JPS6222433B2 - - Google Patents

Info

Publication number
JPS6222433B2
JPS6222433B2 JP55121399A JP12139980A JPS6222433B2 JP S6222433 B2 JPS6222433 B2 JP S6222433B2 JP 55121399 A JP55121399 A JP 55121399A JP 12139980 A JP12139980 A JP 12139980A JP S6222433 B2 JPS6222433 B2 JP S6222433B2
Authority
JP
Japan
Prior art keywords
signal
test
level
circuit
input pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55121399A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5745945A (en
Inventor
Soichi Kawasaki
Soichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP55121399A priority Critical patent/JPS5745945A/ja
Publication of JPS5745945A publication Critical patent/JPS5745945A/ja
Publication of JPS6222433B2 publication Critical patent/JPS6222433B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP55121399A 1980-09-02 1980-09-02 Semiconductor integrated circuit device Granted JPS5745945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121399A JPS5745945A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121399A JPS5745945A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5745945A JPS5745945A (en) 1982-03-16
JPS6222433B2 true JPS6222433B2 (US06521211-20030218-C00004.png) 1987-05-18

Family

ID=14810217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121399A Granted JPS5745945A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5745945A (US06521211-20030218-C00004.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06331191A (ja) * 1993-05-26 1994-11-29 Yasuyoshi Ochiai 換気扇

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145140A (ja) * 1982-02-23 1983-08-29 Nec Corp 半導体特性測定装置
JPS60108764A (ja) * 1983-11-17 1985-06-14 Nec Corp 半導体装置の試験法
JPH07113660B2 (ja) * 1987-10-26 1995-12-06 日本電気株式会社 モード設定回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06331191A (ja) * 1993-05-26 1994-11-29 Yasuyoshi Ochiai 換気扇

Also Published As

Publication number Publication date
JPS5745945A (en) 1982-03-16

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