expired - Lifetime
- 2000-09-20 US US09/666,418 patent/US6387312B1/en not_active Expired - Lifetime
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20190006703A (ko) | 2017-07-11 | 2019-01-21 | 에스케이씨 주식회사 | 연마패드의 비파괴 누수 검사 방법 |
| US11571783B2 (en) | 2017-08-07 | 2023-02-07 | Skc Solmics Co., Ltd. | Polishing pad having excellent airtightness |
| KR101890331B1 (ko) | 2017-10-16 | 2018-08-21 | 에스케이씨 주식회사 | 누수 방지된 연마패드 및 이의 제조방법 |
| US11267098B2 (en) | 2017-10-16 | 2022-03-08 | Skc Solmics Co., Ltd. | Leakage-proof polishing pad and process for preparing the same |
| KR20190114264A (ko) | 2018-03-29 | 2019-10-10 | 에스케이씨 주식회사 | 누수 방지된 연마패드 및 이의 제조방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2003507199A (ja) | 2003-02-25 |
| KR20020020816A (ko) | 2002-03-15 |
| EP1210209A4 (en) | 2004-06-30 |
| JP4519385B2 (ja) | 2010-08-04 |
| EP1210209A1 (en) | 2002-06-05 |
| TW470688B (en) | 2002-01-01 |
| US6171181B1 (en) | 2001-01-09 |
| US6387312B1 (en) | 2002-05-14 |
| WO2001012387A1 (en) | 2001-02-22 |
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