JPWO2023042359A5 - - Google Patents

Download PDF

Info

Publication number
JPWO2023042359A5
JPWO2023042359A5 JP2022522573A JP2022522573A JPWO2023042359A5 JP WO2023042359 A5 JPWO2023042359 A5 JP WO2023042359A5 JP 2022522573 A JP2022522573 A JP 2022522573A JP 2022522573 A JP2022522573 A JP 2022522573A JP WO2023042359 A5 JPWO2023042359 A5 JP WO2023042359A5
Authority
JP
Japan
Prior art keywords
length
source
semiconductor device
source region
lxm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022522573A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023042359A1 (https=
JP7114824B1 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2021/034220 external-priority patent/WO2023042359A1/ja
Application granted granted Critical
Publication of JP7114824B1 publication Critical patent/JP7114824B1/ja
Publication of JPWO2023042359A1 publication Critical patent/JPWO2023042359A1/ja
Publication of JPWO2023042359A5 publication Critical patent/JPWO2023042359A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2022522573A 2021-09-17 2021-09-17 半導体装置 Active JP7114824B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/034220 WO2023042359A1 (ja) 2021-09-17 2021-09-17 半導体装置

Publications (3)

Publication Number Publication Date
JP7114824B1 JP7114824B1 (ja) 2022-08-08
JPWO2023042359A1 JPWO2023042359A1 (https=) 2023-03-23
JPWO2023042359A5 true JPWO2023042359A5 (https=) 2023-08-22

Family

ID=82748809

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022522573A Active JP7114824B1 (ja) 2021-09-17 2021-09-17 半導体装置

Country Status (5)

Country Link
US (1) US11637176B2 (https=)
JP (1) JP7114824B1 (https=)
KR (1) KR102434890B1 (https=)
CN (1) CN115152032B (https=)
WO (1) WO2023042359A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7566609B2 (ja) * 2020-12-11 2024-10-15 株式会社東芝 半導体装置

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05304297A (ja) 1992-01-29 1993-11-16 Nec Corp 電力用半導体装置およびその製造方法
JP4194890B2 (ja) * 2003-06-24 2008-12-10 株式会社豊田中央研究所 半導体装置とその製造方法
US7372088B2 (en) 2004-01-27 2008-05-13 Matsushita Electric Industrial Co., Ltd. Vertical gate semiconductor device and method for fabricating the same
JP3999225B2 (ja) 2004-01-27 2007-10-31 松下電器産業株式会社 半導体装置およびその製造方法
DE102005014743B4 (de) 2005-03-31 2013-12-05 Infineon Technologies Austria Ag MOS-Feldplattentrench-Transistoreinrichtung
JP5369372B2 (ja) * 2005-11-28 2013-12-18 富士電機株式会社 半導体装置および半導体装置の製造方法
JP5285242B2 (ja) * 2007-07-04 2013-09-11 ローム株式会社 半導体装置
US20090272982A1 (en) * 2008-03-03 2009-11-05 Fuji Electric Device Technology Co., Ltd. Trench gate type semiconductor device and method of producing the same
JP4670915B2 (ja) * 2008-08-08 2011-04-13 ソニー株式会社 半導体装置
JP2013197122A (ja) * 2012-03-15 2013-09-30 Toshiba Corp 半導体装置
JP2013258333A (ja) * 2012-06-13 2013-12-26 Toshiba Corp 電力用半導体装置
US10608104B2 (en) 2014-03-28 2020-03-31 Infineon Technologies Ag Trench transistor device
JP6871316B2 (ja) * 2014-04-15 2021-05-12 ローム株式会社 半導体装置および半導体装置の製造方法
JP6566512B2 (ja) 2014-04-15 2019-08-28 ローム株式会社 半導体装置および半導体装置の製造方法
JP6369173B2 (ja) * 2014-04-17 2018-08-08 富士電機株式会社 縦型半導体装置およびその製造方法
DE102014114832B4 (de) * 2014-10-13 2020-06-18 Infineon Technologies Austria Ag Halbleitervorrichtung und Verfahren zum Herstellen einer Halbleitervorrichtung
JP2016171341A (ja) * 2016-05-26 2016-09-23 ローム株式会社 半導体装置
KR102259185B1 (ko) * 2016-08-02 2021-06-01 누보톤 테크놀로지 재팬 가부시키가이샤 반도체 장치, 반도체 모듈, 및 반도체 패키지 장치
JP6639365B2 (ja) 2016-09-16 2020-02-05 株式会社東芝 半導体装置
WO2018123799A1 (ja) * 2016-12-27 2018-07-05 パナソニックIpマネジメント株式会社 半導体装置
JP6817116B2 (ja) * 2017-03-14 2021-01-20 エイブリック株式会社 半導体装置
JP6870547B2 (ja) * 2017-09-18 2021-05-12 株式会社デンソー 半導体装置およびその製造方法
JP6631934B1 (ja) * 2018-06-19 2020-01-15 パナソニックIpマネジメント株式会社 半導体装置
TWI761740B (zh) * 2018-12-19 2022-04-21 日商新唐科技日本股份有限公司 半導體裝置
JP7140148B2 (ja) 2019-02-27 2022-09-21 株式会社デンソー 炭化珪素半導体装置およびその製造方法

Similar Documents

Publication Publication Date Title
TWI407548B (zh) 積體有感應電晶體的分立功率金屬氧化物半導體場效應電晶體
KR100994719B1 (ko) 슈퍼정션 반도체장치
US8884364B2 (en) Semiconductor device with field-plate electrode
KR100671411B1 (ko) 초접합 구조를 갖는 반도체 장치 및 그 제조 방법
CN102339863B (zh) 半导体装置
US9385230B2 (en) Semiconductor device
US8338907B2 (en) Semiconductor device and method of manufacturing the same
JP2001244461A (ja) 縦型半導体装置
US20130270633A1 (en) Semiconductor device
JP2002519852A (ja) ラテラル高電圧トランジスタ
WO2007105384A1 (en) Insulated gate-type semiconductor device and manufacturing method thereof
US6998680B2 (en) Semiconductor device
US10164021B2 (en) Silicon carbide semiconductor device
US20110180909A1 (en) Semiconductor device
JP7164497B2 (ja) 半導体装置
US11557648B2 (en) Semiconductor device and method of manufacturing the same
JPWO2023042359A5 (https=)
JPWO2022085765A5 (https=)
US20250081576A1 (en) Semiconductor device and method for manufacturing the semiconductor device
KR101357620B1 (ko) 반도체 장치용 3d 채널 구조물
KR102812224B1 (ko) 에피택셜층의 유효 두께 차등 구조를 가지는 슈퍼정션 반도체 소자 및 제조방법
JP7819024B2 (ja) 半導体装置
CN119317157B (zh) 一种功率半导体器件版图
KR102956897B1 (ko) 슈퍼정션 반도체 소자 및 제조방법
KR102930634B1 (ko) 슈퍼정션 반도체 소자 및 제조방법