JPWO2020261698A1 - - Google Patents

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Publication number
JPWO2020261698A1
JPWO2020261698A1 JP2021527394A JP2021527394A JPWO2020261698A1 JP WO2020261698 A1 JPWO2020261698 A1 JP WO2020261698A1 JP 2021527394 A JP2021527394 A JP 2021527394A JP 2021527394 A JP2021527394 A JP 2021527394A JP WO2020261698 A1 JPWO2020261698 A1 JP WO2020261698A1
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JP
Japan
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Application number
JP2021527394A
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JP7238126B2 (ja
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Publication of JPWO2020261698A1 publication Critical patent/JPWO2020261698A1/ja
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Publication of JP7238126B2 publication Critical patent/JP7238126B2/ja
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
    • H01L21/67265—Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/02—Sensing devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Programme-controlled manipulators
    • B25J9/16—Programme controls
    • B25J9/1679—Programme controls characterised by the tasks executed
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/42—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine
    • G05B19/421—Teaching successive positions by mechanical means, e.g. by mechanically-coupled handwheels to position tool head or end effector
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/42—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine
    • G05B19/425—Teaching successive positions by numerical control, i.e. commands being entered to control the positioning servo of the tool head or end effector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67766—Mechanical parts of transfer devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J11/00—Manipulators not otherwise provided for
    • B25J11/0095—Manipulators transporting wafers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/02—Sensing devices
    • B25J19/021—Optical sensing devices
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/36—Nc in input of data, input key till input tape
    • G05B2219/36401—Record play back, teach position and record it then play back
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/45—Nc applications
    • G05B2219/45031—Manufacturing semiconductor wafers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Robotics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
JP2021527394A 2019-06-27 2020-04-03 基板マッピング装置、そのマッピング方法及びマッピング教示方法 Active JP7238126B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019119637 2019-06-27
JP2019119637 2019-06-27
PCT/JP2020/015375 WO2020261698A1 (ja) 2019-06-27 2020-04-03 基板マッピング装置、そのマッピング方法及びマッピング教示方法

Publications (2)

Publication Number Publication Date
JPWO2020261698A1 true JPWO2020261698A1 (ja) 2020-12-30
JP7238126B2 JP7238126B2 (ja) 2023-03-13

Family

ID=74061602

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021527394A Active JP7238126B2 (ja) 2019-06-27 2020-04-03 基板マッピング装置、そのマッピング方法及びマッピング教示方法

Country Status (6)

Country Link
US (1) US12131925B2 (ja)
JP (1) JP7238126B2 (ja)
KR (1) KR102698070B1 (ja)
CN (1) CN114025925A (ja)
TW (1) TWI721860B (ja)
WO (1) WO2020261698A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11996308B2 (en) * 2021-03-03 2024-05-28 Taiwan Semiconductor Manufacturing Company, Ltd. Method for mapping wafers in a wafer carrier
JP2022144478A (ja) * 2021-03-19 2022-10-03 川崎重工業株式会社 ウエハ搬送ロボット及びウエハ取出方法

Citations (9)

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JPH11116049A (ja) * 1997-10-16 1999-04-27 Nikon Corp 基板搬送方法及び基板搬送装置
JP2006175532A (ja) * 2004-12-21 2006-07-06 Fanuc Ltd ロボット制御装置
JP2008149583A (ja) * 2006-12-18 2008-07-03 Bridgestone Corp 空気入りタイヤ製造用ベルトサーバー
KR20090026880A (ko) * 2007-09-11 2009-03-16 세메스 주식회사 매핑 장치의 파라미터의 자동 보정 방법
JP2014075397A (ja) * 2012-10-03 2014-04-24 Tokyo Electron Ltd 搬送機構の位置決め方法
JP2014229730A (ja) * 2013-05-22 2014-12-08 株式会社安川電機 基板搬送ロボット、基板搬送システムおよび基板の配置状態の検出方法
JP2015178158A (ja) * 2014-03-19 2015-10-08 株式会社デンソーウェーブ ロボットの制御方法、ロボットの制御装置
JP2017076710A (ja) * 2015-10-15 2017-04-20 株式会社安川電機 搬送システム、ロボットおよび搬送方法
WO2018062156A1 (ja) * 2016-09-28 2018-04-05 川崎重工業株式会社 ロボット、ロボットの制御装置、及び、ロボットの位置教示方法

