JPS61169749A - External surface inspection for article - Google Patents

External surface inspection for article

Info

Publication number
JPS61169749A
JPS61169749A JP60011435A JP1143585A JPS61169749A JP S61169749 A JPS61169749 A JP S61169749A JP 60011435 A JP60011435 A JP 60011435A JP 1143585 A JP1143585 A JP 1143585A JP S61169749 A JPS61169749 A JP S61169749A
Authority
JP
Japan
Prior art keywords
comparison circuit
pixel
circuit
video
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60011435A
Other languages
Japanese (ja)
Other versions
JPH0544982B2 (en
Inventor
Takashi Miura
隆 三浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MIYUUCHIYUARU KK
Original Assignee
MIYUUCHIYUARU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MIYUUCHIYUARU KK filed Critical MIYUUCHIYUARU KK
Priority to JP60011435A priority Critical patent/JPS61169749A/en
Publication of JPS61169749A publication Critical patent/JPS61169749A/en
Publication of JPH0544982B2 publication Critical patent/JPH0544982B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Medical Preparation Storing Or Oral Administration Devices (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To judge video information on a number of objects to be inspected introduced continuously with ease in comparison with a reference product information, by comparing video signals between the reference product and the object being inspected in real time. CONSTITUTION:An object A to be inspected is photographed to be converted into digital from analog and the video signal is applied to a comparison circuit 15. The comparison circuit 15 is made up of a real time comparison circuit 16 which compares the signal with a numeral of a reference product AS memorized into a memory circuit 12 and an allowable range comparison circuit 17. A specified pixel of the memory circuit 12 and a specified pixel of the video of the object A are made to coincide with a synchronous command circuit 18 with the pixel of a predetermined specified position as reference, then, both pixel signals are delivered sequentially synchronizing each other to be fed into a real time comparison circuit 16, which judges the difference (voltage difference) between both the signals and the results are applied into the next allowable range comparison circuit 17 to determine whether the difference is within the allowable range or not. The propriety of the signal (voltage) of each pixel is judged with the measuring range B of the video of the object A and when deficiency is found, a proper command is issued or a display lamp comes on.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は主として錠剤等小型の物品の外面検査方法に関
する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates primarily to a method for inspecting the external surface of small articles such as tablets.

従来の技術 従来、錠剤等は打錠機により製造された後。Conventional technology Conventionally, tablets are manufactured using a tablet press.

浸透途中にセいて目視により電、割れ、欠け。During penetration, visual inspection reveals electrical charges, cracks, and chips.

印刷汚れ、刻印の良否等の検査を行っている。We perform inspections for printing stains, quality of engravings, etc.

しかし人間の直感的判断力は体調、疲労変により変動し
、検査基準が必ずしも一定ではなく。
However, people's intuitive judgment ability fluctuates depending on their physical condition and fatigue, and testing standards are not necessarily constant.

かつ非能率的でコスト高となる。これを改善する手段と
してTVカメラ等を用いて光学的に検査する方法が擺案
式れている。この方法は、予め標準品をTVカメラ等に
て撮影し1表面の映像情報を記憶し1次いで検体を同一
条件にて撮影し、映像情報を比較回路−ζおいて上記標
準映像情報と比較し、良否を判定するものである。
Moreover, it is inefficient and costly. As a means to improve this problem, a method of optical inspection using a TV camera or the like has been proposed. In this method, a standard product is photographed in advance with a TV camera, etc., image information of the surface is memorized, the specimen is then photographed under the same conditions, and the image information is compared with the above standard image information in a comparison circuit -ζ. , to judge the quality.

