KR100218653B1 - 전자유도형 검사장치 - Google Patents

전자유도형 검사장치 Download PDF

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Publication number
KR100218653B1
KR100218653B1 KR1019950024628A KR19950024628A KR100218653B1 KR 100218653 B1 KR100218653 B1 KR 100218653B1 KR 1019950024628 A KR1019950024628 A KR 1019950024628A KR 19950024628 A KR19950024628 A KR 19950024628A KR 100218653 B1 KR100218653 B1 KR 100218653B1
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KR
South Korea
Prior art keywords
phase
magnetic field
electromagnetic induction
amplitude
signal
Prior art date
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Expired - Fee Related
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KR1019950024628A
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English (en)
Korean (ko)
Other versions
KR960008329A (ko
Inventor
히로아끼 고하마
Original Assignee
히로아끼 고하마
가이세이 엔지니어 가부시기가이샤
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Publication of KR960008329A publication Critical patent/KR960008329A/ko
Application granted granted Critical
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

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  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
KR1019950024628A 1994-08-11 1995-08-10 전자유도형 검사장치 Expired - Fee Related KR100218653B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP18930694A JPH0854375A (ja) 1994-08-11 1994-08-11 電磁誘導型検査装置
JP94-189306 1994-08-11

Publications (2)

Publication Number Publication Date
KR960008329A KR960008329A (ko) 1996-03-22
KR100218653B1 true KR100218653B1 (ko) 1999-09-01

Family

ID=16239137

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950024628A Expired - Fee Related KR100218653B1 (ko) 1994-08-11 1995-08-10 전자유도형 검사장치

Country Status (6)

Country Link
US (1) US5689183A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPH0854375A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
KR (1) KR100218653B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE19529630B4 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2292222B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
TW (1) TW274119B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040035975A (ko) * 2002-10-14 2004-04-30 주식회사 한국이미지 물체감지용 써치코일
US7620197B2 (en) 2005-04-29 2009-11-17 Bse Co., Ltd. Casing of condenser microphone

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FR2773422B1 (fr) * 1998-01-06 2000-02-04 Alsthom Cge Alcatel Dispositif de controle en amplitude et en phase d'un signal radiofrequence
JP4130365B2 (ja) * 2001-04-09 2008-08-06 太陽誘電株式会社 電磁界強度の測定方法及びその装置、電磁界強度分布の測定方法及びその装置電流電圧分布の測定方法及びその装置
GB0113206D0 (en) * 2001-06-01 2001-07-25 Lattice Intellectual Property Pipe material discrimination
US6873152B2 (en) * 2002-12-30 2005-03-29 General Electric Company Differential sensor apparatus and method for laminated core fault detection
AT501669B1 (de) * 2003-10-28 2007-01-15 Kerschhaggl Peter Dipl Ing Verfahren und vorrichtung zum unterscheiden von ein elktromagnetisches wechselfeld beeinflussendenteilen
WO2006075584A1 (ja) * 2005-01-11 2006-07-20 Taiyo Yuden Co., Ltd. 電磁界分布測定方法及びその装置並びにコンピュータプログラム及び情報記録媒体
US7256577B2 (en) * 2005-04-07 2007-08-14 The Boeing Company High frequency rotary eddy current probe device
JP4809039B2 (ja) * 2005-11-07 2011-11-02 偕成エンジニア株式会社 電磁誘導型検査装置および電磁誘導型検査方法
US20070128756A1 (en) * 2005-12-07 2007-06-07 Bower Stephen P Method and apparatus for determining density of metal-inclusive components
JP2009085894A (ja) * 2007-10-02 2009-04-23 Kaisei Engineer Kk 溶接部欠陥検出方法及び装置
US7994807B1 (en) * 2007-10-23 2011-08-09 National Semiconductor Corporation Built-in test circuit for testing AC transfer characteristic of high-speed analog circuit
GB2456583B (en) * 2008-01-21 2012-09-05 Ge Inspection Technologies Ltd Eddy current inspection system and method of eddy current flaw detection
JP5530141B2 (ja) 2009-09-29 2014-06-25 富士フイルム株式会社 インク組成物及びインクジェット記録方法
US8564284B2 (en) 2011-02-11 2013-10-22 Siemens Energy, Inc. Fault detection for laminated core
US8508220B2 (en) 2011-02-11 2013-08-13 Siemens Energy, Inc. Fault detection for laminated core
JP4756409B1 (ja) * 2011-02-18 2011-08-24 大日機械工業株式会社 交番磁場を利用した非破壊検査装置および非破壊検査方法
EP2902456B1 (en) 2012-09-27 2020-10-21 FUJIFILM Corporation Ink composition, ink jet recording method, printed material, bisacyl phosphine oxide compound, and monoacyl phosphine oxide compound
JP6242155B2 (ja) * 2013-10-29 2017-12-06 大日機械工業株式会社 非破壊検査装置および非破壊検査方法
JP6326660B2 (ja) * 2014-11-12 2018-05-23 住友電工焼結合金株式会社 焼結体の非破壊検査方法
US10561342B2 (en) * 2015-09-21 2020-02-18 Board Of Regents, The University Of Texas System Systems and methods for detecting tremors
US10782263B2 (en) 2017-05-04 2020-09-22 Analog Devices Global Systems and methods for determining the condition of a gas sensor
US10288674B2 (en) * 2017-05-04 2019-05-14 Analog Devices Global Impedance characteristic circuit for electrochemical sensor
US11300544B2 (en) * 2019-03-29 2022-04-12 Illinois Tool Works Inc. Methods and systems for controlling output amperage
US20230103759A1 (en) * 2021-10-05 2023-04-06 Toyota Research Institute, Inc. Robotic Tool Control with Compliant Force/Geometry Sensor
CN117970192A (zh) * 2024-04-02 2024-05-03 清华四川能源互联网研究院 一种闭合回路线圈的检测方法及系统

