JPS5745941A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS5745941A
JPS5745941A JP55121395A JP12139580A JPS5745941A JP S5745941 A JPS5745941 A JP S5745941A JP 55121395 A JP55121395 A JP 55121395A JP 12139580 A JP12139580 A JP 12139580A JP S5745941 A JPS5745941 A JP S5745941A
Authority
JP
Japan
Prior art keywords
signal
pin
test
decoder
pins
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55121395A
Other languages
Japanese (ja)
Inventor
Soichi Kawasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55121395A priority Critical patent/JPS5745941A/en
Publication of JPS5745941A publication Critical patent/JPS5745941A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To obtain an IC device which can evaluate the characteristics of a function circuit without using any pins exclusive for a test. CONSTITUTION:When a signal ''1'' is applied to a pin T1R in synchronism with the energization of a power source, a latch circuit 16 is reset, and produced an output ''0''. At this time a decoder 17 produces a signal ''1'', a function circuit 19 is set through an OR gate 18 to a normal mode, and an IC is ordinarily operated. When a pulse having a frequency larger than a pin Ia is applied to a pin Ib in this state, a binary counter 14 repeates ''0'' or ''1'', the latch circuit 16 stores the counted value, the signal ''1'' of the decoder 17 is fed to and resets the binary counter 14 via the gate 15, and the signals of the pins Ia, Ib can be used for the input signal. When a pulse signal of high frequency is applied to the pin Ia, the decorder selects a test mode, a function circuit 19 will dispatch a signal with this output, and performs the characteristic test of the corresponding function block. When the signal is again applied to the pin T1R, it returns to the normal mode, and no pin exclusive for the test is necessary.
JP55121395A 1980-09-02 1980-09-02 Semiconductor integrated circuit device Pending JPS5745941A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121395A JPS5745941A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121395A JPS5745941A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS5745941A true JPS5745941A (en) 1982-03-16

Family

ID=14810126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121395A Pending JPS5745941A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5745941A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6438674A (en) * 1987-08-04 1989-02-08 Nippon Electric Ic Microcomput Semiconductor integrated circuit
US6378034B1 (en) 1998-10-09 2002-04-23 Nec Corporation Microcomputer with flash EEPROM having automatic communication mode determining function

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6438674A (en) * 1987-08-04 1989-02-08 Nippon Electric Ic Microcomput Semiconductor integrated circuit
US6378034B1 (en) 1998-10-09 2002-04-23 Nec Corporation Microcomputer with flash EEPROM having automatic communication mode determining function

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