発明が解決しようとする問題点 この場合1錠剤等は多数連続して高速に慢送され、従っ
て比較判定はきわめて短時間に行う必要がある。しかし
撮像機として例えばCCD方式の固体撮像素子(以下C
CD式撮像機という)を利用した場合、Wi面を構成す
る画素(転送電極)はきわめて多数(例えば5cIIx
Sellの画面で約!5万個)配列されている。従って
記憶回路の記憶素子はこれに相当する個数を必要とする
と共に、比較回路も同様にこれに相当する素子を必要と
するものである。しかも比較操作は標準S@情報と検体
映像情報とを上記多数の比較素子にインプットし、その
差を検出するようにしたもので、相当の手数を要し1次
の検体の送り込まれるまでのごく短時聞内に処理すルコ
とは、コンピュータを利用するとしてもきわめて困遣で
ある。
Problems to be Solved by the Invention In this case, a large number of tablets, etc. are continuously fed at high speed, and therefore, comparison and judgment must be carried out in a very short period of time. However, as an image sensor, for example, a CCD type solid-state image sensor (hereinafter referred to as C
When using a CD-type imager), the number of pixels (transfer electrodes) that make up the Wi surface is extremely large (for example, 5cIIx
Approximately on the Sell screen! 50,000 pieces) are arranged. Therefore, the memory circuit requires a corresponding number of memory elements, and the comparator circuit also requires a corresponding number of elements. Moreover, the comparison operation involves inputting the standard S@ information and sample image information into the above-mentioned numerous comparison elements and detecting the difference between them, which requires a considerable amount of time and effort until the first sample is sent. Even if you use a computer, it is extremely difficult to process the process within a short period of time.

本発明はかかる点に1み、高速にて連続して導入される
多数の検体の映像情報を、記憶された標準品情報に対し
、容易に比較判定することを目的とする。
One object of the present invention is to easily compare and judge the image information of a large number of specimens introduced in succession at high speed with the stored standard product information.

問題点を解決するための手段 上記目的を達成するための本発明を実施例に対応する第
1図乃至@4図に基づいて説明する1、先づ標準品入S
を撮像用カメラ4(またはS)により撮影し、映像信号
をA/D変111して記−回路12にインプットする。
Means for Solving the Problems The present invention for achieving the above object will be explained based on FIGS. 1 to 4 corresponding to the embodiments.
is photographed by the imaging camera 4 (or S), and the video signal is A/D converted 111 and input to the recording circuit 12.

次いで検体人を撮影し、得られる映像信号をA/D変換
し、該映像信号を比較回路IFJに印加する。この回路
1匹にはリアルタイム比較回路1Gを備え、検体Aの映
像信号と標準品の映像信号とをリアルタイムで比較する
ことを特徴とするものである。
Next, the subject person is photographed, the resulting video signal is A/D converted, and the video signal is applied to the comparison circuit IFJ. This single circuit is equipped with a real-time comparison circuit 1G, and is characterized in that it compares the video signal of specimen A and the video signal of the standard product in real time.

作用 両映像信号をリアルタイムで比較するようにしたから、
それぞれの映像は極めて多数の画素から構成されてはい
るが、高速比較が容易であり、従って高速で順次送り込
まれる物品(検体)の測定が確実である。
Since both video signals are compared in real time,
Although each image is composed of a very large number of pixels, it is easy to compare them at high speed, and therefore it is possible to reliably measure articles (specimens) that are sequentially fed in at high speed.

