TW281725B - - Google Patents

Info

Publication number
TW281725B
TW281725B TW084110444A TW84110444A TW281725B TW 281725 B TW281725 B TW 281725B TW 084110444 A TW084110444 A TW 084110444A TW 84110444 A TW84110444 A TW 84110444A TW 281725 B TW281725 B TW 281725B
Authority
TW
Taiwan
Application number
TW084110444A
Original Assignee
Zenshin Test Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zenshin Test Co filed Critical Zenshin Test Co
Application granted granted Critical
Publication of TW281725B publication Critical patent/TW281725B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW084110444A 1994-12-22 1995-10-04 TW281725B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33607494A JP3631275B2 (ja) 1994-12-22 1994-12-22 半導体試験装置のピン試験回路

Publications (1)

Publication Number Publication Date
TW281725B true TW281725B (zh) 1996-07-21

Family

ID=18295433

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084110444A TW281725B (zh) 1994-12-22 1995-10-04

Country Status (4)

Country Link
US (1) US5640102A (zh)
JP (1) JP3631275B2 (zh)
KR (1) KR100216116B1 (zh)
TW (1) TW281725B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114400042A (zh) * 2022-03-22 2022-04-26 合肥悦芯半导体科技有限公司 存储器测试系统

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3123444B2 (ja) * 1996-09-27 2001-01-09 安藤電気株式会社 Ｉｃ試験装置
US5956280A (en) * 1998-03-02 1999-09-21 Tanisys Technology, Inc. Contact test method and system for memory testers
JP3053012B2 (ja) * 1998-03-02 2000-06-19 日本電気株式会社 半導体装置の試験回路および試験方法
JP2000162284A (ja) * 1998-12-01 2000-06-16 Mitsubishi Electric Corp 半導体集積回路
US6504378B1 (en) 1999-11-24 2003-01-07 Micron Technology, Inc. Apparatus for evaluating contact pin integrity of electronic components having multiple contact pins
EP1180691A1 (en) * 2000-08-08 2002-02-20 Motorola, Inc. Circuit and method for stress testing a transistor in an integrated circuit device
JP4294053B2 (ja) * 2004-12-14 2009-07-08 敦章 渋谷 試験装置
KR100926815B1 (ko) * 2009-01-23 2009-11-12 이병헌 신발의 솔 구조

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4724379A (en) * 1984-03-14 1988-02-09 Teradyne, Inc. Relay multiplexing for circuit testers
KR950003285B1 (ko) * 1993-03-25 1995-04-07 삼성전자 주식회사 압축기

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114400042A (zh) * 2022-03-22 2022-04-26 合肥悦芯半导体科技有限公司 存储器测试系统
CN114400042B (zh) * 2022-03-22 2022-06-10 合肥悦芯半导体科技有限公司 存储器测试系统

Also Published As

Publication number Publication date
KR100216116B1 (ko) 1999-08-16
US5640102A (en) 1997-06-17
JP3631275B2 (ja) 2005-03-23
KR960026523A (ko) 1996-07-22
JPH08179011A (ja) 1996-07-12

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