JPWO2009060539A1 - インライン型ウェハ搬送装置および基板搬送方法 - Google Patents
インライン型ウェハ搬送装置および基板搬送方法 Download PDFInfo
- Publication number
- JPWO2009060539A1 JPWO2009060539A1 JP2009539923A JP2009539923A JPWO2009060539A1 JP WO2009060539 A1 JPWO2009060539 A1 JP WO2009060539A1 JP 2009539923 A JP2009539923 A JP 2009539923A JP 2009539923 A JP2009539923 A JP 2009539923A JP WO2009060539 A1 JPWO2009060539 A1 JP WO2009060539A1
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- Prior art keywords
- wafer
- chamber
- transfer
- process module
- module
- Prior art date
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- Granted
Links
- 238000012546 transfer Methods 0.000 title claims abstract description 114
- 238000000034 method Methods 0.000 title claims abstract description 109
- 239000000758 substrate Substances 0.000 title description 4
- 230000007246 mechanism Effects 0.000 claims abstract description 36
- 235000012431 wafers Nutrition 0.000 claims description 142
- 230000007723 transport mechanism Effects 0.000 claims description 5
- 238000012545 processing Methods 0.000 description 9
- 239000002245 particle Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 238000004891 communication Methods 0.000 description 2
- 238000000137 annealing Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67184—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
Abstract
Description
11 ロボットチャンバ
12 ロボット
13a−13g プロセスモジュール
14 ロードチャンバ
15 アンロードチャンバ
21 ウェハ
23 キャリア
24 ゲートバルブ
25 ローラ
26 リフト台
30 ウェハ搬送装置
31a、31b FOUP
32a、32b ロードチャンバ
33a、33b プロセスモジュール
34a、34b ロボットチャンバ
35a、35b ロボット
36a−36d バッファチャンバ
37a−37f プロセスモジュール
38a−38c ロボットチャンバ
39 ゲートバルブ
40 ウェハ搬送装置
41b、41c、41f、41g プロセスモジュール
42a、42b 搬送チャンバ
43a、43b 搬送ロボット
44 アライナー
45a 入口モジュール
45b 出口モジュール
46 ウェハ
47 主制御器
48 標準通信バス
50 ウェハ搬送装置
51 ロードロックチャンバ
52a、52b プロセスモジュール
53a、53b 搬送チャンバ
54a、54b 搬送機構
55 ウェハ
56 ロード室
57 アンロード室
58a−58d ゲートバルブ
Claims (2)
- ウェハを搬入及び搬出するためのロードロックチャンバと、
第1の搬送機構を有する第1の搬送モジュールと、
第1のプロセスモジュールと、
第2の搬送機構を有する第2の搬送モジュールと、
第2のプロセスモジュールとを順次直列的に接続したインライン型ウェハ搬送装置であって、
前記第1の搬送機構により、前記ロードロックチャンバと前記第1のプロセスモジュールとの間でウェハの搬送を行い、前記第2の搬送機構により、前記第1のプロセスモジュールと前記第2のプロセスモジュールとの間でウェハの搬送を行うことを特徴とするインライン型ウェハ搬送装置。 - 前記ロードロックチャンバが、外部から未処理ウェハを搬入するためのロード室と、処理済みウェハを外部へ搬出するためのアンロード室とを具備することを特徴する請求項1記載のインライン型ウェハ搬送装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/071815 WO2009060539A1 (ja) | 2007-11-09 | 2007-11-09 | インライン型ウェハ搬送装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP4494523B2 JP4494523B2 (ja) | 2010-06-30 |
JPWO2009060539A1 true JPWO2009060539A1 (ja) | 2011-03-17 |
Family
ID=40625454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009539923A Active JP4494523B2 (ja) | 2007-11-09 | 2007-11-09 | インライン型ウェハ搬送装置および基板搬送方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20100189532A1 (ja) |
JP (1) | JP4494523B2 (ja) |
CN (1) | CN101842890A (ja) |
WO (1) | WO2009060539A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101882565B (zh) * | 2010-06-03 | 2012-04-11 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 一种在线处理设备 |
JP5785712B2 (ja) * | 2010-12-28 | 2015-09-30 | 株式会社日立ハイテクノロジーズ | 真空処理装置 |
US9129690B2 (en) * | 2012-07-20 | 2015-09-08 | Samsung Electronics Co., Ltd. | Method and system for providing magnetic junctions having improved characteristics |
JP2014036025A (ja) * | 2012-08-07 | 2014-02-24 | Hitachi High-Technologies Corp | 真空処理装置または真空処理装置の運転方法 |