実施例 第1図以下に示す木実施例は、打@機から送り出される
錠剤(以下検体という)の外表面の検査に本発明を適用
した例を示す。第!rg!Jに示す検査機1には、対を
なしかつ榴接する吸着ドラムi!、IIを備え、それぞ
れの吸着ドラム2゜3には測定すべき検体A及び標準錠
剤(以下標準品という)ASを収納する窪みを備え、吸
引作用によりこの1みに検体Aまたは標準品Asを吸引
収納するよう−ごしたもので、吸着ドラム2上の検体人
(または、111に品AS)は吸着ドラム8に表裏反転
して移行される。それぞれの吸着ドラム2.1には撮像
用カメラ4.5と瞬間的に投光する光源例えばストロボ
6.1とを対没し、一方のカメラ4及びストロボ6は検
体A(またはs準品AS)の表百を、また他方のカメラ
5FILびストロボ1はその裏面を撮影するようにした
ものである。
EXAMPLE FIG. 1 The wooden example shown below shows an example in which the present invention is applied to the inspection of the outer surface of a tablet (hereinafter referred to as a specimen) sent out from a punching machine. No.! rg! The inspection machine 1 shown in J includes a pair of adsorption drums i! , II, and each suction drum 2.3 is provided with a recess for storing the specimen A to be measured and a standard tablet (hereinafter referred to as standard product) AS. After being sucked and stored, the specimen (or the specimen AS at 111) on the suction drum 2 is transferred to the suction drum 8 with its front and back turned upside down. An imaging camera 4.5 and a light source, for example, a strobe 6.1, which momentarily emits light are mounted on each suction drum 2.1. ), and the other camera 5FIL and strobe 1 are arranged to photograph the back side.

カメラ4.gはTVカメラ等が中いられるが。Camera 4. g allows for TV cameras etc.

好ましくはCCD方式の固体撮像素子を用いたカメラを
用いる。このCCD方式のカメラは画像信号の記憶と取
出しに好都合である。
Preferably, a camera using a CCD type solid-state image sensor is used. This CCD type camera is convenient for storing and retrieving image signals.

尚、カメラ纏及び5による検体Aの良否の判定要領は同
一であり、以下一方のカメラ4による検体人の検査要領
を説明する。
The procedures for determining the quality of the specimen A using the cameras 4 and 5 are the same, and the procedure for testing the specimen A using one of the cameras 4 will be described below.

241図は本発明の検査方法の概略工程図である。先づ
上記要領にてカメラ4にて標準品Asの表面を撮影し、
映像信号は一時記憶回路10に記憶されると共に測定範
囲算定回路11に印加される。一般にカメラにて撮影し
た場合、s!準品(検体も含む)の周縁の映1象波形は
乱れて甘り、従って測定範囲から除嚢することが好まし
い、この測定範囲決定方法は1例えば木発明者が先に小
軸した特願昭!Imlm−1sat号の方法がある。こ
れは撮像の中心点を決定し。
FIG. 241 is a schematic process diagram of the inspection method of the present invention. First, take a picture of the surface of the standard product As with camera 4 as described above,
The video signal is stored in a temporary storage circuit 10 and applied to a measurement range calculation circuit 11. Generally, when taking pictures with a camera, s! The image waveform around the periphery of the quasi-product (including the specimen) is disturbed and distorted, so it is preferable to remove the capsule from the measurement range. Akira! There is a method of Imlm-1sat. This determines the center point of imaging.

これを中心として外周より若干小径とした測定範囲を設
定するようにしたものである。
A measurement range is set around this point and has a slightly smaller diameter than the outer circumference.

第1+図にセいてnは測定範囲を示す。この測定範囲B
内の各1面素の映像信号(電圧)は記憶回路1!に記憶
される。
In Figure 1+, n indicates the measurement range. This measurement range B
The video signal (voltage) of each one element in the memory circuit 1! is memorized.

同時に許容範囲演算回路1sに映像信号が印加され、各
画素の許容範囲が設定される。これは予め設定された許
容範囲(1!圧差)を設定するものであるが、撮影の1
1漂準品へSの画面と検体人の画面とが若干ずれること
がある。これを考慮しそのずれの範囲内の各画素の電圧
の最大の差も考慮して決定するもので1以上の各操作は
コンピュータを利用して行われる。
At the same time, a video signal is applied to the tolerance calculation circuit 1s, and the tolerance range of each pixel is set. This is to set a preset tolerance range (1! pressure difference), but 1!
1. There may be a slight deviation between the screen of S and the screen of the person being tested. In consideration of this, the maximum difference in voltage of each pixel within the range of the deviation is also taken into account for determination, and each of the one or more operations is performed using a computer.

