JPS5745945A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS5745945A
JPS5745945A JP55121399A JP12139980A JPS5745945A JP S5745945 A JPS5745945 A JP S5745945A JP 55121399 A JP55121399 A JP 55121399A JP 12139980 A JP12139980 A JP 12139980A JP S5745945 A JPS5745945 A JP S5745945A
Authority
JP
Japan
Prior art keywords
test
pin
circuit
signal
normal mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55121399A
Other languages
Japanese (ja)
Other versions
JPS6222433B2 (en
Inventor
Soichi Kawasaki
Soichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55121399A priority Critical patent/JPS5745945A/en
Publication of JPS5745945A publication Critical patent/JPS5745945A/en
Publication of JPS6222433B2 publication Critical patent/JPS6222433B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Abstract

PURPOSE:To obtain an IC device which can peform the evaluation test for the characteristics of a function circuit by using only small amount of pins exclusive for the test. CONSTITUTION:When a signal is applied to a pin T1R in synchronism with the energization of a power source, a latch circuit 15 reset, a decoder 16 selects a normal mode, a function circuit 18 is set to a normal mode via a gate 17, and an original operation is performed. Then, the prescribed duration signal is applied to a pin TT, pulses are inputted to a pin I, are counted by a binary counter 14, and are stored in the latch circuit 15 in synchronism with an inverter 12. The pulse is decoded by a decoder 16 to select a test mode, a corresponding test signal is generated from a testing circuit 19, and the function circuit 18 performs the evaluation test for the characteristics of the function block. A signal is applied to the pin T1T at the time of completing the test to reset the latch circuit, and the function circuit 18 is returned to the normal mode. Since the input pins I, TT are used for the test with this configuration, only one pin exclusive for the test can be sufficient enough.
JP55121399A 1980-09-02 1980-09-02 Semiconductor integrated circuit device Granted JPS5745945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121399A JPS5745945A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121399A JPS5745945A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5745945A true JPS5745945A (en) 1982-03-16
JPS6222433B2 JPS6222433B2 (en) 1987-05-18

Family

ID=14810217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121399A Granted JPS5745945A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5745945A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145140A (en) * 1982-02-23 1983-08-29 Nec Corp Semiconductor characteristic measuring device
JPS60108764A (en) * 1983-11-17 1985-06-14 Nec Corp Testing method of semiconductor device
JPH01112182A (en) * 1987-10-26 1989-04-28 Nec Corp Mode setting circuit

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06331191A (en) * 1993-05-26 1994-11-29 Yasuyoshi Ochiai Ventilating fan

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145140A (en) * 1982-02-23 1983-08-29 Nec Corp Semiconductor characteristic measuring device
JPS60108764A (en) * 1983-11-17 1985-06-14 Nec Corp Testing method of semiconductor device
JPH01112182A (en) * 1987-10-26 1989-04-28 Nec Corp Mode setting circuit

Also Published As

Publication number Publication date
JPS6222433B2 (en) 1987-05-18

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