JPS6324617A - ウエハの両面露光法 - Google Patents
ウエハの両面露光法Info
- Publication number
- JPS6324617A JPS6324617A JP61168925A JP16892586A JPS6324617A JP S6324617 A JPS6324617 A JP S6324617A JP 61168925 A JP61168925 A JP 61168925A JP 16892586 A JP16892586 A JP 16892586A JP S6324617 A JPS6324617 A JP S6324617A
- Authority
- JP
- Japan
- Prior art keywords
- double sided
- double
- silicon wafer
- wafer
- exposure method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7073—Alignment marks and their environment
- G03F9/708—Mark formation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7073—Alignment marks and their environment
- G03F9/7084—Position of mark on substrate, i.e. position in (x, y, z) of mark, e.g. buried or resist covered mark, mark on rearside, at the substrate edge, in the circuit area, latent image mark, marks in plural levels
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61168925A JPS6324617A (ja) | 1986-07-17 | 1986-07-17 | ウエハの両面露光法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61168925A JPS6324617A (ja) | 1986-07-17 | 1986-07-17 | ウエハの両面露光法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6324617A true JPS6324617A (ja) | 1988-02-02 |
| JPH0262939B2 JPH0262939B2 (enrdf_load_stackoverflow) | 1990-12-27 |
Family
ID=15877089
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61168925A Granted JPS6324617A (ja) | 1986-07-17 | 1986-07-17 | ウエハの両面露光法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6324617A (enrdf_load_stackoverflow) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6049040A (ja) * | 1983-08-29 | 1985-03-18 | Japan Styrene Paper Co Ltd | ポリプロピレン系樹脂発泡粒子 |
| JP2012080004A (ja) * | 2010-10-05 | 2012-04-19 | Nikon Corp | 露光装置、デバイス製造方法及び基板 |
| US9627191B2 (en) | 2009-09-17 | 2017-04-18 | Wagic, Inc. | Extendable multi-tool including interchangable light bulb changer and accessories |
| US9679760B2 (en) | 2002-08-12 | 2017-06-13 | Wagic, Inc. | Customizable light bulb changer |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52152172A (en) * | 1976-06-14 | 1977-12-17 | Nippon Telegr & Teleph Corp <Ntt> | Working method of mask alignment mark holes |
| JPS53127266A (en) * | 1977-04-13 | 1978-11-07 | Fujitsu Ltd | Forming method of marker |
| JPS5459083A (en) * | 1977-10-19 | 1979-05-12 | Sumitomo Electric Ind Ltd | Double-sided pattern forming method for semiconductor wafer |
-
1986
- 1986-07-17 JP JP61168925A patent/JPS6324617A/ja active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52152172A (en) * | 1976-06-14 | 1977-12-17 | Nippon Telegr & Teleph Corp <Ntt> | Working method of mask alignment mark holes |
| JPS53127266A (en) * | 1977-04-13 | 1978-11-07 | Fujitsu Ltd | Forming method of marker |
| JPS5459083A (en) * | 1977-10-19 | 1979-05-12 | Sumitomo Electric Ind Ltd | Double-sided pattern forming method for semiconductor wafer |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6049040A (ja) * | 1983-08-29 | 1985-03-18 | Japan Styrene Paper Co Ltd | ポリプロピレン系樹脂発泡粒子 |
| US9679760B2 (en) | 2002-08-12 | 2017-06-13 | Wagic, Inc. | Customizable light bulb changer |
| US9627191B2 (en) | 2009-09-17 | 2017-04-18 | Wagic, Inc. | Extendable multi-tool including interchangable light bulb changer and accessories |
| US10371360B2 (en) | 2009-09-17 | 2019-08-06 | Wagic, Inc. | Extendable multi-tool including interchangable light bulb changer and accessories |
| JP2012080004A (ja) * | 2010-10-05 | 2012-04-19 | Nikon Corp | 露光装置、デバイス製造方法及び基板 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0262939B2 (enrdf_load_stackoverflow) | 1990-12-27 |
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