次いで検体人を撮影しA/D変換し、映(象信号は比較
回路16に印加される。この比較回路16は上記記憶回
路1鵞に記憶された漂準品Asの数値と比較するリアル
タイム比較回路16と許容範囲比較回路1フとよりなる
Next, the sample person is photographed, A/D converted, and the image signal is applied to a comparison circuit 16. This comparison circuit 16 performs real-time comparison to compare the value of the drifting product As stored in the storage circuit 1. It consists of a circuit 16 and a tolerance comparison circuit 1f.

前述の如く検体Aは高遠変で移行し、検体相互間の測定
時間間隔はきわめて短く、従って通常のコンピュータに
よる比較判定処理即ち記憶回路12の各画素の記憶情報
を比較回路の素子にインプットすると共に、検体Aの映
像のこれに相当する位置の画素を選択し、その情報を上
記比較素子にインプットすることは手数を要し。
As mentioned above, the specimen A moves with a change in height and distance, and the measurement time interval between specimens is extremely short. Therefore, the comparison judgment process using a normal computer, that is, the stored information of each pixel in the storage circuit 12 is input to the elements of the comparison circuit, and , it is time-consuming to select a pixel at a corresponding position in the image of specimen A and input that information to the comparison element.

かつ両回を構成する画素数は前述の如く数十万g+ど及
ぶものであり、相当の時間を要し高速処理には不適当で
ある。
In addition, the number of pixels constituting both times is several hundreds of thousands of grams, as mentioned above, which requires a considerable amount of time and is inappropriate for high-speed processing.

従って木発明は、この比較をリアルタイム処・里により
行うようにしたものである。こ\に云うリアルタイム処
理とは、記憶回路1!からの情報と検体人の映像情報と
を同期して連続して1頃次繰出り、m次判定してその差
を検出するものである。即ち予め定められた特定位置の
画素を基準とし、記憶回路1!の特定画素と検体人の映
像の特定画素とを同期指令回路18により合致させ、つ
いで両方の画素信号を同期して順次繰出し、リアルタイ
ム比較回路16に送り込み、該比較回路1s1こセいて
両者の等(電圧差)を判定し1次の許容範囲比較回路1
丁に印加し。
Therefore, the invention of the tree is to perform this comparison in real time. This real-time processing refers to memory circuit 1! The information from the image data and the video information of the subject are synchronized and continuously fed out for the first time, and the difference is detected by performing the m-th judgment. That is, with reference to a pixel at a predetermined specific position, the memory circuit 1! The synchronization command circuit 18 matches the specific pixel of the image with the specific pixel of the image of the subject, and then both pixel signals are synchronized and sent sequentially to the real-time comparison circuit 16. (voltage difference) and primary tolerance comparison circuit 1
Apply to Ding.

その差が許容範囲内にあるか否か比較される。A comparison is made to see if the difference is within an acceptable range.

これによって検KAの映像の測定範囲B内の各画素の信
号(II圧)の良否を判定し、不良の場合ニは適宜の指
令を発し、あるいは表示灯を点灯する。
This determines whether the signal (II pressure) of each pixel in the measurement range B of the image of the test KA is good or bad, and if it is bad, an appropriate command is issued or an indicator light is turned on.

