JPS6029906B2 - Ｌｓｉ回路の交流性能の試験方法 - Google Patents

Ｌｓｉ回路の交流性能の試験方法

Info

Publication number
JPS6029906B2
JPS6029906B2 JP51030924A JP3092476A JPS6029906B2 JP S6029906 B2 JPS6029906 B2 JP S6029906B2 JP 51030924 A JP51030924 A JP 51030924A JP 3092476 A JP3092476 A JP 3092476A JP S6029906 B2 JPS6029906 B2 JP S6029906B2
Authority
JP
Japan
Prior art keywords
circuit
test
counter
logic
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51030924A
Other languages
English (en)
Japanese (ja)
Other versions
JPS51132945A (en
Inventor
ユージン・アイ・ミユールドルフ
ロバート・アール・エラム
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS51132945A publication Critical patent/JPS51132945A/ja
Publication of JPS6029906B2 publication Critical patent/JPS6029906B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP51030924A 1975-04-29 1976-03-23 Ｌｓｉ回路の交流性能の試験方法 Expired JPS6029906B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US572806 1975-04-29
US05/572,806 US4058767A (en) 1975-04-29 1975-04-29 Apparatus and process for testing AC performance of LSI components

Publications (2)

Publication Number Publication Date
JPS51132945A JPS51132945A (en) 1976-11-18
JPS6029906B2 true JPS6029906B2 (ja) 1985-07-13

Family

ID=24289429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51030924A Expired JPS6029906B2 (ja) 1975-04-29 1976-03-23 Ｌｓｉ回路の交流性能の試験方法

Country Status (5)

Country Link
US (1) US4058767A (enExample)
JP (1) JPS6029906B2 (enExample)
DE (1) DE2615787C2 (enExample)
FR (1) FR2309879A1 (enExample)
GB (1) GB1515245A (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4161029A (en) * 1977-09-19 1979-07-10 Frye George J Automatic transient response analyzer system
GB1599069A (en) * 1978-05-31 1981-09-30 Ferranti Ltd Testing of circuit arrangements
DE2833608C2 (de) * 1978-07-31 1986-07-10 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zum Bestimmen der Signallaufzeit in integrierten digitalen Halbleiterschaltungen
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
US4562554A (en) * 1983-06-09 1985-12-31 The United States Of America As Represented By The Secretary Of The Navy Universal microcomputer for individual sensors
US4564943A (en) * 1983-07-05 1986-01-14 International Business Machines System path stressing
US4527907A (en) * 1983-09-06 1985-07-09 Fairchild Camera And Instrument Corporation Method and apparatus for measuring the settling time of an analog signal
GB2200465B (en) * 1987-01-16 1991-10-02 Teradyne Inc Automatic test equipment
JPH01163840A (ja) * 1987-12-21 1989-06-28 Nec Corp 遅延時間チエック方式
US4878209A (en) * 1988-03-17 1989-10-31 International Business Machines Corporation Macro performance test
JPH06249919A (ja) * 1993-03-01 1994-09-09 Fujitsu Ltd 半導体集積回路装置の端子間接続試験方法
US5796751A (en) * 1996-07-22 1998-08-18 International Business Machines Corporation Technique for sorting high frequency integrated circuits
DE10127656B4 (de) * 2001-06-07 2008-09-18 Qimonda Ag Vorrichtung und Verfahren zur Untersuchung des Signalverhaltens von Halbleiterschaltungen
CN109308427A (zh) * 2018-08-08 2019-02-05 上海华虹集成电路有限责任公司 一种扩展测试通道的方法和电路

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3673397A (en) * 1970-10-02 1972-06-27 Singer Co Circuit tester
DE2121330C3 (de) * 1971-04-30 1974-10-17 Ludwig 6369 Dortelweil Illian Verfahren und Schaltungsanordnung zum Prüfen digital arbeitender elektronischer Geräte und ihrer Bauteile
US3740646A (en) * 1971-08-02 1973-06-19 Ibm Testing of non-linear circuits by accumulated result comparison
US3751695A (en) * 1972-03-24 1973-08-07 Amf Inc One-way directional control means for synchronous a.c. motors
US3887869A (en) * 1972-07-25 1975-06-03 Tau Tron Inc Method and apparatus for high speed digital circuit testing
US3784907A (en) * 1972-10-16 1974-01-08 Ibm Method of propagation delay testing a functional logic system
US3783254A (en) * 1972-10-16 1974-01-01 Ibm Level sensitive logic system
US3832535A (en) * 1972-10-25 1974-08-27 Instrumentation Engineering Digital word generating and receiving apparatus
US3916306A (en) 1973-09-06 1975-10-28 Ibm Method and apparatus for testing high circuit density devices
US3883801A (en) * 1973-11-07 1975-05-13 Bell Telephone Labor Inc Fault testing of logic circuits

Also Published As

Publication number Publication date
DE2615787C2 (de) 1987-04-30
FR2309879B1 (enExample) 1979-04-20
JPS51132945A (en) 1976-11-18
FR2309879A1 (fr) 1976-11-26
DE2615787A1 (de) 1976-11-11
US4058767A (en) 1977-11-15
GB1515245A (en) 1978-06-21

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