TW274119B - - Google Patents

Info

Publication number
TW274119B
TW274119B TW084108058A TW84108058A TW274119B TW 274119 B TW274119 B TW 274119B TW 084108058 A TW084108058 A TW 084108058A TW 84108058 A TW84108058 A TW 84108058A TW 274119 B TW274119 B TW 274119B
Authority
TW
Taiwan
Application number
TW084108058A
Original Assignee
Kaisei Kotei Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kaisei Kotei Kk filed Critical Kaisei Kotei Kk
Application granted granted Critical
Publication of TW274119B publication Critical patent/TW274119B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
TW084108058A 1994-08-11 1995-08-02 TW274119B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18930694A JPH0854375A (ja) 1994-08-11 1994-08-11 電磁誘導型検査装置

Publications (1)

Publication Number Publication Date
TW274119B true TW274119B (zh) 1996-04-11

Family

ID=16239137

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084108058A TW274119B (zh) 1994-08-11 1995-08-02

Country Status (6)

Country Link
US (1) US5689183A (zh)
JP (1) JPH0854375A (zh)
KR (1) KR100218653B1 (zh)
DE (1) DE19529630B4 (zh)
GB (1) GB2292222B (zh)
TW (1) TW274119B (zh)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2773422B1 (fr) * 1998-01-06 2000-02-04 Alsthom Cge Alcatel Dispositif de controle en amplitude et en phase d'un signal radiofrequence
US7317319B2 (en) * 2001-04-09 2008-01-08 Taiyo Yuden Co., Ltd. Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor
GB0113206D0 (en) * 2001-06-01 2001-07-25 Lattice Intellectual Property Pipe material discrimination
KR20040035975A (ko) * 2002-10-14 2004-04-30 주식회사 한국이미지 물체감지용 써치코일
US6873152B2 (en) * 2002-12-30 2005-03-29 General Electric Company Differential sensor apparatus and method for laminated core fault detection
AT501669B1 (de) * 2003-10-28 2007-01-15 Kerschhaggl Peter Dipl Ing Verfahren und vorrichtung zum unterscheiden von ein elktromagnetisches wechselfeld beeinflussendenteilen
EP1837666A4 (en) * 2005-01-11 2011-08-24 Taiyo Yuden Kk MEASUREMENT METHOD FOR ELECTROMAGNETIC FIELD DISTRIBUTION AND DEVICE THEREOF, COMPUTER PROGRAM AND INFORMATION RECORDING MEDIUM
US7256577B2 (en) * 2005-04-07 2007-08-14 The Boeing Company High frequency rotary eddy current probe device
KR100675505B1 (ko) 2005-04-29 2007-01-30 주식회사 비에스이 콘덴서 마이크로폰의 케이스
JP4809039B2 (ja) * 2005-11-07 2011-11-02 偕成エンジニア株式会社 電磁誘導型検査装置および電磁誘導型検査方法
US20070128756A1 (en) * 2005-12-07 2007-06-07 Bower Stephen P Method and apparatus for determining density of metal-inclusive components
JP2009085894A (ja) * 2007-10-02 2009-04-23 Kaisei Engineer Kk 溶接部欠陥検出方法及び装置
US7994807B1 (en) * 2007-10-23 2011-08-09 National Semiconductor Corporation Built-in test circuit for testing AC transfer characteristic of high-speed analog circuit
GB2456583B (en) * 2008-01-21 2012-09-05 Ge Inspection Technologies Ltd Eddy current inspection system and method of eddy current flaw detection
JP5530141B2 (ja) 2009-09-29 2014-06-25 富士フイルム株式会社 インク組成物及びインクジェット記録方法
US8564284B2 (en) 2011-02-11 2013-10-22 Siemens Energy, Inc. Fault detection for laminated core
US8508220B2 (en) 2011-02-11 2013-08-13 Siemens Energy, Inc. Fault detection for laminated core
JP4756409B1 (ja) * 2011-02-18 2011-08-24 大日機械工業株式会社 交番磁場を利用した非破壊検査装置および非破壊検査方法
WO2014051026A1 (ja) 2012-09-27 2014-04-03 富士フイルム株式会社 インク組成物、インクジェット記録方法、印刷物、ビスアシルホスフィンオキシド化合物、及び、モノアシルホスフィンオキシド化合物
JP6242155B2 (ja) * 2013-10-29 2017-12-06 大日機械工業株式会社 非破壊検査装置および非破壊検査方法
JP6326660B2 (ja) * 2014-11-12 2018-05-23 住友電工焼結合金株式会社 焼結体の非破壊検査方法
US10561342B2 (en) * 2015-09-21 2020-02-18 Board Of Regents, The University Of Texas System Systems and methods for detecting tremors
US10782263B2 (en) 2017-05-04 2020-09-22 Analog Devices Global Systems and methods for determining the condition of a gas sensor
US10288674B2 (en) * 2017-05-04 2019-05-14 Analog Devices Global Impedance characteristic circuit for electrochemical sensor
US11300544B2 (en) * 2019-03-29 2022-04-12 Illinois Tool Works Inc. Methods and systems for controlling output amperage
US20230103759A1 (en) * 2021-10-05 2023-04-06 Toyota Research Institute, Inc. Robotic Tool Control with Compliant Force/Geometry Sensor

