KR100574592B1 - 차동 감지 증폭기를 갖춘 집적 메모리 - Google Patents

차동 감지 증폭기를 갖춘 집적 메모리 Download PDF

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Publication number
KR100574592B1
KR100574592B1 KR1020017003975A KR20017003975A KR100574592B1 KR 100574592 B1 KR100574592 B1 KR 100574592B1 KR 1020017003975 A KR1020017003975 A KR 1020017003975A KR 20017003975 A KR20017003975 A KR 20017003975A KR 100574592 B1 KR100574592 B1 KR 100574592B1
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South Korea
Prior art keywords
bit lines
memory
memory cell
access
read
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Expired - Fee Related
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KR1020017003975A
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English (en)
Korean (ko)
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KR20010079947A (ko
Inventor
토마스 뢰어
토마스 뵘
하인츠 회니히슈미트
게오르크 브라운
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인피니언 테크놀로지스 아게
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Publication of KR20010079947A publication Critical patent/KR20010079947A/ko
Application granted granted Critical
Publication of KR100574592B1 publication Critical patent/KR100574592B1/ko
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
KR1020017003975A 1998-09-28 1999-09-13 차동 감지 증폭기를 갖춘 집적 메모리 Expired - Fee Related KR100574592B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19844479A DE19844479C1 (de) 1998-09-28 1998-09-28 Integrierter Speicher mit einem differentiellen Leseverstärker
DE19844479.6 1998-09-28

Publications (2)

Publication Number Publication Date
KR20010079947A KR20010079947A (ko) 2001-08-22
KR100574592B1 true KR100574592B1 (ko) 2006-04-28

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ID=7882539

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Application Number Title Priority Date Filing Date
KR1020017003975A Expired - Fee Related KR100574592B1 (ko) 1998-09-28 1999-09-13 차동 감지 증폭기를 갖춘 집적 메모리

Country Status (8)

Country Link
US (1) US6351422B2 (enExample)
EP (1) EP1118081B1 (enExample)
JP (1) JP4377068B2 (enExample)
KR (1) KR100574592B1 (enExample)
CN (1) CN1162864C (enExample)
DE (2) DE19844479C1 (enExample)
TW (1) TW442797B (enExample)
WO (1) WO2000019442A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102279048B1 (ko) 2020-04-06 2021-07-16 연세대학교 산학협력단 저항성 메모리용 고속 고안정성을 가진 혼합형 감지 증폭기

