JPWO2015064697A1 - 受発光素子およびこれを用いたセンサ装置 - Google Patents
受発光素子およびこれを用いたセンサ装置 Download PDFInfo
- Publication number
- JPWO2015064697A1 JPWO2015064697A1 JP2015545298A JP2015545298A JPWO2015064697A1 JP WO2015064697 A1 JPWO2015064697 A1 JP WO2015064697A1 JP 2015545298 A JP2015545298 A JP 2015545298A JP 2015545298 A JP2015545298 A JP 2015545298A JP WO2015064697 A1 JPWO2015064697 A1 JP WO2015064697A1
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor substrate
- electrode
- electrode pad
- light emitting
- receiving element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F55/00—Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto
- H10F55/20—Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto wherein the electric light source controls the radiation-sensitive semiconductor devices, e.g. optocouplers
- H10F55/25—Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto wherein the electric light source controls the radiation-sensitive semiconductor devices, e.g. optocouplers wherein the radiation-sensitive devices and the electric light source are all semiconductor devices
- H10F55/255—Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto wherein the electric light source controls the radiation-sensitive semiconductor devices, e.g. optocouplers wherein the radiation-sensitive devices and the electric light source are all semiconductor devices formed in, or on, a common substrate
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/06—Apparatus for electrographic processes using a charge pattern for developing
- G03G15/08—Apparatus for electrographic processes using a charge pattern for developing using a solid developer, e.g. powder developer
- G03G15/0822—Arrangements for preparing, mixing, supplying or dispensing developer
- G03G15/0848—Arrangements for testing or measuring developer properties or quality, e.g. charge, size, flowability
- G03G15/0849—Detection or control means for the developer concentration
- G03G15/0851—Detection or control means for the developer concentration the concentration being measured by electrical means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/50—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control
- G03G15/5033—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control by measuring the photoconductor characteristics, e.g. temperature, or the characteristics of an image on the photoconductor
- G03G15/5041—Detecting a toner image, e.g. density, toner coverage, using a test patch
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/206—Electrodes for devices having potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/407—Optical elements or arrangements indirectly associated with the devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H29/00—Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
- H10H29/10—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
- Led Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013225132 | 2013-10-30 | ||
| JP2013225132 | 2013-10-30 | ||
| PCT/JP2014/078913 WO2015064697A1 (ja) | 2013-10-30 | 2014-10-30 | 受発光素子およびこれを用いたセンサ装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017251284A Division JP2018046314A (ja) | 2013-10-30 | 2017-12-27 | 受発光素子およびこれを用いたセンサ装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2015064697A1 true JPWO2015064697A1 (ja) | 2017-03-09 |
Family
ID=53004294
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015545298A Pending JPWO2015064697A1 (ja) | 2013-10-30 | 2014-10-30 | 受発光素子およびこれを用いたセンサ装置 |
| JP2017251284A Pending JP2018046314A (ja) | 2013-10-30 | 2017-12-27 | 受発光素子およびこれを用いたセンサ装置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017251284A Pending JP2018046314A (ja) | 2013-10-30 | 2017-12-27 | 受発光素子およびこれを用いたセンサ装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20160284921A1 (enExample) |
| EP (1) | EP3065185A4 (enExample) |
| JP (2) | JPWO2015064697A1 (enExample) |
| CN (1) | CN105745765A (enExample) |
| WO (1) | WO2015064697A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3440998B1 (en) * | 2016-04-04 | 2022-11-16 | Kyocera Corporation | Measurement sensor package and measurement sensor |
| CN106653934A (zh) * | 2016-10-20 | 2017-05-10 | 天津大学 | 一种基于标准cmos工艺的混合光互连系统 |
| US11437539B2 (en) * | 2020-09-30 | 2022-09-06 | Lite-On Singapore Pte. Ltd. | Optical sensor package and manufacturing method for the same |
| US12272721B2 (en) | 2021-02-25 | 2025-04-08 | Asahi Kasei Microdevices Corporation | Optical element and optical concentration measuring apparatus |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05275731A (ja) * | 1992-03-25 | 1993-10-22 | Sharp Corp | フォトダイオード |
