JPS6211147A - 異物検査装置 - Google Patents
異物検査装置Info
- Publication number
- JPS6211147A JPS6211147A JP60140142A JP14014285A JPS6211147A JP S6211147 A JPS6211147 A JP S6211147A JP 60140142 A JP60140142 A JP 60140142A JP 14014285 A JP14014285 A JP 14014285A JP S6211147 A JPS6211147 A JP S6211147A
- Authority
- JP
- Japan
- Prior art keywords
- foreign object
- foreign
- wafer
- inspection
- microprocessor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60140142A JPS6211147A (ja) | 1985-06-28 | 1985-06-28 | 異物検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60140142A JPS6211147A (ja) | 1985-06-28 | 1985-06-28 | 異物検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6211147A true JPS6211147A (ja) | 1987-01-20 |
JPH0375054B2 JPH0375054B2 (enrdf_load_stackoverflow) | 1991-11-28 |
Family
ID=15261849
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60140142A Granted JPS6211147A (ja) | 1985-06-28 | 1985-06-28 | 異物検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6211147A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0371014U (enrdf_load_stackoverflow) * | 1989-11-15 | 1991-07-17 | ||
US5645441A (en) * | 1995-05-18 | 1997-07-08 | Niles Parts Co., Ltd. | Rotary connector device |
US5730386A (en) * | 1995-09-04 | 1998-03-24 | Sumitomo Electric Industries, Ltd. | Cable reel |
-
1985
- 1985-06-28 JP JP60140142A patent/JPS6211147A/ja active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0371014U (enrdf_load_stackoverflow) * | 1989-11-15 | 1991-07-17 | ||
US5645441A (en) * | 1995-05-18 | 1997-07-08 | Niles Parts Co., Ltd. | Rotary connector device |
US5730386A (en) * | 1995-09-04 | 1998-03-24 | Sumitomo Electric Industries, Ltd. | Cable reel |
Also Published As
Publication number | Publication date |
---|---|
JPH0375054B2 (enrdf_load_stackoverflow) | 1991-11-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6211147A (ja) | 異物検査装置 | |
JP2524532B2 (ja) | ウエハ異物検査装置 | |
JPS6211139A (ja) | 異物検査装置 | |
JPH0774788B2 (ja) | 異物有無検査装置 | |
JPS6211146A (ja) | 異物検査装置 | |
JPS6211136A (ja) | 異物検査装置 | |
JPS6211148A (ja) | 異物検査装置 | |
JPH0378928B2 (enrdf_load_stackoverflow) | ||
JPS6211141A (ja) | 異物検査装置 | |
JPH03156947A (ja) | 検査方法 | |
JP2735217B2 (ja) | 表面欠陥検査装置 | |
JPH0378929B2 (enrdf_load_stackoverflow) | ||
JPS6269151A (ja) | ウエハ異物検査装置 | |
JPS6276732A (ja) | 異物検査装置 | |
JPH0363818B2 (enrdf_load_stackoverflow) | ||
JPS61278739A (ja) | 異物検査装置 | |
JPS6211149A (ja) | 異物検査装置 | |
JPS6269148A (ja) | ウエハ異物検査装置 | |
JPS6269150A (ja) | ウエハ異物検査装置 | |
JPH0363817B2 (enrdf_load_stackoverflow) | ||
JPH0523620B2 (enrdf_load_stackoverflow) | ||
JPS6211142A (ja) | 異物検査装置 | |
JPS6269149A (ja) | ウエハ異物検査装置 | |
JPH0347736B2 (enrdf_load_stackoverflow) | ||
JPS6341038A (ja) | ウエハ異物検査装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
LAPS | Cancellation because of no payment of annual fees |