JPS6229737B2 - - Google Patents
Info
- Publication number
- JPS6229737B2 JPS6229737B2 JP54050306A JP5030679A JPS6229737B2 JP S6229737 B2 JPS6229737 B2 JP S6229737B2 JP 54050306 A JP54050306 A JP 54050306A JP 5030679 A JP5030679 A JP 5030679A JP S6229737 B2 JPS6229737 B2 JP S6229737B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- pattern
- printed wiring
- wiring board
- level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 claims description 16
- 230000003287 optical effect Effects 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 9
- 238000007689 inspection Methods 0.000 claims description 8
- 230000001678 irradiating effect Effects 0.000 claims description 4
- 230000007547 defect Effects 0.000 description 15
- 238000012795 verification Methods 0.000 description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 238000005530 etching Methods 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 230000008719 thickening Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000007261 regionalization Effects 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Computer Hardware Design (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Image Analysis (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5030679A JPS55142254A (en) | 1979-04-25 | 1979-04-25 | Inspecting method for pattern of printed wiring board |
US06/074,473 US4277175A (en) | 1979-04-25 | 1979-09-11 | Method and apparatus for inspecting printed wiring boards |
GB7932215A GB2047879B (en) | 1979-04-25 | 1979-09-17 | Photoelectric pcb inspection |
DE19792937929 DE2937929A1 (de) | 1979-04-25 | 1979-09-19 | Verfahren und vorrichtung zum pruefen von leiterplatten fuer gedruckte schaltungen |
FR7923447A FR2455423A1 (fr) | 1979-04-25 | 1979-09-20 | Appareil pour verifier les plaques de circuit imprime |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5030679A JPS55142254A (en) | 1979-04-25 | 1979-04-25 | Inspecting method for pattern of printed wiring board |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55142254A JPS55142254A (en) | 1980-11-06 |
JPS6229737B2 true JPS6229737B2 (US06272168-20010807-M00014.png) | 1987-06-27 |
Family
ID=12855204
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5030679A Granted JPS55142254A (en) | 1979-04-25 | 1979-04-25 | Inspecting method for pattern of printed wiring board |
Country Status (5)
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6017044B2 (ja) * | 1979-07-23 | 1985-04-30 | 株式会社日立製作所 | 印刷配線板のパタ−ン検査装置 |
US4343553A (en) * | 1979-09-03 | 1982-08-10 | Hitachi, Ltd. | Shape testing apparatus |
US4405233A (en) * | 1980-06-05 | 1983-09-20 | Bell Telephone Laboratories, Incorporated | Photo-electric apparatus for testing electrical connector contacts |
JPS5788796A (en) * | 1980-11-21 | 1982-06-02 | Hitachi Ltd | Method of inspecting pattern of printed circuit board |
DE3070721D1 (en) * | 1980-12-18 | 1985-07-04 | Ibm | Process for inspecting and automatically classifying objects presenting configurations with dimensional tolerances and variable rejecting criteria depending on placement, apparatus and circuits therefor |
EP0070017B1 (en) * | 1981-07-14 | 1986-10-29 | Hitachi, Ltd. | Pattern detection system |
JPS5867093A (ja) * | 1981-10-19 | 1983-04-21 | 株式会社東芝 | 印刷回路基板検査方法及びその装置 |
JPS59150328A (ja) * | 1983-01-28 | 1984-08-28 | Fujitsu Ltd | スル−ホ−ル検査装置 |
US4538909A (en) * | 1983-05-24 | 1985-09-03 | Automation Engineering, Inc. | Circuit board inspection apparatus and method |
DE3422395A1 (de) * | 1983-06-16 | 1985-01-17 | Hitachi, Ltd., Tokio/Tokyo | Verfahren und vorrichtung zum ermitteln von verdrahtungsmustern |
