JPS649771B2 - - Google Patents
Info
- Publication number
- JPS649771B2 JPS649771B2 JP11605384A JP11605384A JPS649771B2 JP S649771 B2 JPS649771 B2 JP S649771B2 JP 11605384 A JP11605384 A JP 11605384A JP 11605384 A JP11605384 A JP 11605384A JP S649771 B2 JPS649771 B2 JP S649771B2
- Authority
- JP
- Japan
- Prior art keywords
- digital
- analog
- dac
- pattern
- comparing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010998 test method Methods 0.000 claims description 12
- 238000012360 testing method Methods 0.000 claims description 10
- 230000007257 malfunction Effects 0.000 claims 1
- 230000002950 deficient Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 5
- 238000004886 process control Methods 0.000 description 4
- 101100067427 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FUS3 gene Proteins 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 101100015484 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) GPA1 gene Proteins 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003208 petroleum Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Landscapes
- Analogue/Digital Conversion (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11605384A JPS6116624A (ja) | 1984-06-06 | 1984-06-06 | アナログ出力装置の試験方式 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11605384A JPS6116624A (ja) | 1984-06-06 | 1984-06-06 | アナログ出力装置の試験方式 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6116624A JPS6116624A (ja) | 1986-01-24 |
| JPS649771B2 true JPS649771B2 (zh) | 1989-02-20 |
Family
ID=14677533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11605384A Granted JPS6116624A (ja) | 1984-06-06 | 1984-06-06 | アナログ出力装置の試験方式 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6116624A (zh) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101405610A (zh) | 2006-03-23 | 2009-04-08 | 松下电器产业株式会社 | 半导体装置、半导体测试装置和半导体装置的测试方法 |
| JP2010171627A (ja) * | 2009-01-21 | 2010-08-05 | Sony Corp | 半導体集積回路、液晶駆動回路及び液晶表示装置 |
| JP2010256175A (ja) * | 2009-04-24 | 2010-11-11 | Sharp Corp | 半導体集積回路装置の、検査装置および検査方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5173372A (en) * | 1974-12-21 | 1976-06-25 | Fujitsu Ltd | Anarogu deijitaruhenkanki |
| JPS5940721A (ja) * | 1982-08-30 | 1984-03-06 | Sony Tektronix Corp | デジタル・アナログ変換器用診断装置 |
-
1984
- 1984-06-06 JP JP11605384A patent/JPS6116624A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6116624A (ja) | 1986-01-24 |
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