JPWO2023127152A5 - - Google Patents
Download PDFInfo
- Publication number
- JPWO2023127152A5 JPWO2023127152A5 JP2023570624A JP2023570624A JPWO2023127152A5 JP WO2023127152 A5 JPWO2023127152 A5 JP WO2023127152A5 JP 2023570624 A JP2023570624 A JP 2023570624A JP 2023570624 A JP2023570624 A JP 2023570624A JP WO2023127152 A5 JPWO2023127152 A5 JP WO2023127152A5
- Authority
- JP
- Japan
- Prior art keywords
- light
- reflected
- optical system
- convex portion
- reflected light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 120
- 238000000034 method Methods 0.000 claims description 25
- 238000007689 inspection Methods 0.000 claims 20
- 230000001678 irradiating effect Effects 0.000 claims 6
- 230000002950 deficient Effects 0.000 claims 4
- 238000005286 illumination Methods 0.000 claims 4
- 210000001747 pupil Anatomy 0.000 claims 3
- 239000012530 fluid Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 11
- 239000010409 thin film Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2021/048971 WO2023127152A1 (ja) | 2021-12-28 | 2021-12-28 | 光学装置および検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023127152A1 JPWO2023127152A1 (https=) | 2023-07-06 |
| JPWO2023127152A5 true JPWO2023127152A5 (https=) | 2024-12-06 |
Family
ID=86998482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023570624A Pending JPWO2023127152A1 (https=) | 2021-12-28 | 2021-12-28 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20250155236A1 (https=) |
| EP (1) | EP4459269A4 (https=) |
| JP (1) | JPWO2023127152A1 (https=) |
| CN (1) | CN118451317A (https=) |
| WO (1) | WO2023127152A1 (https=) |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6069539A (ja) * | 1983-09-26 | 1985-04-20 | Toshiba Corp | 表面欠陥検査装置 |
| JPS62235511A (ja) * | 1986-03-11 | 1987-10-15 | Kobe Steel Ltd | 表面状態検査装置 |
| JP2570010B2 (ja) * | 1991-06-30 | 1997-01-08 | 日本電気株式会社 | 表面溝方向判定方法及び装置 |
| JPH05157527A (ja) * | 1991-12-09 | 1993-06-22 | I N R Kenkyusho:Kk | 2次元又は3次元形状測定装置 |
| US5389794A (en) * | 1992-11-25 | 1995-02-14 | Qc Optics, Inc. | Surface pit and mound detection and discrimination system and method |
| US5404247A (en) * | 1993-08-02 | 1995-04-04 | International Business Machines Corporation | Telecentric and achromatic f-theta scan lens system and method of use |
| JP4160434B2 (ja) * | 2003-03-31 | 2008-10-01 | 財団法人鉄道総合技術研究所 | 画像読取装置 |
| JP2005283190A (ja) * | 2004-03-29 | 2005-10-13 | Hitachi High-Technologies Corp | 異物検査方法及びその装置 |
| JP2005291859A (ja) * | 2004-03-31 | 2005-10-20 | Nec Compound Semiconductor Devices Ltd | 微細構造測定方法、微細構造測定装置、および、微細構造解析システム |
| JP2008032669A (ja) * | 2006-07-27 | 2008-02-14 | Oputouea Kk | 光走査式平面外観検査装置 |
| RU2506188C2 (ru) | 2008-08-05 | 2014-02-10 | Алкоа Инк. | Металлические листы и пластины с текстурированными поверхностями, уменьшающими трение, и способы их изготовления |
| US8678316B2 (en) | 2009-01-29 | 2014-03-25 | The Boeing Company | Amorphous metal riblets |
| US8413928B2 (en) | 2009-09-25 | 2013-04-09 | The Boeing Company | Structurally designed aerodynamic riblets |
| DE102010031227A1 (de) | 2010-07-12 | 2012-01-12 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung zur Prüfung von Mikrostrukturierungsqualität |
| US20130146217A1 (en) | 2011-12-09 | 2013-06-13 | Nicholas Joseph Kray | Method of Applying Surface Riblets to an Aerodynamic Surface |
| US20140272237A1 (en) | 2013-03-15 | 2014-09-18 | Prc-Desoto International, Inc. | Strippable film assembly and coating for drag reduction |
| JP6186913B2 (ja) * | 2013-06-11 | 2017-08-30 | 富士ゼロックス株式会社 | 計測装置 |
| US10258982B2 (en) | 2014-04-23 | 2019-04-16 | Japan Science And Technology Agency | Combined-blade open flow path device and joined body thereof |
| US9751618B2 (en) | 2015-05-06 | 2017-09-05 | The Boeing Company | Optical effects for aerodynamic microstructures |
| WO2017063040A1 (en) | 2015-10-13 | 2017-04-20 | Bilinsky Henry Claudius | Microstructure patterns |
| DE112017006296B4 (de) | 2017-01-24 | 2023-02-02 | Hitachi, Ltd. | Fluidvorrichtung |
| US20220196569A1 (en) * | 2019-04-24 | 2022-06-23 | Nikon Corporation | Processing system and inspection system |
| US11614106B2 (en) | 2019-08-21 | 2023-03-28 | Lockheed Martin Corporation | Partially submerged periodic riblets |
-
2021
- 2021-12-28 WO PCT/JP2021/048971 patent/WO2023127152A1/ja not_active Ceased
- 2021-12-28 JP JP2023570624A patent/JPWO2023127152A1/ja active Pending
- 2021-12-28 US US18/725,564 patent/US20250155236A1/en active Pending
- 2021-12-28 CN CN202180105283.4A patent/CN118451317A/zh active Pending
- 2021-12-28 EP EP21970032.5A patent/EP4459269A4/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US12345654B2 (en) | Defect inspection device, defect inspection method, and adjustment substrate | |
| JP6691043B2 (ja) | 粒子特性評価装置 | |
| US20070159619A1 (en) | Cytometer | |
| JP2019512701A (ja) | 粒子特性評価 | |
| KR101446061B1 (ko) | 투명 기판의 표면 패턴 불량 측정 장치 | |
| CN111929280A (zh) | 包括考虑样本内光学路径长度变化的光学检查系统和方法 | |
| KR102587880B1 (ko) | 광학 소자 특성 측정 장치 | |
| JP7291959B2 (ja) | 光学装置及び光音響顕微鏡 | |
| JP2009008643A (ja) | 光走査式平面検査装置 | |
| JPWO2023127152A5 (https=) | ||
| CN108572160B (zh) | 一种折射率分布测量的折光计 | |
| JPS6273143A (ja) | 光学式ウエブ監視装置 | |
| JP3040131B2 (ja) | 球体表面の傷検査装置 | |
| JP2008026049A (ja) | フランジ焦点距離測定装置 | |
| JP3570488B2 (ja) | レーザビーム使用亜鉛メッキ鋼板合金化度測定方法 | |
| JP2001021480A (ja) | フローセル及びこのフローセルを用いた粒子測定装置 | |
| JPH0514221B2 (https=) | ||
| GB2054835A (en) | Scanning Apparatus for Flaw Detection | |
| JP4271593B2 (ja) | 表面傷検査装置 | |
| US7505151B2 (en) | Arrangement for the optical distance determination of a reflecting surface | |
| JP7052925B2 (ja) | 光散乱検出装置 | |
| JPS6015528A (ja) | レ−ザビ−ム特性測定方法 | |
| JP4904169B2 (ja) | 線条表面検査装置 | |
| KR102950027B1 (ko) | 박막 특성 측정장치 | |
| JP2687539B2 (ja) | 粒度分布測定装置 |