KR100295019B1 - 현상장치및현상방법 - Google Patents

현상장치및현상방법 Download PDF

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Publication number
KR100295019B1
KR100295019B1 KR1019950032781A KR19950032781A KR100295019B1 KR 100295019 B1 KR100295019 B1 KR 100295019B1 KR 1019950032781 A KR1019950032781 A KR 1019950032781A KR 19950032781 A KR19950032781 A KR 19950032781A KR 100295019 B1 KR100295019 B1 KR 100295019B1
Authority
KR
South Korea
Prior art keywords
substrate
nozzle
developer
developing
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
KR1019950032781A
Other languages
English (en)
Korean (ko)
Other versions
KR960012298A (ko
Inventor
이나다히로이치
쓰네마쓰구니에
Original Assignee
다카시마 히로시
도오교오에레구토론큐우슈우가부시끼가이샤
히가시 데쓰로
동경 엘렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 다카시마 히로시, 도오교오에레구토론큐우슈우가부시끼가이샤, 히가시 데쓰로, 동경 엘렉트론 주식회사 filed Critical 다카시마 히로시
Publication of KR960012298A publication Critical patent/KR960012298A/ko
Application granted granted Critical
Publication of KR100295019B1 publication Critical patent/KR100295019B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/30—Imagewise removal using liquid means
    • G03F7/3021—Imagewise removal using liquid means from a wafer supported on a rotating chuck

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Atmospheric Sciences (AREA)
  • Toxicology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Coating Apparatus (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
KR1019950032781A 1994-09-29 1995-09-29 현상장치및현상방법 Expired - Lifetime KR100295019B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP25915594 1994-09-29
JP94-259155 1994-09-29

Publications (2)

Publication Number Publication Date
KR960012298A KR960012298A (ko) 1996-04-20
KR100295019B1 true KR100295019B1 (ko) 2001-10-24

Family

ID=17330113

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950032781A Expired - Lifetime KR100295019B1 (ko) 1994-09-29 1995-09-29 현상장치및현상방법

Country Status (4)

Country Link
US (1) US5625433A (https=)
JP (2) JP3259092B2 (https=)
KR (1) KR100295019B1 (https=)
TW (1) TW290707B (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100481537B1 (ko) * 2002-06-29 2005-04-08 동부아남반도체 주식회사 웨이퍼 현상 장치

Families Citing this family (44)