| JPH0745912A (ja) * | 1993-07-30 | 1995-02-14 | Sony Corp | 半導体レーザ装置 |
| WO2002029904A1 (en) * | 2000-09-29 | 2002-04-11 | Sanyo Electric Co., Ltd. | Receiving optics and photosemiconductor device having the same |
| JP2006060103A (ja) * | 2004-08-23 | 2006-03-02 | Sharp Corp | 半導体受光装置および紫外線センサー機器 |
| JP2010278239A (ja) * | 2009-05-28 | 2010-12-09 | Kyocera Corp | 受発光素子及びその製造方法、並びに受発光素子を備えた光センサ装置 |
| WO2013065668A1 (ja) * | 2011-10-31 | 2013-05-10 | 京セラ株式会社 | 受発光一体型素子を用いた受発光装置およびセンサ装置 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4945422U (enExample) * | 1972-07-25 | 1974-04-20 | ||
| JP3012151B2 (ja) | 1994-07-28 | 2000-02-21 | 沖電気工業株式会社 | 受発光素子及びその製造方法 |
| US6148016A (en) * | 1997-11-06 | 2000-11-14 | The Regents Of The University Of California | Integrated semiconductor lasers and photodetectors |
| JP2004128464A (ja) * | 2002-08-01 | 2004-04-22 | Hamamatsu Photonics Kk | 半導体位置検出素子 |
| DE10345555A1 (de) * | 2003-09-30 | 2005-05-04 | Osram Opto Semiconductors Gmbh | Strahlungsemittierendes und -empfangendes Halbleiterbauelement und Verfahren zu dessen Herstellung |
| JP5294745B2 (ja) * | 2008-07-30 | 2013-09-18 | 京セラ株式会社 | 受発光素子アレイ及びこれを備えたセンサ装置 |
| US8263899B2 (en) * | 2010-07-01 | 2012-09-11 | Sunpower Corporation | High throughput solar cell ablation system |
| US9130109B2 (en) * | 2011-01-20 | 2015-09-08 | Rohm Co., Ltd. | Optical apparatus |
| US8927999B2 (en) * | 2011-11-21 | 2015-01-06 | Avogy, Inc. | Edge termination by ion implantation in GaN |
| US9148036B2 (en) * | 2012-07-27 | 2015-09-29 | Nidec Corporation | Base member of a motor which includes specific surface structure |
| US9190433B2 (en) * | 2013-03-18 | 2015-11-17 | Lite-On Singapore Pte. Ltd. | Ambient light sensing with stacked photodiode structure with dual PN junction |
-
2014
- 2014-10-30 JP JP2015545298A patent/JPWO2015064697A1/ja active Pending
- 2014-10-30 EP EP14859111.8A patent/EP3065185A4/en not_active Withdrawn
- 2014-10-30 US US15/033,599 patent/US20160284921A1/en not_active Abandoned
- 2014-10-30 WO PCT/JP2014/078913 patent/WO2015064697A1/ja not_active Ceased
- 2014-10-30 CN CN201480058890.XA patent/CN105745765A/zh active Pending
-
2017
- 2017-12-27 JP JP2017251284A patent/JP2018046314A/ja active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05275731A (ja) * | 1992-03-25 | 1993-10-22 | Sharp Corp | フォトダイオード |
| JPH0745912A (ja) * | 1993-07-30 | 1995-02-14 | Sony Corp | 半導体レーザ装置 |
| WO2002029904A1 (en) * | 2000-09-29 | 2002-04-11 | Sanyo Electric Co., Ltd. | Receiving optics and photosemiconductor device having the same |
| JP2006060103A (ja) * | 2004-08-23 | 2006-03-02 | Sharp Corp | 半導体受光装置および紫外線センサー機器 |
| JP2010278239A (ja) * | 2009-05-28 | 2010-12-09 | Kyocera Corp | 受発光素子及びその製造方法、並びに受発光素子を備えた光センサ装置 |
| WO2013065668A1 (ja) * | 2011-10-31 | 2013-05-10 | 京セラ株式会社 | 受発光一体型素子を用いた受発光装置およびセンサ装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105745765A (zh) | 2016-07-06 |
| EP3065185A4 (en) | 2017-08-02 |
| US20160284921A1 (en) | 2016-09-29 |
| EP3065185A1 (en) | 2016-09-07 |
| JP2018046314A (ja) | 2018-03-22 |
| WO2015064697A1 (ja) | 2015-05-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104584238B (zh) | 受光发光元件以及使用该受光发光元件的传感器装置 | |
| JP6495988B2 (ja) | 受発光素子およびこれを用いたセンサ装置 | |
| JP6077528B2 (ja) | 受発光素子モジュールおよびこれを用いたセンサ装置 | |
| JP5692971B2 (ja) | 受発光素子及びその製造方法、並びに受発光素子を備えた光センサ装置 | |
| JP5294757B2 (ja) | 受発光一体型素子アレイを用いたセンサ装置 | |
| JP5882720B2 (ja) | 受発光素子モジュールおよびこれを用いたセンサ装置 | |
| JP2018046314A (ja) | 受発光素子およびこれを用いたセンサ装置 | |
| JP5744204B2 (ja) | 受発光素子およびそれを備えたセンサ装置 | |
| JP5926278B2 (ja) | 受発光一体型素子を用いた受発光装置およびセンサ装置 | |
| WO2013065731A1 (ja) | センサ装置 | |
| JP5970370B2 (ja) | 受発光素子およびこれを用いたセンサ装置 | |
| JP2022171687A (ja) | 光デバイス及び光学式濃度測定装置 | |
| JP2015008256A (ja) | 受発光素子およびこれを用いたセンサ装置 | |
| JP5822688B2 (ja) | 受発光素子 | |
| JP6117604B2 (ja) | 受発光素子およびこれを用いたセンサ装置 | |
| JP2017139478A (ja) | 受発光素子およびこれを用いたセンサ装置 | |
| JP2015191894A (ja) | 受発光素子およびこれを用いたセンサ装置 | |
| JP6121920B2 (ja) | 受発光素子の製造方法 | |
| JP2016181650A (ja) | 受発光素子モジュールおよびセンサ装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20161027 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20161222 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20170307 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20170425 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20171003 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20171227 |
|
| A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20180110 |
|
| A912 | Re-examination (zenchi) completed and case transferred to appeal board |
Free format text: JAPANESE INTERMEDIATE CODE: A912 Effective date: 20180330 |