JPS61169749A - 物品の外面検査方法 - Google Patents

物品の外面検査方法

Info

Publication number
JPS61169749A
JPS61169749A JP60011435A JP1143585A JPS61169749A JP S61169749 A JPS61169749 A JP S61169749A JP 60011435 A JP60011435 A JP 60011435A JP 1143585 A JP1143585 A JP 1143585A JP S61169749 A JPS61169749 A JP S61169749A
Authority
JP
Japan
Prior art keywords
comparison circuit
pixel
circuit
video
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60011435A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0544982B2 (fr
Inventor
Takashi Miura
隆 三浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MIYUUCHIYUARU KK
Original Assignee
MIYUUCHIYUARU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MIYUUCHIYUARU KK filed Critical MIYUUCHIYUARU KK
Priority to JP60011435A priority Critical patent/JPS61169749A/ja
Publication of JPS61169749A publication Critical patent/JPS61169749A/ja
Publication of JPH0544982B2 publication Critical patent/JPH0544982B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Medical Preparation Storing Or Oral Administration Devices (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP60011435A 1985-01-23 1985-01-23 物品の外面検査方法 Granted JPS61169749A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60011435A JPS61169749A (ja) 1985-01-23 1985-01-23 物品の外面検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60011435A JPS61169749A (ja) 1985-01-23 1985-01-23 物品の外面検査方法

Publications (2)

Publication Number Publication Date
JPS61169749A true JPS61169749A (ja) 1986-07-31
JPH0544982B2 JPH0544982B2 (fr) 1993-07-07

Family

ID=11778003

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60011435A Granted JPS61169749A (ja) 1985-01-23 1985-01-23 物品の外面検査方法

Country Status (1)

Country Link
JP (1) JPS61169749A (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0233545A2 (fr) * 1986-02-10 1987-08-26 Nukem GmbH Procédé et dispositif pour la détection de défauts dans un objet
JPS63173170A (ja) * 1987-01-13 1988-07-16 Omron Tateisi Electronics Co 実装基板検査装置
JPH046404A (ja) * 1990-04-25 1992-01-10 Seikosha Co Ltd 画像監視方法
JP2015059810A (ja) * 2013-09-18 2015-03-30 株式会社デンソーウェーブ 外観検査システム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160587A (en) * 1974-11-22 1976-05-26 Toppan Printing Co Ltd Insatsubutsuno kensasochi
JPS59186335A (ja) * 1983-04-08 1984-10-23 Hitachi Ltd パタ−ン検査方式

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160587A (en) * 1974-11-22 1976-05-26 Toppan Printing Co Ltd Insatsubutsuno kensasochi
JPS59186335A (ja) * 1983-04-08 1984-10-23 Hitachi Ltd パタ−ン検査方式

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0233545A2 (fr) * 1986-02-10 1987-08-26 Nukem GmbH Procédé et dispositif pour la détection de défauts dans un objet
JPS63173170A (ja) * 1987-01-13 1988-07-16 Omron Tateisi Electronics Co 実装基板検査装置
JPH046404A (ja) * 1990-04-25 1992-01-10 Seikosha Co Ltd 画像監視方法
JP2015059810A (ja) * 2013-09-18 2015-03-30 株式会社デンソーウェーブ 外観検査システム
US10190989B2 (en) 2013-09-18 2019-01-29 Denso Wave Incorporated Method and apparatus for inspecting appearance of object using images picked up under different light quantities

Also Published As

Publication number Publication date
JPH0544982B2 (fr) 1993-07-07

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Legal Events

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EXPY Cancellation because of completion of term