JP2022545723A5 - - Google Patents

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Publication number
JP2022545723A5
JP2022545723A5 JP2022513132A JP2022513132A JP2022545723A5 JP 2022545723 A5 JP2022545723 A5 JP 2022545723A5 JP 2022513132 A JP2022513132 A JP 2022513132A JP 2022513132 A JP2022513132 A JP 2022513132A JP 2022545723 A5 JP2022545723 A5 JP 2022545723A5
Authority
JP
Japan
Prior art keywords
heater
electrostatic chuck
chuck according
electrostatic
diffusion layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022513132A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022545723A (ja
JP7673053B2 (ja
Filing date
Publication date
Priority claimed from US16/552,790 external-priority patent/US11515190B2/en
Application filed filed Critical
Publication of JP2022545723A publication Critical patent/JP2022545723A/ja
Publication of JP2022545723A5 publication Critical patent/JP2022545723A5/ja
Application granted granted Critical
Publication of JP7673053B2 publication Critical patent/JP7673053B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2022513132A 2019-08-27 2020-08-27 半導体ウェハホルダー用熱拡散板 Active JP7673053B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16/552,790 2019-08-27
US16/552,790 US11515190B2 (en) 2019-08-27 2019-08-27 Thermal diffuser for a semiconductor wafer holder
PCT/US2020/048159 WO2021041643A1 (en) 2019-08-27 2020-08-27 Thermal diffuser for a semiconductor wafer holder

Publications (3)

Publication Number Publication Date
JP2022545723A JP2022545723A (ja) 2022-10-28
JP2022545723A5 true JP2022545723A5 (https=) 2023-09-04
JP7673053B2 JP7673053B2 (ja) 2025-05-08

Family

ID=72428372

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022513132A Active JP7673053B2 (ja) 2019-08-27 2020-08-27 半導体ウェハホルダー用熱拡散板

Country Status (8)

Country Link
US (2) US11515190B2 (https=)
EP (1) EP4022672B1 (https=)
JP (1) JP7673053B2 (https=)
KR (1) KR102524609B1 (https=)
CN (1) CN114521288B (https=)
MY (1) MY209515A (https=)
TW (1) TWI830942B (https=)
WO (1) WO2021041643A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11515190B2 (en) * 2019-08-27 2022-11-29 Watlow Electric Manufacturing Company Thermal diffuser for a semiconductor wafer holder
US11842918B2 (en) * 2019-10-02 2023-12-12 Canon Kabushiki Kaisha Wafer chuck, method for producing the same, and exposure apparatus
CN115478261B (zh) * 2021-05-31 2025-02-14 中微半导体设备(上海)股份有限公司 一种气体喷淋头及化学气相沉积设备
JP7848975B2 (ja) * 2022-06-24 2026-04-21 新光電気工業株式会社 基板固定装置
CN121753540A (zh) * 2023-08-29 2026-03-27 日本碍子株式会社 晶片载放台及其使用方法
US12583211B2 (en) 2023-09-22 2026-03-24 Applied Materials, Inc. Substrate support assembly with multiple discs
US12537464B2 (en) 2023-10-06 2026-01-27 Applied Materials, Inc. Substrate support assembly with dieletric cooling plate
WO2026006191A1 (en) * 2024-06-24 2026-01-02 Watlow Electric Manufacturing Company Method for early thermal performance assessment of a heater component

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US5155652A (en) * 1991-05-02 1992-10-13 International Business Machines Corporation Temperature cycling ceramic electrostatic chuck
JP3825277B2 (ja) * 2001-05-25 2006-09-27 東京エレクトロン株式会社 加熱処理装置
US6535372B2 (en) 2001-06-20 2003-03-18 Applied Materials, Inc. Controlled resistivity boron nitride electrostatic chuck apparatus for retaining a semiconductor wafer and method of fabricating the same
JP3742349B2 (ja) 2002-02-15 2006-02-01 株式会社日立製作所 プラズマ処理装置
JP2003243490A (ja) 2002-02-18 2003-08-29 Hitachi High-Technologies Corp ウエハ処理装置とウエハステージ及びウエハ処理方法
US20050042881A1 (en) * 2003-05-12 2005-02-24 Tokyo Electron Limited Processing apparatus
US20070065678A1 (en) * 2003-10-09 2007-03-22 Ko Kyung-Hyun Electro-static chuck with non-sintered aln and a method of preparing the same
US7544251B2 (en) * 2004-10-07 2009-06-09 Applied Materials, Inc. Method and apparatus for controlling temperature of a substrate
KR20090001685A (ko) * 2007-05-10 2009-01-09 (주) 컴파스 시스템 컴퓨터 신호에 따른 화상을 화면에 출력하는 광고장치 및이에 적합한 광고 방법
US7667944B2 (en) * 2007-06-29 2010-02-23 Praxair Technology, Inc. Polyceramic e-chuck
JP2009291793A (ja) * 2008-06-02 2009-12-17 Kuroki Kogyosho:Kk 構造体の製造法
US20100116788A1 (en) 2008-11-12 2010-05-13 Lam Research Corporation Substrate temperature control by using liquid controlled multizone substrate support
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JP6077301B2 (ja) 2012-12-28 2017-02-08 日本特殊陶業株式会社 静電チャック
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JP6608444B2 (ja) * 2015-12-28 2019-11-20 日本碍子株式会社 円板状ヒータ及びヒータ冷却板アセンブリ
JP6597437B2 (ja) 2016-03-24 2019-10-30 住友大阪セメント株式会社 静電チャック装置
KR102360248B1 (ko) * 2016-05-10 2022-02-07 램 리써치 코포레이션 상이한 히터 트레이스 재료를 사용한 적층된 히터
KR20180001685A (ko) * 2016-06-27 2018-01-05 세메스 주식회사 기판 지지체 및 이를 갖는 베이크 유닛
TWI791558B (zh) * 2017-07-27 2023-02-11 美商應用材料股份有限公司 用於半導體基板處理室的溫度控制的方法、非暫時性機器可讀儲存媒體以及系統
US11515190B2 (en) * 2019-08-27 2022-11-29 Watlow Electric Manufacturing Company Thermal diffuser for a semiconductor wafer holder

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