JPWO2023127152A5 - - Google Patents

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Publication number
JPWO2023127152A5
JPWO2023127152A5 JP2023570624A JP2023570624A JPWO2023127152A5 JP WO2023127152 A5 JPWO2023127152 A5 JP WO2023127152A5 JP 2023570624 A JP2023570624 A JP 2023570624A JP 2023570624 A JP2023570624 A JP 2023570624A JP WO2023127152 A5 JPWO2023127152 A5 JP WO2023127152A5
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JP
Japan
Prior art keywords
light
reflected
optical system
convex portion
reflected light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023570624A
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English (en)
Japanese (ja)
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JPWO2023127152A1 (https=
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Publication date
Application filed filed Critical
Priority claimed from PCT/JP2021/048971 external-priority patent/WO2023127152A1/ja
Publication of JPWO2023127152A1 publication Critical patent/JPWO2023127152A1/ja
Publication of JPWO2023127152A5 publication Critical patent/JPWO2023127152A5/ja
Pending legal-status Critical Current

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JP2023570624A 2021-12-28 2021-12-28 Pending JPWO2023127152A1 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/048971 WO2023127152A1 (ja) 2021-12-28 2021-12-28 光学装置および検査方法

Publications (2)

Publication Number Publication Date
JPWO2023127152A1 JPWO2023127152A1 (https=) 2023-07-06
JPWO2023127152A5 true JPWO2023127152A5 (https=) 2024-12-06

Family

ID=86998482

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023570624A Pending JPWO2023127152A1 (https=) 2021-12-28 2021-12-28

Country Status (5)

Country Link
US (1) US20250155236A1 (https=)
EP (1) EP4459269A4 (https=)
JP (1) JPWO2023127152A1 (https=)
CN (1) CN118451317A (https=)
WO (1) WO2023127152A1 (https=)

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6069539A (ja) * 1983-09-26 1985-04-20 Toshiba Corp 表面欠陥検査装置
JPS62235511A (ja) * 1986-03-11 1987-10-15 Kobe Steel Ltd 表面状態検査装置
JP2570010B2 (ja) * 1991-06-30 1997-01-08 日本電気株式会社 表面溝方向判定方法及び装置
JPH05157527A (ja) * 1991-12-09 1993-06-22 I N R Kenkyusho:Kk 2次元又は3次元形状測定装置
US5389794A (en) * 1992-11-25 1995-02-14 Qc Optics, Inc. Surface pit and mound detection and discrimination system and method
US5404247A (en) * 1993-08-02 1995-04-04 International Business Machines Corporation Telecentric and achromatic f-theta scan lens system and method of use
JP4160434B2 (ja) * 2003-03-31 2008-10-01 財団法人鉄道総合技術研究所 画像読取装置
JP2005283190A (ja) * 2004-03-29 2005-10-13 Hitachi High-Technologies Corp 異物検査方法及びその装置
JP2005291859A (ja) * 2004-03-31 2005-10-20 Nec Compound Semiconductor Devices Ltd 微細構造測定方法、微細構造測定装置、および、微細構造解析システム
JP2008032669A (ja) * 2006-07-27 2008-02-14 Oputouea Kk 光走査式平面外観検査装置
RU2506188C2 (ru) 2008-08-05 2014-02-10 Алкоа Инк. Металлические листы и пластины с текстурированными поверхностями, уменьшающими трение, и способы их изготовления
US8678316B2 (en) 2009-01-29 2014-03-25 The Boeing Company Amorphous metal riblets
US8413928B2 (en) 2009-09-25 2013-04-09 The Boeing Company Structurally designed aerodynamic riblets
DE102010031227A1 (de) 2010-07-12 2012-01-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Prüfung von Mikrostrukturierungsqualität
US20130146217A1 (en) 2011-12-09 2013-06-13 Nicholas Joseph Kray Method of Applying Surface Riblets to an Aerodynamic Surface
US20140272237A1 (en) 2013-03-15 2014-09-18 Prc-Desoto International, Inc. Strippable film assembly and coating for drag reduction
JP6186913B2 (ja) * 2013-06-11 2017-08-30 富士ゼロックス株式会社 計測装置
US10258982B2 (en) 2014-04-23 2019-04-16 Japan Science And Technology Agency Combined-blade open flow path device and joined body thereof
US9751618B2 (en) 2015-05-06 2017-09-05 The Boeing Company Optical effects for aerodynamic microstructures
WO2017063040A1 (en) 2015-10-13 2017-04-20 Bilinsky Henry Claudius Microstructure patterns
DE112017006296B4 (de) 2017-01-24 2023-02-02 Hitachi, Ltd. Fluidvorrichtung
US20220196569A1 (en) * 2019-04-24 2022-06-23 Nikon Corporation Processing system and inspection system
US11614106B2 (en) 2019-08-21 2023-03-28 Lockheed Martin Corporation Partially submerged periodic riblets

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