JPS6459854A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6459854A
JPS6459854A JP21501387A JP21501387A JPS6459854A JP S6459854 A JPS6459854 A JP S6459854A JP 21501387 A JP21501387 A JP 21501387A JP 21501387 A JP21501387 A JP 21501387A JP S6459854 A JPS6459854 A JP S6459854A
Authority
JP
Japan
Prior art keywords
silicon
film
substrate
opening
silicon dioxide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21501387A
Other languages
Japanese (ja)
Inventor
Hiroshi Kitajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP21501387A priority Critical patent/JPS6459854A/en
Publication of JPS6459854A publication Critical patent/JPS6459854A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To reduce the resistance of an electrode part, by employing a single crystal as the deriving electrode of a base. CONSTITUTION:After an N<+>type region 12 is formed in a part of the surface of a P-type silicon substrate 11, a silicon dioxide film 13 is formed thereon. Trenches 14 and 15 are then formed throughout the thickness of the silicon dioxide film 13 to expose a part of the silicon surface of the substrate 11. Next, the trenches 14 and 15 are respectively filled with selectively epitaxial silicon films 16 and 17 which are grown from the silicon of the substrate 11 as a seed crystal. Subsequently, the silicon film 17 is covered on the surface thereof with a silicon dioxide film 18, and boron ions 19 are thereafter implanted into the surface of the silicon film 16. Moreover, after a silicon film 20 is formed over the whole surface of the substrate body, an opening is formed on the part 16 of which the silicon is epitaxially grown. Subsequently, a silicon film 21 is selectively grown in the opening while N-type impurity of arsenic or the like is doped into the silicon film 21. Further, after a silicon dioxide 22 is formed over the whole surface of the substrate body, an opening is formed on the each of a base 23, an emitter 24 and a collector 25, and an aluminum metallization is thereafter performed.
JP21501387A 1987-08-31 1987-08-31 Semiconductor device Pending JPS6459854A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21501387A JPS6459854A (en) 1987-08-31 1987-08-31 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21501387A JPS6459854A (en) 1987-08-31 1987-08-31 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6459854A true JPS6459854A (en) 1989-03-07

Family

ID=16665274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21501387A Pending JPS6459854A (en) 1987-08-31 1987-08-31 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6459854A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH021933A (en) * 1988-06-13 1990-01-08 Hitachi Ltd Manufacture of semiconductor device
JPH0547775A (en) * 1991-08-08 1993-02-26 Fujitsu Ltd Manufacture of semiconductor device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5982764A (en) * 1982-11-04 1984-05-12 Hitachi Ltd Semiconductor device
JPS61220463A (en) * 1985-03-27 1986-09-30 Hitachi Ltd Bipolar transistor and manufacture thereof
JPS61296767A (en) * 1985-06-26 1986-12-27 Fujitsu Ltd Manufacture of semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5982764A (en) * 1982-11-04 1984-05-12 Hitachi Ltd Semiconductor device
JPS61220463A (en) * 1985-03-27 1986-09-30 Hitachi Ltd Bipolar transistor and manufacture thereof
JPS61296767A (en) * 1985-06-26 1986-12-27 Fujitsu Ltd Manufacture of semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH021933A (en) * 1988-06-13 1990-01-08 Hitachi Ltd Manufacture of semiconductor device
JPH0547775A (en) * 1991-08-08 1993-02-26 Fujitsu Ltd Manufacture of semiconductor device

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