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JP3377909B2 (ja) * 1996-02-28 2003-02-17 大日本スクリーン製造株式会社 基板処理装置
US5821035A (en) * 1996-03-06 1998-10-13 Sony Corporation Resist developing apparatus and resist developing method
TW359854B (en) * 1996-06-21 1999-06-01 Tokyo Electron Ltd Processing apparatus and processing method
JP3227595B2 (ja) * 1996-08-20 2001-11-12 東京エレクトロン株式会社 現像処理方法及び現像処理装置
KR100283442B1 (ko) * 1996-12-26 2001-04-02 이시다 아키라 현상장치및현상방법
DE19718983B4 (de) * 1997-05-05 2004-09-30 Infineon Technologies Ag Vorrichtungen, Verwendung und Verfahren zum Aufbringen einer Substanz auf eine Oberfläche eines Halbleiterwafers
JP3265238B2 (ja) * 1997-08-01 2002-03-11 東京エレクトロン株式会社 液膜形成装置及びその方法
JP3340945B2 (ja) * 1997-08-06 2002-11-05 東京エレクトロン株式会社 塗布現像処理装置
KR100292612B1 (ko) * 1997-12-08 2001-08-07 윤종용 반도체 웨이퍼 정렬시스템 및 이를 이용하는 웨이퍼 정렬방법
JPH11204396A (ja) * 1998-01-08 1999-07-30 Canon Inc 半導体製造システムおよびデバイス製造方法
WO1999035535A1 (en) * 1998-01-09 1999-07-15 Fastar, Ltd. Linear developer
US6248171B1 (en) 1998-09-17 2001-06-19 Silicon Valley Group, Inc. Yield and line width performance for liquid polymers and other materials
US6689215B2 (en) 1998-09-17 2004-02-10 Asml Holdings, N.V. Method and apparatus for mitigating cross-contamination between liquid dispensing jets in close proximity to a surface
US6210050B1 (en) 1998-12-01 2001-04-03 Advanced Micro Devices, Inc. Resist developing method and apparatus with nozzle offset for uniform developer application
US6092937A (en) * 1999-01-08 2000-07-25 Fastar, Ltd. Linear developer
JP3395696B2 (ja) 1999-03-15 2003-04-14 日本電気株式会社 ウェハ処理装置およびウェハ処理方法
US6398429B1 (en) 1999-03-15 2002-06-04 Tokyo Electron Limited Developing method and developing apparatus
JP3393082B2 (ja) 1999-04-02 2003-04-07 東京エレクトロン株式会社 現像方法および現像装置
US6312171B1 (en) 1999-08-12 2001-11-06 Tokyo Electron Limited Developing apparatus and method thereof
JP3635217B2 (ja) * 1999-10-05 2005-04-06 東京エレクトロン株式会社 液処理装置及びその方法
US6270579B1 (en) 1999-10-29 2001-08-07 Advanced Micro Devices, Inc. Nozzle arm movement for resist development
US6248175B1 (en) 1999-10-29 2001-06-19 Advanced Micro Devices, Inc. Nozzle arm movement for resist development
JP3360052B2 (ja) 1999-11-19 2002-12-24 山口日本電気株式会社 現像装置
US6533865B1 (en) 2000-03-08 2003-03-18 Advanced Micro Devices, Inc. Acoustic/ultrasonic agitation to reduce microbubbles in developer
JP3545676B2 (ja) 2000-05-10 2004-07-21 東京エレクトロン株式会社 現像処理装置及び現像処理方法
US6746826B1 (en) 2000-07-25 2004-06-08 Asml Holding N.V. Method for an improved developing process in wafer photolithography
US6770424B2 (en) * 2002-12-16 2004-08-03 Asml Holding N.V. Wafer track apparatus and methods for dispensing fluids with rotatable dispense arms
US20050051196A1 (en) * 2003-09-08 2005-03-10 Taiwan Semiconductor Manufacturing Co., Ltd., Developer dispensing apparatus with adjustable knife ring
WO2005100637A1 (ja) * 2004-04-15 2005-10-27 Tokyo Electron Limited 液処理装置および液処理方法
JP4464763B2 (ja) * 2004-08-20 2010-05-19 東京エレクトロン株式会社 現像装置及び現像方法
US7651306B2 (en) 2004-12-22 2010-01-26 Applied Materials, Inc. Cartesian robot cluster tool architecture
US20060130767A1 (en) * 2004-12-22 2006-06-22 Applied Materials, Inc. Purged vacuum chuck with proximity pins
US7699021B2 (en) 2004-12-22 2010-04-20 Sokudo Co., Ltd. Cluster tool substrate throughput optimization
US7798764B2 (en) 2005-12-22 2010-09-21 Applied Materials, Inc. Substrate processing sequence in a cartesian robot cluster tool
US7819079B2 (en) 2004-12-22 2010-10-26 Applied Materials, Inc. Cartesian cluster tool configuration for lithography type processes
US7781986B2 (en) 2008-02-01 2010-08-24 Fsp Technology Inc. Inverter with adjustable resonance gain
JP5133855B2 (ja) * 2008-11-25 2013-01-30 株式会社ディスコ 保護膜の被覆方法
JP5314723B2 (ja) * 2011-03-03 2013-10-16 東京エレクトロン株式会社 現像装置
JP5764589B2 (ja) 2012-10-31 2015-08-19 富士フイルム株式会社 化学増幅型レジスト膜のパターニング用有機系処理液の収容容器、並びに、これらを使用したパターン形成方法及び電子デバイスの製造方法
US10203606B1 (en) * 2017-11-22 2019-02-12 Taiwan Semiconductor Manufacturing Co., Ltd. Apparatus and method for dispensing developer onto semiconductor substrate
KR102186068B1 (ko) * 2018-12-21 2020-12-07 세메스 주식회사 기판 처리 방법 및 장치
JP7232737B2 (ja) * 2019-08-07 2023-03-03 東京エレクトロン株式会社 基板処理装置
US10998218B1 (en) * 2019-12-29 2021-05-04 Nanya Technology Corporation Wet cleaning apparatus and manufacturing method using the same
CN118160074B (zh) * 2021-11-04 2025-08-15 东京毅力科创株式会社 基片处理装置和基片处理方法

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US4161356A (en) * 1977-01-21 1979-07-17 Burchard John S Apparatus for in-situ processing of photoplates
US4564280A (en) * 1982-10-28 1986-01-14 Fujitsu Limited Method and apparatus for developing resist film including a movable nozzle arm
JP2855046B2 (ja) * 1993-03-31 1999-02-10 大日本スクリーン製造株式会社 回転式基板処理装置用の基板回転保持装置
JP2594332B2 (ja) * 1987-09-02 1997-03-26 富士電機株式会社 ダイスの誘導加熱装置
JPH0238441A (ja) * 1988-07-28 1990-02-07 Nippon Oil & Fats Co Ltd 熱可塑性樹脂組成物
JPH06103687B2 (ja) * 1988-08-12 1994-12-14 大日本スクリーン製造株式会社 回転式表面処理方法および回転式表面処理における処理終点検出方法、ならびに回転式表面処理装置
WO1991007518A2 (de) * 1989-11-17 1991-05-30 Glyco-Metall-Werke Daelen & Loos Gmbh Verfahren und vorrichtung zur herstellung eines schichtwerkstoffes für gleitelemente
US5159374A (en) * 1991-04-04 1992-10-27 Vlsi Technology, Inc. Water sealing develop ring

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100481537B1 (ko) * 2002-06-29 2005-04-08 동부아남반도체 주식회사 웨이퍼 현상 장치

Also Published As

Publication number Publication date
JP2000188255A (ja) 2000-07-04
TW290707B (https=) 1996-11-11
US5625433A (en) 1997-04-29
JP3259091B2 (ja) 2002-02-18
JP2000208413A (ja) 2000-07-28
JP3259092B2 (ja) 2002-02-18
KR960012298A (ko) 1996-04-20

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