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US3823368A (en) * 1954-07-14 1974-07-09 Magnetic Analysis Corp Calibration and balance system in pulse eddy current testing apparatus
US3478263A (en) * 1967-09-27 1969-11-11 Rudolf G Hentschel Wide frequency range eddy current testing instrument
DE2142351C3 (de) * 1971-08-24 1979-05-03 Karl Deutsch Pruef- Und Messgeraetebau, 5600 Wuppertal Vorrichtung zur Verwechslungs- und Gefugeprüfung von ferromagnetischen Werkstoffen
US3916301A (en) * 1974-05-20 1975-10-28 Republic Steel Corp Magnetic flaw detection apparatus
FR2305809A1 (fr) * 1975-03-25 1976-10-22 Crouzet Sa Dispositif d'authentification de titres monetaires
US4063230A (en) * 1975-06-12 1977-12-13 The Magnavox Company Balanced field theft detection system
US4059795A (en) * 1976-06-03 1977-11-22 Sensor Corporation Digital eddy current apparatus for sensing and analyzing metallurgical characteristics of an electrically conductive material
US4594549A (en) * 1984-05-11 1986-06-10 United Technologies Corporation Uniform field generating eddy current testing processing method and apparatus
FR2570501B1 (fr) * 1984-09-20 1987-12-18 Siderurgie Fse Inst Rech Procede de detection de defauts de surface par courants de foucault et dispositif mettant en oeuvre ce procede
DE3720686A1 (de) * 1987-06-23 1989-01-05 Foerster Inst Dr Friedrich Verfahren zum untersuchen eines objektes
DE3743521A1 (de) * 1987-12-22 1989-07-06 Foerster Inst Dr Friedrich Vorrichtung zum pruefen von halbzeug
JPH05107230A (ja) * 1991-10-15 1993-04-27 Nippondenso Co Ltd 鋼材の脱炭層検出装置
JPH063327A (ja) * 1992-06-19 1994-01-11 Showa Kijiyuuki Seisakusho:Kk 磁性体の比較測定装置
JP2598948Y2 (ja) * 1993-03-02 1999-08-23 原電子測器株式会社 多チャンネル貫通形電磁誘導探傷用距離感度自動補正装置
JPH07100735A (ja) * 1993-09-30 1995-04-18 Omron Corp ドリル用センサ及びそれを用いたドリル状態監視装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040035975A (ko) * 2002-10-14 2004-04-30 주식회사 한국이미지 물체감지용 써치코일
US7620197B2 (en) 2005-04-29 2009-11-17 Bse Co., Ltd. Casing of condenser microphone

Also Published As

Publication number Publication date
GB9515700D0 (en) 1995-09-27
GB2292222B (en) 1998-07-08
US5689183A (en) 1997-11-18
GB2292222A (en) 1996-02-14
DE19529630A1 (de) 1996-02-15
KR960008329A (ko) 1996-03-22
JPH0854375A (ja) 1996-02-27
DE19529630B4 (de) 2006-08-31
TW274119B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1996-04-11

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