JP4271593B2 - 表面傷検査装置 - Google Patents
表面傷検査装置 Download PDFInfo
- Publication number
- JP4271593B2 JP4271593B2 JP2004047378A JP2004047378A JP4271593B2 JP 4271593 B2 JP4271593 B2 JP 4271593B2 JP 2004047378 A JP2004047378 A JP 2004047378A JP 2004047378 A JP2004047378 A JP 2004047378A JP 4271593 B2 JP4271593 B2 JP 4271593B2
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- Prior art keywords
- light
- sphere
- irradiation
- laser
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- 238000007689 inspection Methods 0.000 title claims description 18
- 230000003287 optical effect Effects 0.000 claims description 18
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000000034 method Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 208000024891 symptom Diseases 0.000 description 1
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- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
そして、反射光の干渉縞がセンサー内に入ることを避けるため、細長いスリットや横長センサーを用いて干渉縞をカットしている。また判定は一定電圧の閾値を傷信号が越えた場合に傷とするようにしている。
2.被検査対象物
3.レーザー照射部
4.コリメータ
5.円筒面レンズ
6.フォトダイオードアレイ
7.円筒面レンズ
8.光ファイバー
9.スリット
10.ハーフミラー
Claims (2)
- レーザー発振器と、そのレーザー光を伝送する伝送光学部品と、伝送後のレーザー光を平行ビームとするコリメータと、コリメータで平行とされた平行ビームを集光し被検査球体表面に照射する照射光学部品と、照射光とほぼ同一光路を逆進する被検査球体表面で反射されたレーザー光を集光する円筒面レンズと、集光された反射光を受光する受光素子と、受光素子からの信号を処理する電気回路とを有してなる表面傷検査装置において、前記照射光学部品をコリメータで平行とされた平行ビームを2枚の円筒面レンズにより長軸と短軸別々に集光し、レーザ光の断面形状を照射幅が数十〜数百μmの線状にして被検査球体表面に垂直に照射せしめるよう構成したことを特徴とする表面傷検査装置。
- 受光素子としてフォトダイオードアレイセンサーを使用する請求項1記載の表面傷検査装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004047378A JP4271593B2 (ja) | 2004-02-24 | 2004-02-24 | 表面傷検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004047378A JP4271593B2 (ja) | 2004-02-24 | 2004-02-24 | 表面傷検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005241257A JP2005241257A (ja) | 2005-09-08 |
JP4271593B2 true JP4271593B2 (ja) | 2009-06-03 |
Family
ID=35023161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2004047378A Expired - Lifetime JP4271593B2 (ja) | 2004-02-24 | 2004-02-24 | 表面傷検査装置 |
Country Status (1)
Country | Link |
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JP (1) | JP4271593B2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011007540A (ja) * | 2009-06-24 | 2011-01-13 | Koyo Mach Ind Co Ltd | 外観検査装置 |
-
2004
- 2004-02-24 JP JP2004047378A patent/JP4271593B2/ja not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011007540A (ja) * | 2009-06-24 | 2011-01-13 | Koyo Mach Ind Co Ltd | 外観検査装置 |
Also Published As
Publication number | Publication date |
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JP2005241257A (ja) | 2005-09-08 |
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