KR0134790B1 - Arrangement for encasing a functional device and a process for production of same - Google Patents

Arrangement for encasing a functional device and a process for production of same

Info

Publication number
KR0134790B1
KR0134790B1 KR93700018A KR930700018A KR0134790B1 KR 0134790 B1 KR0134790 B1 KR 0134790B1 KR 93700018 A KR93700018 A KR 93700018A KR 930700018 A KR930700018 A KR 930700018A KR 0134790 B1 KR0134790 B1 KR 0134790B1
Authority
KR
South Korea
Prior art keywords
casing
functional device
arrangement
filling
encasing
Prior art date
Application number
KR93700018A
Other languages
English (en)
Inventor
Terie Kuisteroey
Henrik Jacobsen
Original Assignee
Sensonor As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sensonor As filed Critical Sensonor As
Application granted granted Critical
Publication of KR0134790B1 publication Critical patent/KR0134790B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P1/00—Details of instruments
    • G01P1/02—Housings
    • G01P1/023—Housings for acceleration measuring devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/02—Containers; Seals
    • H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
    • H01L23/057—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body the leads being parallel to the base
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
    • H01L23/22—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device liquid at the normal operating temperature of the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
    • H01L23/24—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151—Die mounting substrate
    • H01L2924/1515—Shape
    • H01L2924/15151—Shape the die mounting substrate comprising an aperture, e.g. for underfilling, outgassing, window type wire connections
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161—Cap
    • H01L2924/1615—Shape
    • H01L2924/16151—Cap comprising an aperture, e.g. for pressure control, encapsulation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161—Cap
    • H01L2924/1615—Shape
    • H01L2924/16152—Cap comprising a cavity for hosting the device, e.g. U-shaped cap
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191—Disposition
    • H01L2924/19101—Disposition of discrete passive components
    • H01L2924/19107—Disposition of discrete passive components off-chip wires
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/30107—Inductance

Landscapes

  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Packages (AREA)
  • Vending Machines For Individual Products (AREA)
KR93700018A 1991-05-06 1993-01-06 Arrangement for encasing a functional device and a process for production of same KR0134790B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO911774A NO911774D0 (no) 1991-05-06 1991-05-06 Anordning ved innkapsling av et funksjonsorgan, samt fremgangsmaate for fremstilling av samme.

Publications (1)

Publication Number Publication Date
KR0134790B1 true KR0134790B1 (en) 1998-04-20

Family

ID=19894131

Family Applications (1)

Application Number Title Priority Date Filing Date
KR93700018A KR0134790B1 (en) 1991-05-06 1993-01-06 Arrangement for encasing a functional device and a process for production of same

Country Status (10)

Country Link
EP (1) EP0539555B1 (ko)
JP (1) JPH06500205A (ko)
KR (1) KR0134790B1 (ko)
AT (1) ATE136686T1 (ko)
AU (1) AU649139B2 (ko)
BR (1) BR9205261A (ko)
CA (1) CA2086825A1 (ko)
DE (1) DE69209772T2 (ko)
NO (2) NO911774D0 (ko)
WO (1) WO1992020096A1 (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100905510B1 (ko) * 2001-01-31 2009-07-01 젠텍스 코포레이션 방사선 방사 장치 및 열소산 패키지
KR200475122Y1 (ko) * 2012-01-19 2014-11-07 맥 레이어스 사이언티픽-테크닉스 컴퍼니 리미티드 자성부재