発明の効果 以上の如く木発明によると意は、漂準品と検体とのそれ
ぞれの映像信号を比較するに当り、II yルタイムに
より行うようにしたから、その比較は高速を可能とする
ことができ、従って例えば打@機より高速にて送り出さ
れる鋺剤等の褒面検査にきわめて有効である。
Effects of the Invention As described above, the purpose of the invention is that the video signals of the drifting product and the specimen are compared in real time, so the comparison can be made at high speed. Therefore, it is extremely effective for inspecting the surface of mochi powder, etc., which is sent out at high speed from a hammer.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の外面検査方法の概略工程図。 第!図は検fllllの概略説明図、第8図は標準品及
び検体の平面図、第4図はリアルタイムによる比較処理
の説明図である。 4、Isは撮像用カメラ、  !茸は記憶回路。 1@はリアルタイム比較回路、 人は検体。 ASは雪準品である。 特許出;應大    株式会社 ミューチュTル他  
1名 第1図 第2図
FIG. 1 is a schematic process diagram of the external surface inspection method of the present invention. No.! The figure is a schematic explanatory diagram of the test, FIG. 8 is a plan view of a standard product and a specimen, and FIG. 4 is an explanatory diagram of real-time comparison processing. 4. Is is an imaging camera, ! Mushrooms are memory circuits. 1@ is the real-time comparison circuit, and the person is the sample. AS is a snow quality product. Patent issued: Odai, MutuTru Co., Ltd., etc.
1 person Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 標準品と検体とをそれぞれ撮影し、表面状態を対比し良
否を判別する外面検査方法において、予め標準品を撮像
機により撮影し、標準映像信号をA/D変換し記憶回路
にインプットし、次いで検体を撮影し得られる映像信号
をA/D変化すると共に、該映像信号と上記記憶回路か
らの標準映像信号とを同期して順次取出し、リアルタイ
ムで比較判定することを特徴とする物品の外面検査方法
In an external surface inspection method in which a standard product and a specimen are each photographed and their surface conditions are compared to determine pass/fail, the standard product is photographed in advance using an imaging device, the standard video signal is A/D converted and input into a storage circuit, and then External surface inspection of an article, characterized by A/D converting a video signal obtained by photographing a specimen, and sequentially extracting the video signal and a standard video signal from the storage circuit in synchronization for comparison and judgment in real time. Method.
JP60011435A 1985-01-23 1985-01-23 External surface inspection for article Granted JPS61169749A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60011435A JPS61169749A (en) 1985-01-23 1985-01-23 External surface inspection for article

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60011435A JPS61169749A (en) 1985-01-23 1985-01-23 External surface inspection for article

Publications (2)

Publication Number Publication Date
JPS61169749A true JPS61169749A (en) 1986-07-31
JPH0544982B2 JPH0544982B2 (en) 1993-07-07

Family

ID=11778003

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60011435A Granted JPS61169749A (en) 1985-01-23 1985-01-23 External surface inspection for article

Country Status (1)

Country Link
JP (1) JPS61169749A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0233545A2 (en) * 1986-02-10 1987-08-26 Nukem GmbH Method and apparatus for recognizing faults in an object
JPS63173170A (en) * 1987-01-13 1988-07-16 Omron Tateisi Electronics Co Device for inspecting mounting board
JPH046404A (en) * 1990-04-25 1992-01-10 Seikosha Co Ltd Image monitoring method
JP2015059810A (en) * 2013-09-18 2015-03-30 株式会社デンソーウェーブ Appearance inspection system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160587A (en) * 1974-11-22 1976-05-26 Toppan Printing Co Ltd Insatsubutsuno kensasochi
JPS59186335A (en) * 1983-04-08 1984-10-23 Hitachi Ltd Pattern inspection system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5160587A (en) * 1974-11-22 1976-05-26 Toppan Printing Co Ltd Insatsubutsuno kensasochi
JPS59186335A (en) * 1983-04-08 1984-10-23 Hitachi Ltd Pattern inspection system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0233545A2 (en) * 1986-02-10 1987-08-26 Nukem GmbH Method and apparatus for recognizing faults in an object
JPS63173170A (en) * 1987-01-13 1988-07-16 Omron Tateisi Electronics Co Device for inspecting mounting board
JPH046404A (en) * 1990-04-25 1992-01-10 Seikosha Co Ltd Image monitoring method
JP2015059810A (en) * 2013-09-18 2015-03-30 株式会社デンソーウェーブ Appearance inspection system
US10190989B2 (en) 2013-09-18 2019-01-29 Denso Wave Incorporated Method and apparatus for inspecting appearance of object using images picked up under different light quantities

Also Published As

Publication number Publication date
JPH0544982B2 (en) 1993-07-07

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