JPS6017545A - 擬似障害発生方式 - Google Patents

擬似障害発生方式

Info

Publication number
JPS6017545A
JPS6017545A JP58125067A JP12506783A JPS6017545A JP S6017545 A JPS6017545 A JP S6017545A JP 58125067 A JP58125067 A JP 58125067A JP 12506783 A JP12506783 A JP 12506783A JP S6017545 A JPS6017545 A JP S6017545A
Authority
JP
Japan
Prior art keywords
fault
information
pseudo
fault information
service processor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58125067A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6322342B2 (enrdf_load_stackoverflow
Inventor
Satoshi Koizumi
小泉　訓
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58125067A priority Critical patent/JPS6017545A/ja
Publication of JPS6017545A publication Critical patent/JPS6017545A/ja
Publication of JPS6322342B2 publication Critical patent/JPS6322342B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP58125067A 1983-07-08 1983-07-08 擬似障害発生方式 Granted JPS6017545A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58125067A JPS6017545A (ja) 1983-07-08 1983-07-08 擬似障害発生方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58125067A JPS6017545A (ja) 1983-07-08 1983-07-08 擬似障害発生方式

Publications (2)

Publication Number Publication Date
JPS6017545A true JPS6017545A (ja) 1985-01-29
JPS6322342B2 JPS6322342B2 (enrdf_load_stackoverflow) 1988-05-11

Family

ID=14900996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58125067A Granted JPS6017545A (ja) 1983-07-08 1983-07-08 擬似障害発生方式

Country Status (1)

Country Link
JP (1) JPS6017545A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02128237A (ja) * 1988-11-08 1990-05-16 Nec Corp 情報処理装置
US5243606A (en) * 1989-04-28 1993-09-07 Mitsubishi Denki Kabushiki Kaisha Apparatus and method for detecting failure of an external device by a microcomputer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02128237A (ja) * 1988-11-08 1990-05-16 Nec Corp 情報処理装置
US5243606A (en) * 1989-04-28 1993-09-07 Mitsubishi Denki Kabushiki Kaisha Apparatus and method for detecting failure of an external device by a microcomputer

Also Published As

Publication number Publication date
JPS6322342B2 (enrdf_load_stackoverflow) 1988-05-11

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