CN104704624B (zh) * | 2012-10-09 | 2017-06-09 | 应用材料公司 | 具索引的串联基板处理工具 |
JP2015088694A (ja) * | 2013-11-01 | 2015-05-07 | 株式会社日立ハイテクノロジーズ | 真空処理装置 |
KR101736855B1 (ko) | 2015-05-29 | 2017-05-18 | 세메스 주식회사 | 기판 처리 설비 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0362944A (ja) * | 1989-07-31 | 1991-03-19 | Tokyo Electron Ltd | 基板処理装置 |
JPH0799224A (ja) * | 1993-09-28 | 1995-04-11 | Hitachi Ltd | 多チャンバ型半導体製造装置 |
JPH07106215A (ja) * | 1993-10-08 | 1995-04-21 | Kokusai Electric Co Ltd | 半導体製造装置における障害処理方法 |
JPH1022358A (ja) * | 1996-06-28 | 1998-01-23 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JPH10189687A (ja) * | 1996-10-21 | 1998-07-21 | Applied Materials Inc | マルチチャンバ半導体ウェハ処理システム内の優先順位に基づくウェハ処理スケジューリング方法及びその装置 |
JPH11350132A (ja) * | 1998-06-03 | 1999-12-21 | Hitachi Ltd | 成膜装置 |
JP2007005435A (ja) * | 2005-06-22 | 2007-01-11 | Rorze Corp | 処理装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW442891B (en) * | 1998-11-17 | 2001-06-23 | Tokyo Electron Ltd | Vacuum processing system |
KR100398877B1 (ko) * | 2001-05-09 | 2003-09-19 | 삼성전자주식회사 | 현상기 소음 및 진동방지구조를 갖는 화상형성장치 |
US6918731B2 (en) * | 2001-07-02 | 2005-07-19 | Brooks Automation, Incorporated | Fast swap dual substrate transport for load lock |
US7226512B2 (en) * | 2003-06-18 | 2007-06-05 | Ekc Technology, Inc. | Load lock system for supercritical fluid cleaning |
EP1684951B1 (en) * | 2003-11-10 | 2014-05-07 | Brooks Automation, Inc. | System for handling workpieces in a vacuum-based semiconductor handling system |
US20060102078A1 (en) * | 2004-11-18 | 2006-05-18 | Intevac Inc. | Wafer fab |
US20070166134A1 (en) * | 2005-12-20 | 2007-07-19 | Motoko Suzuki | Substrate transfer method, substrate transfer apparatus and exposure apparatus |
JP4503098B2 (ja) * | 2007-08-29 | 2010-07-14 | キヤノンアネルバ株式会社 | スパッタリングによる成膜方法とその装置 |
EP2204469A4 (en) * | 2007-10-31 | 2012-03-28 | Canon Anelva Corp | MAGNETRON, CATHODE MAGNETRON SPRAY APPARATUS AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE |
JPWO2009066390A1 (ja) * | 2007-11-22 | 2011-03-31 | キヤノンアネルバ株式会社 | スパッタ装置およびスパッタ方法 |
-
2007
- 2007-11-09 WO PCT/JP2007/071815 patent/WO2009060539A1/ja active Application Filing
- 2007-11-09 JP JP2009539923A patent/JP4494523B2/ja active Active
- 2007-11-09 CN CN200780101305A patent/CN101842890A/zh active Pending
-
2010
- 2010-03-09 US US12/720,372 patent/US20100189532A1/en not_active Abandoned
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0362944A (ja) * | 1989-07-31 | 1991-03-19 | Tokyo Electron Ltd | 基板処理装置 |
JPH0799224A (ja) * | 1993-09-28 | 1995-04-11 | Hitachi Ltd | 多チャンバ型半導体製造装置 |
JPH07106215A (ja) * | 1993-10-08 | 1995-04-21 | Kokusai Electric Co Ltd | 半導体製造装置における障害処理方法 |
JPH1022358A (ja) * | 1996-06-28 | 1998-01-23 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JPH10189687A (ja) * | 1996-10-21 | 1998-07-21 | Applied Materials Inc | マルチチャンバ半導体ウェハ処理システム内の優先順位に基づくウェハ処理スケジューリング方法及びその装置 |
JPH11350132A (ja) * | 1998-06-03 | 1999-12-21 | Hitachi Ltd | 成膜装置 |
JP2007005435A (ja) * | 2005-06-22 | 2007-01-11 | Rorze Corp | 処理装置 |
Also Published As
Publication number | Publication date |
---|---|
JP4494523B2 (ja) | 2010-06-30 |
WO2009060539A1 (ja) | 2009-05-14 |
US20100189532A1 (en) | 2010-07-29 |
CN101842890A (zh) | 2010-09-22 |
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