JPWO2022070304A5 - - Google Patents

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Publication number
JPWO2022070304A5
JPWO2022070304A5 JP2022553298A JP2022553298A JPWO2022070304A5 JP WO2022070304 A5 JPWO2022070304 A5 JP WO2022070304A5 JP 2022553298 A JP2022553298 A JP 2022553298A JP 2022553298 A JP2022553298 A JP 2022553298A JP WO2022070304 A5 JPWO2022070304 A5 JP WO2022070304A5
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JP
Japan
Prior art keywords
termination
trench
gate
insulating film
layer
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JP2022553298A
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English (en)
Japanese (ja)
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JPWO2022070304A1 (https=
JP7330392B2 (ja
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Priority claimed from PCT/JP2020/037139 external-priority patent/WO2022070304A1/ja
Publication of JPWO2022070304A1 publication Critical patent/JPWO2022070304A1/ja
Publication of JPWO2022070304A5 publication Critical patent/JPWO2022070304A5/ja
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JP2022553298A 2020-09-30 2020-09-30 半導体装置および半導体装置の製造方法 Active JP7330392B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/037139 WO2022070304A1 (ja) 2020-09-30 2020-09-30 半導体装置および半導体装置の製造方法

Publications (3)

Publication Number Publication Date
JPWO2022070304A1 JPWO2022070304A1 (https=) 2022-04-07
JPWO2022070304A5 true JPWO2022070304A5 (https=) 2022-11-25
JP7330392B2 JP7330392B2 (ja) 2023-08-21

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ID=80951544

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JP2022553298A Active JP7330392B2 (ja) 2020-09-30 2020-09-30 半導体装置および半導体装置の製造方法

Country Status (5)

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US (1) US20230246101A1 (https=)
JP (1) JP7330392B2 (https=)
CN (1) CN116325175B (https=)
DE (1) DE112020007650T5 (https=)
WO (1) WO2022070304A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117038732B (zh) * 2023-07-15 2024-09-27 湖北九峰山实验室 一种宽禁带半导体沟槽mosfet器件及其制作方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6838722B2 (en) 2002-03-22 2005-01-04 Siliconix Incorporated Structures of and methods of fabricating trench-gated MIS devices
US6861701B2 (en) * 2003-03-05 2005-03-01 Advanced Analogic Technologies, Inc. Trench power MOSFET with planarized gate bus
DE102005008354B4 (de) * 2005-02-23 2007-12-27 Infineon Technologies Austria Ag Halbleiterbauteil sowie Verfahren zu dessen Herstellung
JP2010251422A (ja) 2009-04-13 2010-11-04 Renesas Electronics Corp 半導体装置及びその製造方法
US8319282B2 (en) * 2010-07-09 2012-11-27 Infineon Technologies Austria Ag High-voltage bipolar transistor with trench field plate
JP6135181B2 (ja) * 2013-02-26 2017-05-31 サンケン電気株式会社 半導体装置
DE112015004374B4 (de) 2014-09-26 2019-02-14 Mitsubishi Electric Corporation Halbleitervorrichtung
CN107683530B (zh) * 2015-06-09 2020-08-18 三菱电机株式会社 电力用半导体装置
CN107644902A (zh) * 2016-07-22 2018-01-30 三垦电气株式会社 半导体装置
JP6967907B2 (ja) * 2017-08-07 2021-11-17 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
US10580888B1 (en) * 2018-08-08 2020-03-03 Infineon Technologies Austria Ag Oxygen inserted Si-layers for reduced contact implant outdiffusion in vertical power devices
TWI684276B (zh) * 2019-01-11 2020-02-01 力源半導體股份有限公司 溝渠式功率電晶體及其製作方法

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