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3823368A (en) * 1954-07-14 1974-07-09 Magnetic Analysis Corp Calibration and balance system in pulse eddy current testing apparatus
US3478263A (en) * 1967-09-27 1969-11-11 Rudolf G Hentschel Wide frequency range eddy current testing instrument
DE2142351C3 (de) * 1971-08-24 1979-05-03 Karl Deutsch Pruef- Und Messgeraetebau, 5600 Wuppertal Vorrichtung zur Verwechslungs- und Gefugeprüfung von ferromagnetischen Werkstoffen
US3916301A (en) * 1974-05-20 1975-10-28 Republic Steel Corp Magnetic flaw detection apparatus
FR2305809A1 (fr) * 1975-03-25 1976-10-22 Crouzet Sa Dispositif d'authentification de titres monetaires
US4063230A (en) * 1975-06-12 1977-12-13 The Magnavox Company Balanced field theft detection system
US4059795A (en) * 1976-06-03 1977-11-22 Sensor Corporation Digital eddy current apparatus for sensing and analyzing metallurgical characteristics of an electrically conductive material
US4594549A (en) * 1984-05-11 1986-06-10 United Technologies Corporation Uniform field generating eddy current testing processing method and apparatus
FR2570501B1 (fr) * 1984-09-20 1987-12-18 Siderurgie Fse Inst Rech Procede de detection de defauts de surface par courants de foucault et dispositif mettant en oeuvre ce procede
DE3720686A1 (de) * 1987-06-23 1989-01-05 Foerster Inst Dr Friedrich Verfahren zum untersuchen eines objektes
DE3743521A1 (de) * 1987-12-22 1989-07-06 Foerster Inst Dr Friedrich Vorrichtung zum pruefen von halbzeug
JPH05107230A (ja) * 1991-10-15 1993-04-27 Nippondenso Co Ltd 鋼材の脱炭層検出装置
JPH063327A (ja) * 1992-06-19 1994-01-11 Showa Kijiyuuki Seisakusho:Kk 磁性体の比較測定装置
JP2598948Y2 (ja) * 1993-03-02 1999-08-23 原電子測器株式会社 多チャンネル貫通形電磁誘導探傷用距離感度自動補正装置
JPH07100735A (ja) * 1993-09-30 1995-04-18 Omron Corp ドリル用センサ及びそれを用いたドリル状態監視装置

Also Published As

Publication number Publication date
KR960008329A (ko) 1996-03-22
GB2292222A (en) 1996-02-14
KR100218653B1 (ko) 1999-09-01
US5689183A (en) 1997-11-18
DE19529630A1 (de) 1996-02-15
JPH0854375A (ja) 1996-02-27
GB9515700D0 (en) 1995-09-27
DE19529630B4 (de) 2006-08-31
GB2292222B (en) 1998-07-08

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