JPS6484643A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6484643A
JPS6484643A JP24060687A JP24060687A JPS6484643A JP S6484643 A JPS6484643 A JP S6484643A JP 24060687 A JP24060687 A JP 24060687A JP 24060687 A JP24060687 A JP 24060687A JP S6484643 A JPS6484643 A JP S6484643A
Authority
JP
Japan
Prior art keywords
conductive layer
semiconductor substrate
semiconductor device
mask
insulating film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24060687A
Other languages
Japanese (ja)
Other versions
JP2551028B2 (en
Inventor
Shinichi Ito
Hideaki Kuroda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP62240606A priority Critical patent/JP2551028B2/en
Publication of JPS6484643A publication Critical patent/JPS6484643A/en
Application granted granted Critical
Publication of JP2551028B2 publication Critical patent/JP2551028B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To establish an excellent contact even when a semiconductor device design rule is quite fine by a method wherein the surface of a first conductive layer to serve as a mask is converted into silicon oxide allowing the first conductive layer to be improved in its affinity with liquid etchant. CONSTITUTION:A first conductive layer 4 is formed on an insulating film 3 formed on a semiconductor substrate 1. The conductive layer 4 and the insulating film 3 are subjected to selective etching for the exposure of the semiconductor substrate 1. The surface of the conductive layer 4 is then oxidized. A wet etching process follows wherein the exposed section of the semiconductor substrate 1 is affected with the conductive layer 4 serving as a mask. A second conductive layer 8 is provided to cover the exposed section of the semiconductor substrate 1 and the conductive layer 4. The conductive layer 4 and the conductive layer 8 are subjected to selective etching. This design ensures a stable contact in the presence of a very fine semiconductor device design rule.
JP62240606A 1987-09-28 1987-09-28 Method for manufacturing semiconductor device Expired - Fee Related JP2551028B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62240606A JP2551028B2 (en) 1987-09-28 1987-09-28 Method for manufacturing semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62240606A JP2551028B2 (en) 1987-09-28 1987-09-28 Method for manufacturing semiconductor device

Publications (2)

Publication Number Publication Date
JPS6484643A true JPS6484643A (en) 1989-03-29
JP2551028B2 JP2551028B2 (en) 1996-11-06

Family

ID=17061991

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62240606A Expired - Fee Related JP2551028B2 (en) 1987-09-28 1987-09-28 Method for manufacturing semiconductor device

Country Status (1)

Country Link
JP (1) JP2551028B2 (en)

Also Published As

Publication number Publication date
JP2551028B2 (en) 1996-11-06

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees