JPS6450465A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6450465A
JPS6450465A JP62206802A JP20680287A JPS6450465A JP S6450465 A JPS6450465 A JP S6450465A JP 62206802 A JP62206802 A JP 62206802A JP 20680287 A JP20680287 A JP 20680287A JP S6450465 A JPS6450465 A JP S6450465A
Authority
JP
Japan
Prior art keywords
layer
semiconductor layer
semiconductor
substrate
performance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62206802A
Other languages
Japanese (ja)
Inventor
Hidemasa Mizutani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP62206802A priority Critical patent/JPS6450465A/en
Publication of JPS6450465A publication Critical patent/JPS6450465A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To reduce the cost and to enhance the performance of a semiconductor device, by a method wherein a semiconductor layer formed on a substrate is subjected to impurity diffusion in source and drain regions using the same semiconductor material as that of a gate and leaving the material as an electrode as it is. CONSTITUTION:The surface of a semiconductor layer 2 formed on a substrate 1 is covered with an insulating film 4, removed parts of the film 4 become source, drain regions 5, 6 of a depletion type FET, and a second semiconductor layer 7 containing the same type of impurity as that of the layer 2 in high concentration is deposited on the top. Then, the layer 7 is removed except at least the gate region 4 and the regions 5, 6, and electrodes 13, 14 are formed. Thus, its cost can be reduced, and its performance can be enhanced.
JP62206802A 1987-08-20 1987-08-20 Semiconductor device Pending JPS6450465A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62206802A JPS6450465A (en) 1987-08-20 1987-08-20 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62206802A JPS6450465A (en) 1987-08-20 1987-08-20 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6450465A true JPS6450465A (en) 1989-02-27

Family

ID=16529336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62206802A Pending JPS6450465A (en) 1987-08-20 1987-08-20 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6450465A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012199563A (en) * 1999-12-28 2012-10-18 Dpix Llc Amorphous silicon layer sensor and method of forming sensor
JP2015530733A (en) * 2012-07-26 2015-10-15 北京京東方光電科技有限公司 Sensor manufacturing method
WO2015163288A1 (en) * 2014-04-21 2015-10-29 シャープ株式会社 Light detection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012199563A (en) * 1999-12-28 2012-10-18 Dpix Llc Amorphous silicon layer sensor and method of forming sensor
JP2015530733A (en) * 2012-07-26 2015-10-15 北京京東方光電科技有限公司 Sensor manufacturing method
WO2015163288A1 (en) * 2014-04-21 2015-10-29 シャープ株式会社 Light detection device

Similar Documents

Publication Publication Date Title
JPS6484669A (en) Thin film transistor
JPS53980A (en) Field-effect transistor of high dielectric strength
JPS6450465A (en) Semiconductor device
JPS57155777A (en) Mos transistor
JPS6457675A (en) Vertical field-effect transistor
JPS56165359A (en) Semiconductor device
JPS6457680A (en) Compound semiconductor integrated circuit device
JPS5691470A (en) Semiconductor
JPS54136275A (en) Field effect transistor of isolation gate
JPS5769778A (en) Semiconductor device
JPS56126977A (en) Junction type field effect transistor
JPS56126973A (en) Mos field effect transistor
JPS6433970A (en) Field effect semiconductor device
JPS5736863A (en) Manufacture of semiconductor device
JPS57100768A (en) Manufacture of field effect semiconductor device
JPS57164573A (en) Semiconductor device
JPS56126971A (en) Thin film field effect element
JPS6417475A (en) Manufacture of mos semiconductor device
JPS55105376A (en) Manufacture process of semiconductor device
JPS56126978A (en) Manufacture of junction type field effect transistor
JPS5654069A (en) High withstand voltage mos field-effect semiconductor device
JPS57211278A (en) Semiconductor device
JPS52136583A (en) Mos type semiconductor device
JPS56146281A (en) Manufacture of semiconductor integrated circuit
JPS54148384A (en) Power-use high dielectric strength field effect transistor