JPWO2021041643A5 - - Google Patents

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Publication number
JPWO2021041643A5
JPWO2021041643A5 JP2022513132A JP2022513132A JPWO2021041643A5 JP WO2021041643 A5 JPWO2021041643 A5 JP WO2021041643A5 JP 2022513132 A JP2022513132 A JP 2022513132A JP 2022513132 A JP2022513132 A JP 2022513132A JP WO2021041643 A5 JPWO2021041643 A5 JP WO2021041643A5
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JP
Japan
Prior art keywords
electrostatic
heater
electrostatic chuck
diffusion layer
heating zone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022513132A
Other languages
English (en)
Japanese (ja)
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JP7673053B2 (ja
JP2022545723A5 (https=
JP2022545723A (ja
Publication date
Priority claimed from US16/552,790 external-priority patent/US11515190B2/en
Application filed filed Critical
Publication of JP2022545723A publication Critical patent/JP2022545723A/ja
Publication of JPWO2021041643A5 publication Critical patent/JPWO2021041643A5/ja
Publication of JP2022545723A5 publication Critical patent/JP2022545723A5/ja
Application granted granted Critical
Publication of JP7673053B2 publication Critical patent/JP7673053B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2022513132A 2019-08-27 2020-08-27 半導体ウェハホルダー用熱拡散板 Active JP7673053B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16/552,790 US11515190B2 (en) 2019-08-27 2019-08-27 Thermal diffuser for a semiconductor wafer holder
US16/552,790 2019-08-27
PCT/US2020/048159 WO2021041643A1 (en) 2019-08-27 2020-08-27 Thermal diffuser for a semiconductor wafer holder

Publications (4)

Publication Number Publication Date
JP2022545723A JP2022545723A (ja) 2022-10-28
JPWO2021041643A5 true JPWO2021041643A5 (https=) 2023-09-04
JP2022545723A5 JP2022545723A5 (https=) 2023-09-04
JP7673053B2 JP7673053B2 (ja) 2025-05-08

Family

ID=72428372

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022513132A Active JP7673053B2 (ja) 2019-08-27 2020-08-27 半導体ウェハホルダー用熱拡散板

Country Status (8)

Country Link
US (2) US11515190B2 (https=)
EP (1) EP4022672B1 (https=)
JP (1) JP7673053B2 (https=)
KR (1) KR102524609B1 (https=)
CN (1) CN114521288B (https=)
MY (1) MY209515A (https=)
TW (1) TWI830942B (https=)
WO (1) WO2021041643A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11515190B2 (en) * 2019-08-27 2022-11-29 Watlow Electric Manufacturing Company Thermal diffuser for a semiconductor wafer holder
US11842918B2 (en) * 2019-10-02 2023-12-12 Canon Kabushiki Kaisha Wafer chuck, method for producing the same, and exposure apparatus
CN115478261B (zh) * 2021-05-31 2025-02-14 中微半导体设备(上海)股份有限公司 一种气体喷淋头及化学气相沉积设备
JP7848975B2 (ja) * 2022-06-24 2026-04-21 新光電気工業株式会社 基板固定装置
CN121753540A (zh) * 2023-08-29 2026-03-27 日本碍子株式会社 晶片载放台及其使用方法
US12583211B2 (en) 2023-09-22 2026-03-24 Applied Materials, Inc. Substrate support assembly with multiple discs
US12537464B2 (en) 2023-10-06 2026-01-27 Applied Materials, Inc. Substrate support assembly with dieletric cooling plate
WO2026006191A1 (en) * 2024-06-24 2026-01-02 Watlow Electric Manufacturing Company Method for early thermal performance assessment of a heater component

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US5155652A (en) 1991-05-02 1992-10-13 International Business Machines Corporation Temperature cycling ceramic electrostatic chuck
JP3825277B2 (ja) * 2001-05-25 2006-09-27 東京エレクトロン株式会社 加熱処理装置
US6535372B2 (en) * 2001-06-20 2003-03-18 Applied Materials, Inc. Controlled resistivity boron nitride electrostatic chuck apparatus for retaining a semiconductor wafer and method of fabricating the same
JP3742349B2 (ja) * 2002-02-15 2006-02-01 株式会社日立製作所 プラズマ処理装置
JP2003243490A (ja) * 2002-02-18 2003-08-29 Hitachi High-Technologies Corp ウエハ処理装置とウエハステージ及びウエハ処理方法
US20050042881A1 (en) * 2003-05-12 2005-02-24 Tokyo Electron Limited Processing apparatus
EP1676309A1 (en) * 2003-10-09 2006-07-05 SNT Co., Ltd. Electro-static chuck with non-sintered aln and a method of preparing the same
US7544251B2 (en) * 2004-10-07 2009-06-09 Applied Materials, Inc. Method and apparatus for controlling temperature of a substrate
KR20090001685A (ko) * 2007-05-10 2009-01-09 (주) 컴파스 시스템 컴퓨터 신호에 따른 화상을 화면에 출력하는 광고장치 및이에 적합한 광고 방법
US7667944B2 (en) * 2007-06-29 2010-02-23 Praxair Technology, Inc. Polyceramic e-chuck
JP2009291793A (ja) * 2008-06-02 2009-12-17 Kuroki Kogyosho:Kk 構造体の製造法
US20100116788A1 (en) * 2008-11-12 2010-05-13 Lam Research Corporation Substrate temperature control by using liquid controlled multizone substrate support
US20120196242A1 (en) * 2011-01-27 2012-08-02 Applied Materials, Inc. Substrate support with heater and rapid temperature change
WO2013033340A1 (en) * 2011-08-30 2013-03-07 Watlow Electric Manufacturing Company Thermal array system
JP6077301B2 (ja) * 2012-12-28 2017-02-08 日本特殊陶業株式会社 静電チャック
US20170051402A1 (en) * 2015-08-17 2017-02-23 Asm Ip Holding B.V. Susceptor and substrate processing apparatus
US10154542B2 (en) 2015-10-19 2018-12-11 Watlow Electric Manufacturing Company Composite device with cylindrical anisotropic thermal conductivity
CN108475656B (zh) * 2015-12-28 2023-09-05 日本碍子株式会社 圆盘状加热器以及加热器冷却板组件
JP6597437B2 (ja) 2016-03-24 2019-10-30 住友大阪セメント株式会社 静電チャック装置
KR102360248B1 (ko) * 2016-05-10 2022-02-07 램 리써치 코포레이션 상이한 히터 트레이스 재료를 사용한 적층된 히터
KR20180001685A (ko) * 2016-06-27 2018-01-05 세메스 주식회사 기판 지지체 및 이를 갖는 베이크 유닛
TWI791558B (zh) * 2017-07-27 2023-02-11 美商應用材料股份有限公司 用於半導體基板處理室的溫度控制的方法、非暫時性機器可讀儲存媒體以及系統
US11515190B2 (en) * 2019-08-27 2022-11-29 Watlow Electric Manufacturing Company Thermal diffuser for a semiconductor wafer holder

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