JPS6097450A - 不良メモリカ−ド検出方法 - Google Patents

不良メモリカ−ド検出方法

Info

Publication number
JPS6097450A
JPS6097450A JP58204014A JP20401483A JPS6097450A JP S6097450 A JPS6097450 A JP S6097450A JP 58204014 A JP58204014 A JP 58204014A JP 20401483 A JP20401483 A JP 20401483A JP S6097450 A JPS6097450 A JP S6097450A
Authority
JP
Japan
Prior art keywords
address
capacity
memory card
circuit
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58204014A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0239814B2 (enExample
Inventor
Tadashi Kaneko
正 金古
Toru Otsu
徹 大津
Toshihiro Sakai
酒井　利弘
Kiyoshi Sudo
清 須藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58204014A priority Critical patent/JPS6097450A/ja
Publication of JPS6097450A publication Critical patent/JPS6097450A/ja
Publication of JPH0239814B2 publication Critical patent/JPH0239814B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
JP58204014A 1983-10-31 1983-10-31 不良メモリカ−ド検出方法 Granted JPS6097450A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58204014A JPS6097450A (ja) 1983-10-31 1983-10-31 不良メモリカ−ド検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58204014A JPS6097450A (ja) 1983-10-31 1983-10-31 不良メモリカ−ド検出方法

Publications (2)

Publication Number Publication Date
JPS6097450A true JPS6097450A (ja) 1985-05-31
JPH0239814B2 JPH0239814B2 (enExample) 1990-09-07

Family

ID=16483337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58204014A Granted JPS6097450A (ja) 1983-10-31 1983-10-31 不良メモリカ−ド検出方法

Country Status (1)

Country Link
JP (1) JPS6097450A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62280945A (ja) * 1986-05-30 1987-12-05 Fujitsu Ltd メモリ・システム
JPS62298855A (ja) * 1986-06-18 1987-12-25 Fujitsu Ltd 情報処理装置
US5714016A (en) * 1992-09-30 1998-02-03 Sumitomo Electric Industries, Ltd. Gear for wheel speed detection and method of manufacturing the same
JP2006266441A (ja) * 2005-03-25 2006-10-05 Aisin Seiki Co Ltd 厚板プレスギヤ

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05337719A (ja) * 1992-05-30 1993-12-21 Hitachi Tool Eng Ltd エンドミル

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5529520A (en) * 1978-08-22 1980-03-01 Yokohama Rubber Co Ltd:The Rubber composition

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5529520A (en) * 1978-08-22 1980-03-01 Yokohama Rubber Co Ltd:The Rubber composition

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62280945A (ja) * 1986-05-30 1987-12-05 Fujitsu Ltd メモリ・システム
JPS62298855A (ja) * 1986-06-18 1987-12-25 Fujitsu Ltd 情報処理装置
US5714016A (en) * 1992-09-30 1998-02-03 Sumitomo Electric Industries, Ltd. Gear for wheel speed detection and method of manufacturing the same
JP2006266441A (ja) * 2005-03-25 2006-10-05 Aisin Seiki Co Ltd 厚板プレスギヤ

Also Published As

Publication number Publication date
JPH0239814B2 (enExample) 1990-09-07

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