US4666303A (en) * | 1983-07-11 | 1987-05-19 | Diffracto Ltd. | Electro-optical gap and flushness sensors |
JPH0617777B2 (ja) * | 1984-06-02 | 1994-03-09 | 大日本スクリーン製造株式会社 | プリント配線板の撮像方法 |
EP0195161B1 (en) * | 1985-03-14 | 1993-09-15 | Nikon Corporation | Apparatus for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like and method |
US4697142A (en) * | 1985-04-01 | 1987-09-29 | Ibm Corporation | Printed circuit conductor test system |
KR900007548B1 (ko) * | 1985-10-04 | 1990-10-15 | 다이닛뽕스쿠링세이소오 가부시키가이샤 | 패턴 마스킹 방법 및 그 장치 |
US4949390A (en) * | 1987-04-16 | 1990-08-14 | Applied Vision Systems, Inc. | Interconnect verification using serial neighborhood processors |
DE4014149A1 (de) * | 1990-05-02 | 1991-11-07 | Grundig Emv | Verfahren und vorrichtung zum pruefen von leiterplatten |
JP2500961B2 (ja) * | 1990-11-27 | 1996-05-29 | 大日本スクリーン製造株式会社 | プリント基板の座残り検査方法 |
US6133534A (en) * | 1991-11-29 | 2000-10-17 | Hitachi Chemical Company, Ltd. | Wiring board for electrical tests with bumps having polymeric coating |
US6568073B1 (en) * | 1991-11-29 | 2003-05-27 | Hitachi Chemical Company, Ltd. | Process for the fabrication of wiring board for electrical tests |
JP2795044B2 (ja) * | 1992-03-26 | 1998-09-10 | 住友電装株式会社 | 圧着端子画像処理検査における照明方法及び画像処理方法 |
JP2870379B2 (ja) * | 1993-10-18 | 1999-03-17 | 住友電装株式会社 | 連結素子検査方法およびその装置 |
JP3350477B2 (ja) * | 1999-04-02 | 2002-11-25 | セイコーインスツルメンツ株式会社 | ウエハ検査装置 |
AU2003267837A1 (en) * | 2002-10-01 | 2004-04-23 | Mirtec Co., Ltd. | Vision inspection apparatus using a full reflection mirror |
DE10337350B3 (de) * | 2003-08-14 | 2005-11-24 | Aleksej Limonow | Verfahren und Einrichtung zur Entdeckung und Lokalisierung eines Defektes in einer logischen elektronischen Leiterplatte |
JP6455029B2 (ja) * | 2014-09-01 | 2019-01-23 | 大日本印刷株式会社 | 検査方法及び検査装置 |
USD967325S1 (en) * | 2019-05-27 | 2022-10-18 | Aimpoint Ab | Backup sight |
US11162889B2 (en) | 2019-09-16 | 2021-11-02 | International Business Machines Corporation | Non-destructive testing for plating defects |
US11112351B2 (en) | 2019-09-16 | 2021-09-07 | International Business Machines Corporation | Partial submersion testing for plating defects |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5223365A (en) * | 1975-08-13 | 1977-02-22 | Cit Alcatel | Method of and apparatus for automatically inspecting pattern of print circuit board |
JPS5416668A (en) * | 1977-07-08 | 1979-02-07 | Hitachi Ltd | Method of detecting excessivee or lackingg holes in print wire board |
-
1979
- 1979-04-25 JP JP5030679A patent/JPS55142254A/ja active Granted
- 1979-09-11 US US06/074,473 patent/US4277175A/en not_active Expired - Lifetime
- 1979-09-17 GB GB7932215A patent/GB2047879B/en not_active Expired
- 1979-09-19 DE DE19792937929 patent/DE2937929A1/de active Granted
- 1979-09-20 FR FR7923447A patent/FR2455423A1/fr active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5223365A (en) * | 1975-08-13 | 1977-02-22 | Cit Alcatel | Method of and apparatus for automatically inspecting pattern of print circuit board |
JPS5416668A (en) * | 1977-07-08 | 1979-02-07 | Hitachi Ltd | Method of detecting excessivee or lackingg holes in print wire board |
Also Published As
Publication number | Publication date |
---|---|
FR2455423A1 (fr) | 1980-11-21 |
GB2047879A (en) | 1980-12-03 |
FR2455423B1 (US06272168-20010807-M00014.png) | 1984-06-15 |
DE2937929C2 (US06272168-20010807-M00014.png) | 1987-03-12 |
US4277175A (en) | 1981-07-07 |
JPS55142254A (en) | 1980-11-06 |
DE2937929A1 (de) | 1980-11-06 |
GB2047879B (en) | 1983-08-03 |