JPS6341050B2 - - Google Patents

Info

Publication number
JPS6341050B2
JPS6341050B2 JP62024501A JP2450187A JPS6341050B2 JP S6341050 B2 JPS6341050 B2 JP S6341050B2 JP 62024501 A JP62024501 A JP 62024501A JP 2450187 A JP2450187 A JP 2450187A JP S6341050 B2 JPS6341050 B2 JP S6341050B2
Authority
JP
Japan
Prior art keywords
reticle
patterns
pattern
reduction
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP62024501A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62247372A (ja
Inventor
Soichi Tsuzawa
Takao Kawanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62024501A priority Critical patent/JPS62247372A/ja
Publication of JPS62247372A publication Critical patent/JPS62247372A/ja
Publication of JPS6341050B2 publication Critical patent/JPS6341050B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP62024501A 1987-02-06 1987-02-06 縮小投影露光方法 Granted JPS62247372A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62024501A JPS62247372A (ja) 1987-02-06 1987-02-06 縮小投影露光方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62024501A JPS62247372A (ja) 1987-02-06 1987-02-06 縮小投影露光方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP4902979A Division JPS55140839A (en) 1979-04-23 1979-04-23 Mask and its preparation

Publications (2)

Publication Number Publication Date
JPS62247372A JPS62247372A (ja) 1987-10-28
JPS6341050B2 true JPS6341050B2 (enExample) 1988-08-15

Family

ID=12139935

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62024501A Granted JPS62247372A (ja) 1987-02-06 1987-02-06 縮小投影露光方法

Country Status (1)

Country Link
JP (1) JPS62247372A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007024122B4 (de) * 2007-05-24 2012-06-14 Süss Microtec Lithography Gmbh Belichtungskonfigurator in Maskalignern

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS502867A (enExample) * 1973-05-09 1975-01-13
JPS53144270A (en) * 1977-05-23 1978-12-15 Hitachi Ltd Projection-type mask aligner

Also Published As

Publication number Publication date
JPS62247372A (ja) 1987-10-28

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