JPS6088468A - 半導体集積装置の製造方法 - Google Patents
半導体集積装置の製造方法Info
- Publication number
- JPS6088468A JPS6088468A JP59147702A JP14770284A JPS6088468A JP S6088468 A JPS6088468 A JP S6088468A JP 59147702 A JP59147702 A JP 59147702A JP 14770284 A JP14770284 A JP 14770284A JP S6088468 A JPS6088468 A JP S6088468A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- oxide
- region
- mask
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W10/0121—
-
- H10P14/271—
-
- H10P14/2905—
-
- H10P14/3411—
-
- H10W10/13—
Landscapes
- Element Separation (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US54162683A | 1983-10-13 | 1983-10-13 | |
| US541626 | 1983-10-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6088468A true JPS6088468A (ja) | 1985-05-18 |
| JPH0373139B2 JPH0373139B2 (enExample) | 1991-11-20 |
Family
ID=24160384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59147702A Granted JPS6088468A (ja) | 1983-10-13 | 1984-07-18 | 半導体集積装置の製造方法 |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP0137195B1 (enExample) |
| JP (1) | JPS6088468A (enExample) |
| DE (1) | DE3468782D1 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69434736D1 (de) * | 1993-08-31 | 2006-06-22 | St Microelectronics Inc | Isolationsstruktur und Verfahren zur Herstellung |
| CN110061066B (zh) * | 2019-04-30 | 2024-02-09 | 苏州固锝电子股份有限公司 | 一种浅沟槽的电极同侧二极管芯片的制造工艺 |
| CN118398485B (zh) * | 2024-06-27 | 2024-09-13 | 合肥晶合集成电路股份有限公司 | 半导体器件的制备方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58220444A (ja) * | 1982-06-16 | 1983-12-22 | Toshiba Corp | 半導体装置の製造方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3372063A (en) * | 1964-12-22 | 1968-03-05 | Hitachi Ltd | Method for manufacturing at least one electrically isolated region of a semiconductive material |
| CA1001771A (en) * | 1973-01-15 | 1976-12-14 | Fairchild Camera And Instrument Corporation | Method of mos transistor manufacture and resulting structure |
| US4141765A (en) * | 1975-02-17 | 1979-02-27 | Siemens Aktiengesellschaft | Process for the production of extremely flat silicon troughs by selective etching with subsequent rate controlled epitaxial refill |
| US3972754A (en) * | 1975-05-30 | 1976-08-03 | Ibm Corporation | Method for forming dielectric isolation in integrated circuits |
| US4394196A (en) * | 1980-07-16 | 1983-07-19 | Tokyo Shibaura Denki Kabushiki Kaisha | Method of etching, refilling and etching dielectric grooves for isolating micron size device regions |
| JPS58154256A (ja) * | 1982-03-10 | 1983-09-13 | Hitachi Ltd | 半導体装置 |
| EP0104765B1 (en) * | 1982-08-24 | 1989-06-21 | Nippon Telegraph And Telephone Corporation | Substrate structure of semiconductor device and method of manufacturing the same |
-
1984
- 1984-07-18 JP JP59147702A patent/JPS6088468A/ja active Granted
- 1984-08-08 DE DE8484109400T patent/DE3468782D1/de not_active Expired
- 1984-08-08 EP EP84109400A patent/EP0137195B1/en not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58220444A (ja) * | 1982-06-16 | 1983-12-22 | Toshiba Corp | 半導体装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0137195A1 (en) | 1985-04-17 |
| JPH0373139B2 (enExample) | 1991-11-20 |
| EP0137195B1 (en) | 1988-01-13 |
| DE3468782D1 (en) | 1988-02-18 |
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