JPS6095643A - 多段演算パイプライン診断方式 - Google Patents

多段演算パイプライン診断方式

Info

Publication number
JPS6095643A
JPS6095643A JP58202295A JP20229583A JPS6095643A JP S6095643 A JPS6095643 A JP S6095643A JP 58202295 A JP58202295 A JP 58202295A JP 20229583 A JP20229583 A JP 20229583A JP S6095643 A JPS6095643 A JP S6095643A
Authority
JP
Japan
Prior art keywords
stage
register
registers
flip
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58202295A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6336534B2 (enExample
Inventor
Toshiro Nakazuru
敏朗 中水流
Shigeru Nagasawa
長沢　茂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58202295A priority Critical patent/JPS6095643A/ja
Publication of JPS6095643A publication Critical patent/JPS6095643A/ja
Publication of JPS6336534B2 publication Critical patent/JPS6336534B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP58202295A 1983-10-28 1983-10-28 多段演算パイプライン診断方式 Granted JPS6095643A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58202295A JPS6095643A (ja) 1983-10-28 1983-10-28 多段演算パイプライン診断方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58202295A JPS6095643A (ja) 1983-10-28 1983-10-28 多段演算パイプライン診断方式

Publications (2)

Publication Number Publication Date
JPS6095643A true JPS6095643A (ja) 1985-05-29
JPS6336534B2 JPS6336534B2 (enExample) 1988-07-20

Family

ID=16455174

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58202295A Granted JPS6095643A (ja) 1983-10-28 1983-10-28 多段演算パイプライン診断方式

Country Status (1)

Country Link
JP (1) JPS6095643A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63213014A (ja) * 1987-03-02 1988-09-05 Nec Corp デ−タ処理装置
EP0638858A1 (en) * 1993-08-03 1995-02-15 Nec Corporation Pipeline data processing apparatus having small power consumption
FR2789247A1 (fr) * 1999-01-28 2000-08-04 St Microelectronics Sa Circuit electronique modulaire a synchronisation amelioree
WO2010071063A1 (ja) * 2008-12-16 2010-06-24 国立大学法人 東京大学 半導体集積回路

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6039059A (en) 1996-09-30 2000-03-21 Verteq, Inc. Wafer cleaning system

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63213014A (ja) * 1987-03-02 1988-09-05 Nec Corp デ−タ処理装置
EP0638858A1 (en) * 1993-08-03 1995-02-15 Nec Corporation Pipeline data processing apparatus having small power consumption
US5974555A (en) * 1993-08-03 1999-10-26 Nec Corporation Pipeline processing apparatus having small power consumption
FR2789247A1 (fr) * 1999-01-28 2000-08-04 St Microelectronics Sa Circuit electronique modulaire a synchronisation amelioree
US6772358B1 (en) 1999-01-28 2004-08-03 St Microelectronics Sa System and method for coordinating activation of a plurality of modules through the use of synchronization cells comprising a latch and regulating circuits
WO2010071063A1 (ja) * 2008-12-16 2010-06-24 国立大学法人 東京大学 半導体集積回路
JP2010147580A (ja) * 2008-12-16 2010-07-01 Univ Of Tokyo 半導体集積回路

Also Published As

Publication number Publication date
JPS6336534B2 (enExample) 1988-07-20

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