JPS61246678A - Ｉｃ試験用パタ−ン発生装置 - Google Patents

Ｉｃ試験用パタ−ン発生装置

Info

Publication number
JPS61246678A
JPS61246678A JP60088332A JP8833285A JPS61246678A JP S61246678 A JPS61246678 A JP S61246678A JP 60088332 A JP60088332 A JP 60088332A JP 8833285 A JP8833285 A JP 8833285A JP S61246678 A JPS61246678 A JP S61246678A
Authority
JP
Japan
Prior art keywords
pattern
memory
address
under test
device under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60088332A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0546908B2 (enrdf_load_stackoverflow
Inventor
Eiki Arasawa
荒沢　永樹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP60088332A priority Critical patent/JPS61246678A/ja
Publication of JPS61246678A publication Critical patent/JPS61246678A/ja
Publication of JPH0546908B2 publication Critical patent/JPH0546908B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP60088332A 1985-04-24 1985-04-24 Ｉｃ試験用パタ−ン発生装置 Granted JPS61246678A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60088332A JPS61246678A (ja) 1985-04-24 1985-04-24 Ｉｃ試験用パタ−ン発生装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60088332A JPS61246678A (ja) 1985-04-24 1985-04-24 Ｉｃ試験用パタ−ン発生装置

Publications (2)

Publication Number Publication Date
JPS61246678A true JPS61246678A (ja) 1986-11-01
JPH0546908B2 JPH0546908B2 (enrdf_load_stackoverflow) 1993-07-15

Family

ID=13939917

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60088332A Granted JPS61246678A (ja) 1985-04-24 1985-04-24 Ｉｃ試験用パタ−ン発生装置

Country Status (1)

Country Link
JP (1) JPS61246678A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0546908B2 (enrdf_load_stackoverflow) 1993-07-15

Similar Documents

Publication Publication Date Title
JPS61246678A (ja) Ｉｃ試験用パタ−ン発生装置
US20080082874A1 (en) FBM generation device and FBM generation method
KR950006214B1 (ko) 셀프체크회로부착 패턴메모리회로
KR20000000990A (ko) 에러 검출장치
SU1405059A1 (ru) Устройство дл контрол цифровых блоков
SU1456996A1 (ru) Устройство дл контрол блоков пам ти
JP2715740B2 (ja) 情報処理装置のバス監視回路
JPH0289300A (ja) 半導体メモリ素子
JPS62117048A (ja) 記憶装置制御方式
JPS6116368A (ja) 画像処理装置の検査装置
JPS59171096A (ja) 磁気バブルメモリ装置
JPH0498698A (ja) 半導体メモリ用オンチップテスト方式
JPH0997194A (ja) フェイルメモリのデータ取得装置
JPH11353897A (ja) Ｉｃ試験装置
JPH03127151A (ja) テスト装置
JPH04350745A (ja) 記憶判定回路
JPS5844260B2 (ja) 期待値パタ−ン作成装置
JPH07210469A (ja) パリティエラーアドレス検出回路
JPH04220729A (ja) 情報処理装置
JPH03126147A (ja) 外部記憶装置のテスト方式
JPS60205639A (ja) アドレスストツプ回路
JPH02130485A (ja) 半導体検査装置
JPH02247739A (ja) ロジックセルアレイによるシステム検査方法
JPS62145174A (ja) デジタルパタ−ン発生装置
JPS6188326A (ja) デイスク制御装置の検査方法