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3447640B2 (ja) * 1999-12-28 2003-09-16 日本電気株式会社 半導体記憶装置
US6848970B2 (en) * 2002-09-16 2005-02-01 Applied Materials, Inc. Process control in electrochemically assisted planarization
US7059948B2 (en) * 2000-12-22 2006-06-13 Applied Materials Articles for polishing semiconductor substrates
DE10062110B4 (de) * 2000-12-13 2009-04-09 Qimonda Ag Integrierter Speicher mit einem Zellenfeld und Ladungsausgleichseinrichtungen sowie Verfahren zum beschleunigten Schreiben eines Datums in einen integrierten Speicher
JP2003016777A (ja) * 2001-06-28 2003-01-17 Mitsubishi Electric Corp 薄膜磁性体記憶装置
US6631093B2 (en) * 2001-06-29 2003-10-07 Intel Corporation Low power precharge scheme for memory bit lines
DE10135814C2 (de) * 2001-07-23 2003-09-18 Infineon Technologies Ag Halbleiterspeicher mit Precharge-Steuerung
US6876567B2 (en) * 2001-12-21 2005-04-05 Intel Corporation Ferroelectric memory device and method of reading a ferroelectric memory
US6587367B1 (en) * 2002-03-19 2003-07-01 Texas Instruments Incorporated Dummy cell structure for 1T1C FeRAM cell array
US7023243B2 (en) * 2002-05-08 2006-04-04 University Of Southern California Current source evaluation sense-amplifier
US6721217B2 (en) * 2002-06-27 2004-04-13 Texas Instruments Incorporated Method for memory sensing
US6831871B2 (en) * 2002-12-30 2004-12-14 Intel Corporation Stable memory cell read
US6839294B2 (en) * 2003-03-03 2005-01-04 Windbond Electronics Corporation Memory device with high charging voltage bit line
US7130233B2 (en) * 2003-03-21 2006-10-31 Mediatek Incorporation Sensing circuit for single bit-line semiconductor memory device
DE102005029872A1 (de) * 2005-06-27 2007-04-19 Infineon Technologies Ag Speicherzelle, Lesevorrichtung für die Speicherzelle sowie Speicheranordnungen mit einer derartigen Speicherzelle und Lesevorrichtung
CA2682469A1 (en) 2007-03-30 2008-10-09 The Cleveland Clinic Foundation Method of treating ischemic disorders
WO2009079451A2 (en) 2007-12-14 2009-06-25 The Cleveland Clinic Foundation Compositions and methods of promoting wound healing
US20120283315A1 (en) 2009-08-28 2012-11-08 Penn Marc S Sdf-1 delivery for treating ischemic tissue
CN101714401B (zh) * 2009-11-06 2013-01-02 东南大学 用以增强存储单元阵列容量和密度的亚阈值敏感放大电路
US8320209B2 (en) 2010-05-05 2012-11-27 Stmicroelectronics International N.V. Sense amplifier using reference signal through standard MOS and DRAM capacitor
CN112863581B (zh) * 2016-09-09 2024-12-17 硅存储技术公司 用于读取阵列中的闪存单元的带位线预充电电路的改进读出放大器
US9881676B1 (en) 2016-10-11 2018-01-30 Sandisk Technologies Llc Sense amplifier with program biasing and fast sensing
US10976589B2 (en) 2018-04-17 2021-04-13 Himax Display, Inc. Display panel having a patterned light shielding layer protected by a protective structure
KR102653251B1 (ko) * 2018-09-07 2024-04-01 에스케이하이닉스 주식회사 고속 데이터 리드아웃 장치 및 그를 이용한 씨모스 이미지 센서

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4118847A1 (de) * 1990-06-08 1991-12-12 Toshiba Kawasaki Kk Halbleiterspeicheranordnung mit ferroelektrischem kondensator
US5241503A (en) 1991-02-25 1993-08-31 Motorola, Inc. Dynamic random access memory with improved page-mode performance and method therefor having isolator between memory cells and sense amplifiers
DE4228212C2 (de) * 1991-09-19 1994-11-24 Siemens Ag Integrierte Halbleiterspeicherschaltung und Verfahren zu ihrem Betreiben
JPH0785675A (ja) * 1993-09-17 1995-03-31 Mitsubishi Electric Corp 半導体記憶装置
KR0171954B1 (ko) * 1995-06-30 1999-03-30 김주용 데이타 버스 구동 회로
JPH10106286A (ja) 1996-09-24 1998-04-24 Mitsubishi Electric Corp 半導体記憶装置およびそのテスト方法
US5828612A (en) * 1997-10-27 1998-10-27 Motorola, Inc. Method and circuit for controlling a precharge cycle of a memory device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102279048B1 (ko) 2020-04-06 2021-07-16 연세대학교 산학협력단 저항성 메모리용 고속 고안정성을 가진 혼합형 감지 증폭기

Also Published As

Publication number Publication date
US20010038562A1 (en) 2001-11-08
KR20010079947A (ko) 2001-08-22
EP1118081B1 (de) 2002-12-04
CN1162864C (zh) 2004-08-18
WO2000019442A1 (de) 2000-04-06
DE59903679D1 (de) 2003-01-16
EP1118081A1 (de) 2001-07-25
US6351422B2 (en) 2002-02-26
TW442797B (en) 2001-06-23
DE19844479C1 (de) 2000-04-13
CN1322360A (zh) 2001-11-14
JP4377068B2 (ja) 2009-12-02
JP2002526880A (ja) 2002-08-20

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