KR100644023B1 - 프린트기판검사장치 - Google Patents

프린트기판검사장치 Download PDF

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Publication number
KR100644023B1
KR100644023B1 KR1020050026695A KR20050026695A KR100644023B1 KR 100644023 B1 KR100644023 B1 KR 100644023B1 KR 1020050026695 A KR1020050026695 A KR 1020050026695A KR 20050026695 A KR20050026695 A KR 20050026695A KR 100644023 B1 KR100644023 B1 KR 100644023B1
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KR
South Korea
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area
display
image data
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KR1020050026695A
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English (en)
Korean (ko)
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KR20060045037A (ko
Inventor
쓰요시 기무라
오사무 다카다
가쓰유키 스즈키
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안리츠 코포레이션
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Application filed by 안리츠 코포레이션 filed Critical 안리츠 코포레이션
Publication of KR20060045037A publication Critical patent/KR20060045037A/ko
Application granted granted Critical
Publication of KR100644023B1 publication Critical patent/KR100644023B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/136—Segmentation; Edge detection involving thresholding
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457—Solder materials or compositions; Methods of application thereof
    • H05K3/3485—Applying solder paste, slurry or powder
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Quality & Reliability (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
KR1020050026695A 2004-03-31 2005-03-30 프린트기판검사장치 KR100644023B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004103597A JP3895334B2 (ja) 2004-03-31 2004-03-31 プリント基板検査装置
JPJP-P-2004-00103597 2004-03-31

Publications (2)

Publication Number Publication Date
KR20060045037A KR20060045037A (ko) 2006-05-16
KR100644023B1 true KR100644023B1 (ko) 2006-11-10

Family

ID=35324872

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050026695A KR100644023B1 (ko) 2004-03-31 2005-03-30 프린트기판검사장치

Country Status (4)

Country Link
JP (1) JP3895334B2 (ja)
KR (1) KR100644023B1 (ja)
CN (1) CN100552439C (ja)
TW (1) TWI274867B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190027149A (ko) * 2017-09-06 2019-03-14 정성욱 Vcm 방식의 렌즈 액츄에이터와 htcc 기판의 솔더링 상태 자동 검사 시스템

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4103921B2 (ja) * 2006-08-11 2008-06-18 オムロン株式会社 フィレット検査のための検査基準データの設定方法、およびこの方法を用いた基板外観検査装置
CN101477063B (zh) * 2009-01-22 2011-02-16 北京星河泰视特科技有限公司 印刷电路板的检测方法及光学检测仪
JP5182122B2 (ja) * 2009-01-27 2013-04-10 オムロン株式会社 部品実装基板の品質管理用の情報表示システムおよび情報表示方法
JP2011061047A (ja) * 2009-09-11 2011-03-24 Hitachi High-Technologies Corp 欠陥レビュー支援装置，欠陥レビュー装置および検査支援装置
TWI582629B (zh) * 2016-08-19 2017-05-11 和碩聯合科技股份有限公司 干涉檢查方法及其檢測裝置
JP7281942B2 (ja) * 2019-03-29 2023-05-26 Juki株式会社 検査装置及び検査方法
CN113670949A (zh) * 2021-08-27 2021-11-19 惠州市特创电子科技股份有限公司 一种大型电路板步进检查机的分区检查方法
CN114155367B (zh) * 2022-02-09 2022-05-13 北京阿丘科技有限公司 印制电路板缺陷检测方法、装置、设备及存储介质

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0526814A (ja) * 1991-07-16 1993-02-02 Omron Corp 基板検査装置における検査結果出力方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0526814A (ja) * 1991-07-16 1993-02-02 Omron Corp 基板検査装置における検査結果出力方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190027149A (ko) * 2017-09-06 2019-03-14 정성욱 Vcm 방식의 렌즈 액츄에이터와 htcc 기판의 솔더링 상태 자동 검사 시스템
KR102024562B1 (ko) * 2017-09-06 2019-09-24 정성욱 Vcm 방식의 렌즈 액츄에이터와 htcc 기판의 솔더링 상태 자동 검사 시스템

Also Published As

Publication number Publication date
JP3895334B2 (ja) 2007-03-22
KR20060045037A (ko) 2006-05-16
CN100552439C (zh) 2009-10-21
TW200535412A (en) 2005-11-01
CN1677096A (zh) 2005-10-05
JP2005291761A (ja) 2005-10-20
TWI274867B (en) 2007-03-01

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