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JP2000124289A (ja) * 1998-10-19 2000-04-28 Mecs Corp 薄型基板搬送ロボットのハンド
US6900451B2 (en) * 2001-11-08 2005-05-31 Multimextrixs, Llc Mapping sensor system for detecting positions of flat objects
KR100490203B1 (ko) * 2002-02-04 2005-05-17 삼성전자주식회사 웨이퍼 맵핑 방법
US7677859B2 (en) * 2002-07-22 2010-03-16 Brooks Automation, Inc. Substrate loading and uploading station with buffer
KR100504695B1 (ko) * 2003-02-18 2005-08-03 삼성전자주식회사 반도체 웨이퍼 매핑 장치
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US9796086B2 (en) 2015-05-01 2017-10-24 Kawasaki Jukogyo Kabushiki Kaisha Method of teaching robot and robot
CN105097592B (zh) * 2015-06-17 2018-01-26 北京七星华创电子股份有限公司 半导体设备承载区域的硅片分布状态光电扫描方法及装置
CN108780770B (zh) * 2016-03-04 2022-12-06 川崎重工业株式会社 基板搬送装置及基板搬送机器人的示教方法
JP6708924B2 (ja) * 2016-03-22 2020-06-10 シンフォニアテクノロジー株式会社 ロードポートの制御装置、およびマッピングセンサのティーチング方法
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JP6741537B2 (ja) * 2016-09-28 2020-08-19 川崎重工業株式会社 ロボット、ロボットの制御装置、及び、ロボットの位置教示方法
JP7082274B2 (ja) * 2017-11-06 2022-06-08 シンフォニアテクノロジー株式会社 ロードポート、及びロードポートにおけるマッピング処理方法
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11116049A (ja) * 1997-10-16 1999-04-27 Nikon Corp 基板搬送方法及び基板搬送装置
JP2006175532A (ja) * 2004-12-21 2006-07-06 Fanuc Ltd ロボット制御装置
JP2008149583A (ja) * 2006-12-18 2008-07-03 Bridgestone Corp 空気入りタイヤ製造用ベルトサーバー
KR20090026880A (ko) * 2007-09-11 2009-03-16 세메스 주식회사 매핑 장치의 파라미터의 자동 보정 방법
JP2014075397A (ja) * 2012-10-03 2014-04-24 Tokyo Electron Ltd 搬送機構の位置決め方法
JP2014229730A (ja) * 2013-05-22 2014-12-08 株式会社安川電機 基板搬送ロボット、基板搬送システムおよび基板の配置状態の検出方法
JP2015178158A (ja) * 2014-03-19 2015-10-08 株式会社デンソーウェーブ ロボットの制御方法、ロボットの制御装置
JP2017076710A (ja) * 2015-10-15 2017-04-20 株式会社安川電機 搬送システム、ロボットおよび搬送方法
WO2018062156A1 (ja) * 2016-09-28 2018-04-05 川崎重工業株式会社 ロボット、ロボットの制御装置、及び、ロボットの位置教示方法

Also Published As

Publication number Publication date
US12131925B2 (en) 2024-10-29
TWI721860B (zh) 2021-03-11
KR102698070B1 (ko) 2024-08-22
US20220351994A1 (en) 2022-11-03
TW202106473A (zh) 2021-02-16
WO2020261698A1 (ja) 2020-12-30
JP7238126B2 (ja) 2023-03-13
CN114025925A (zh) 2022-02-08
KR20220024899A (ko) 2022-03-03

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