JPS6255240B2 - - Google Patents

Info

Publication number
JPS6255240B2
JPS6255240B2 JP58179363A JP17936383A JPS6255240B2 JP S6255240 B2 JPS6255240 B2 JP S6255240B2 JP 58179363 A JP58179363 A JP 58179363A JP 17936383 A JP17936383 A JP 17936383A JP S6255240 B2 JPS6255240 B2 JP S6255240B2
Authority
JP
Japan
Prior art keywords
memory cell
test
state
cell group
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58179363A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6072045A (ja
Inventor
Tetsuji Sato
Nobuo Tsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP58179363A priority Critical patent/JPS6072045A/ja
Publication of JPS6072045A publication Critical patent/JPS6072045A/ja
Publication of JPS6255240B2 publication Critical patent/JPS6255240B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/848—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by adjacent switching

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Hardware Redundancy (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
JP58179363A 1983-09-29 1983-09-29 半導体メモリ装置 Granted JPS6072045A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58179363A JPS6072045A (ja) 1983-09-29 1983-09-29 半導体メモリ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58179363A JPS6072045A (ja) 1983-09-29 1983-09-29 半導体メモリ装置

Publications (2)

Publication Number Publication Date
JPS6072045A JPS6072045A (ja) 1985-04-24
JPS6255240B2 true JPS6255240B2 (enExample) 1987-11-18

Family

ID=16064538

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58179363A Granted JPS6072045A (ja) 1983-09-29 1983-09-29 半導体メモリ装置

Country Status (1)

Country Link
JP (1) JPS6072045A (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4872168A (en) * 1986-10-02 1989-10-03 American Telephone And Telegraph Company, At&T Bell Laboratories Integrated circuit with memory self-test
JPS63164100A (ja) * 1986-12-26 1988-07-07 Hiroshi Nakamura 半導体集積回路メモリ
EP0462743A1 (en) * 1990-06-20 1991-12-27 AT&T Corp. Method and apparatus for accomplishing output-specific data compaction
JPH07254286A (ja) * 1994-03-16 1995-10-03 Nippon Motorola Ltd 低消費電力半導体メモリ装置

Also Published As

Publication number Publication date
JPS6072045A (ja) 1985-04-24

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