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US5700697A (en) * 1993-02-01 1997-12-23 Silicon Packaging Technology Method for packaging an integrated circuit using a reconstructed package
DE9312005U1 (de) * 1993-08-11 1993-09-23 Siemens Matsushita Components GmbH & Co. KG, 81541 München Elektrisches bauelement in chip-bauweise
DE4340280C2 (de) * 1993-09-13 1996-08-29 Duerrwaechter E Dr Doduco Bauteilesatz für ein Gehäuse aus Kunststoff zum Aufnehmen von elektrischen Bauelementen
DE4330977C2 (de) * 1993-09-13 1996-04-18 Duerrwaechter E Dr Doduco Gehäuse aus Kunststoff, insbesondere zum Aufnehmen elektrischer Bauteile
FR2710810B1 (fr) * 1993-09-29 1995-12-01 Sagem Boîtier étanche de micro-composant et procédé d'encapsulation dans un tel boîtier.
EP0658933B1 (en) * 1993-12-16 2001-10-10 Sharp Kabushiki Kaisha Method for manufacturing light-emitting semiconductor devices
US5473512A (en) * 1993-12-16 1995-12-05 At&T Corp. Electronic device package having electronic device boonded, at a localized region thereof, to circuit board
EP0675363A3 (en) * 1994-03-31 1997-03-05 Delco Electronics Corp Acceleration measurement device.
EP0754350A4 (en) * 1994-04-05 1998-10-07 Olin Corp METAL ELECTRONIC BOX WITH FILLED CAVITY
SE502877C2 (sv) * 1994-06-14 1996-02-05 Ericsson Telefon Ab L M Anordning som förhindrar brand i elektronik
ES2183888T3 (es) * 1994-11-25 2003-04-01 Ami Doduco Gmbh Carcasa destinada a recibir componentes electronicos y/o micromecanicos, hecha de un material sintetico, en la que penetran pistas conductoras.
DE19503778C2 (de) * 1995-02-04 2002-10-31 Ami Doduco Gmbh Anordnung aus einem Gehäuse, einer Schaltungsträgerplatte und Zuleitungen
DK0764984T3 (da) * 1995-09-08 1999-06-28 Siemens Ag Beskyttelseshus til på et kredsløbssubstrat med bondtråd anbragte halvlederchips
EP0858015B1 (en) * 1997-02-10 2003-05-07 Mitutoyo Corporation Measuring method and measuring instrument with a trigger probe
ATE315235T1 (de) * 1998-04-03 2006-02-15 Allied Signal Inc Beschleunigungsaufnehmer
US6301966B1 (en) 1999-03-31 2001-10-16 Honeywell International, Inc. Clamshell cover accelerometer
WO2001095006A1 (en) 2000-06-06 2001-12-13 Iolon, Inc. Damped micromechanical device and method for making same
US7075112B2 (en) 2001-01-31 2006-07-11 Gentex Corporation High power radiation emitter device and heat dissipating package for electronic components
DE10111657A1 (de) 2001-03-09 2003-01-02 Heraeus Electro Nite Int Verfahren zur Herstellung eines Gehäuses für Sensorelemente, sowie Sensor, insbesondere Temperatur-Sensor
US6429510B1 (en) * 2001-05-30 2002-08-06 Ericsson Inc. Liquid damping of high frequency bond wire vibration
DE10134646A1 (de) * 2001-07-17 2003-02-06 Bosch Gmbh Robert Sensorelement
US6813828B2 (en) 2002-01-07 2004-11-09 Gel Pak L.L.C. Method for deconstructing an integrated circuit package using lapping
US6884663B2 (en) 2002-01-07 2005-04-26 Delphon Industries, Llc Method for reconstructing an integrated circuit package using lapping
DE10221303A1 (de) * 2002-05-14 2003-11-27 Valeo Schalter & Sensoren Gmbh Sensor, insbesondere Ultraschallsensor, und Verfahren zur Herstellung
DE10233296A1 (de) * 2002-07-22 2004-02-12 Endress + Hauser Gmbh + Co. Kg Verfahren zur Herstellung eines Gehäuses für einen gekapselten Sensor und entsprechendes Gehäuse
CN100399550C (zh) * 2003-02-03 2008-07-02 株式会社电装 传感器器件以及用于安装电子元件的陶瓷封装外壳
EP1720018A3 (en) 2003-02-03 2007-03-21 Denso Corporation Ceramic package for mounting electronic components
JP4837245B2 (ja) * 2003-06-26 2011-12-14 アール・ビー・コントロールズ株式会社 電子装置およびその製造方法
DE102005013762C5 (de) 2005-03-22 2012-12-20 Sew-Eurodrive Gmbh & Co. Kg Elektronisches Gerät und Verfahren zur Bestimmung der Temperatur eines Leistungshalbleiters
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US8746075B2 (en) 2012-02-16 2014-06-10 7-Sigma, Inc. Flexible electrically conductive nanotube sensor for elastomeric devices
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CN105340369A (zh) * 2013-02-06 2016-02-17 伊利诺伊大学评议会 具有容纳室的可拉伸的电子系统
US10840536B2 (en) 2013-02-06 2020-11-17 The Board Of Trustees Of The University Of Illinois Stretchable electronic systems with containment chambers
US10497633B2 (en) 2013-02-06 2019-12-03 The Board Of Trustees Of The University Of Illinois Stretchable electronic systems with fluid containment
US10555415B2 (en) * 2013-08-07 2020-02-04 SMR Patents S.à.r.l. Method for manufacturing a printed circuit board
EP2924725A1 (en) * 2014-03-25 2015-09-30 ABB Technology Ltd Electric module for subsea applications
US9337119B2 (en) * 2014-07-14 2016-05-10 Micron Technology, Inc. Stacked semiconductor die assemblies with high efficiency thermal paths and associated systems
US9443744B2 (en) * 2014-07-14 2016-09-13 Micron Technology, Inc. Stacked semiconductor die assemblies with high efficiency thermal paths and associated methods
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100905510B1 (ko) * 2001-01-31 2009-07-01 젠텍스 코포레이션 방사선 방사 장치 및 열소산 패키지
KR200475122Y1 (ko) * 2012-01-19 2014-11-07 맥 레이어스 사이언티픽-테크닉스 컴퍼니 리미티드 자성부재

Also Published As

Publication number Publication date
ATE136686T1 (de) 1996-04-15
WO1992020096A1 (en) 1992-11-12
BR9205261A (pt) 1993-07-20
NO911774D0 (no) 1991-05-06
NO930028D0 (no) 1993-01-06
EP0539555B1 (en) 1996-04-10
DE69209772T2 (de) 1996-11-07
EP0539555A1 (en) 1993-05-05
JPH06500205A (ja) 1994-01-06
AU1747492A (en) 1992-12-21
AU649139B2 (en) 1994-05-12
DE69209772D1 (de) 1996-05-15
NO930028L (no) 1993-01-06
CA2086825A1 (en) 1992-11-07

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