JPS59221752A - エラ−検査・診断装置 - Google Patents

エラ−検査・診断装置

Info

Publication number
JPS59221752A
JPS59221752A JP59075914A JP7591484A JPS59221752A JP S59221752 A JPS59221752 A JP S59221752A JP 59075914 A JP59075914 A JP 59075914A JP 7591484 A JP7591484 A JP 7591484A JP S59221752 A JPS59221752 A JP S59221752A
Authority
JP
Japan
Prior art keywords
processor
test
maintenance
flip
flop
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59075914A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0223890B2 (enExample
Inventor
アルノルド・ブルム
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS59221752A publication Critical patent/JPS59221752A/ja
Publication of JPH0223890B2 publication Critical patent/JPH0223890B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2736—Tester hardware, i.e. output processing circuits using a dedicated service processor for test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP59075914A 1983-05-25 1984-04-17 エラ−検査・診断装置 Granted JPS59221752A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP83105172A EP0126785B1 (de) 1983-05-25 1983-05-25 Prüf- und Diagnoseeinrichtung für Digitalrechner
EP831051727 1983-05-25

Publications (2)

Publication Number Publication Date
JPS59221752A true JPS59221752A (ja) 1984-12-13
JPH0223890B2 JPH0223890B2 (enExample) 1990-05-25

Family

ID=8190487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59075914A Granted JPS59221752A (ja) 1983-05-25 1984-04-17 エラ−検査・診断装置

Country Status (4)

Country Link
US (1) US4604746A (enExample)
EP (1) EP0126785B1 (enExample)
JP (1) JPS59221752A (enExample)
DE (1) DE3379354D1 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3587621T2 (de) * 1984-05-28 1994-03-24 Advantest Corp Logikanalysator.
JPH0668732B2 (ja) * 1984-11-21 1994-08-31 株式会社日立製作所 情報処理装置のスキヤン方式
JPH0670764B2 (ja) * 1985-03-06 1994-09-07 株式会社日立製作所 シ−ケンス制御装置
DE3605431A1 (de) * 1986-02-20 1987-08-27 Vdo Schindling Pruefbares elektronisches geraet und verfahren zum pruefen eines solchen geraets
US5247521A (en) * 1986-04-23 1993-09-21 Hitachi, Ltd. Data processor
JPH0821028B2 (ja) * 1986-04-23 1996-03-04 株式会社日立製作所 デ−タ処理装置
US5146605A (en) * 1987-11-12 1992-09-08 International Business Machines Corporation Direct control facility for multiprocessor network
JP2996440B2 (ja) * 1988-03-18 1999-12-27 富士通株式会社 データ処理システムの診断方式
JPH01320544A (ja) * 1988-06-22 1989-12-26 Toshiba Corp テスト容易化回路
US4947395A (en) * 1989-02-10 1990-08-07 Ncr Corporation Bus executed scan testing method and apparatus
US5423025A (en) * 1992-09-29 1995-06-06 Amdahl Corporation Error handling mechanism for a controller having a plurality of servers
US5951703A (en) * 1993-06-28 1999-09-14 Tandem Computers Incorporated System and method for performing improved pseudo-random testing of systems having multi driver buses
US5598421A (en) * 1995-02-17 1997-01-28 Unisys Corporation Method and system for tracking the state of each one of multiple JTAG chains used in testing the logic of intergrated circuits
US6119246A (en) * 1997-03-31 2000-09-12 International Business Machines Corporation Error collection coordination for software-readable and non-software readable fault isolation registers in a computer system
US6065139A (en) * 1997-03-31 2000-05-16 International Business Machines Corporation Method and system for surveillance of computer system operations
US6502208B1 (en) 1997-03-31 2002-12-31 International Business Machines Corporation Method and system for check stop error handling
US5951686A (en) * 1997-03-31 1999-09-14 International Business Machines Corporation Method and system for reboot recovery
US6557121B1 (en) 1997-03-31 2003-04-29 International Business Machines Corporation Method and system for fault isolation for PCI bus errors
JP4064546B2 (ja) * 1998-09-30 2008-03-19 株式会社アドバンテスト 電気部品テストシステム
US20090083585A1 (en) * 2007-09-21 2009-03-26 Inventec Corporation Method of pressure testing for peripheral component interconnect (pci) bus stage

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3582902A (en) * 1968-12-30 1971-06-01 Honeywell Inc Data processing system having auxiliary register storage
US3651472A (en) * 1970-03-04 1972-03-21 Honeywell Inc Multistate flip-flop element including a local memory for use in constructing a data processing system
US4023142A (en) * 1975-04-14 1977-05-10 International Business Machines Corporation Common diagnostic bus for computer systems to enable testing concurrently with normal system operation
JPS5833576B2 (ja) * 1977-03-14 1983-07-20 株式会社東芝 計算機システムの故障診断装置
US4253183A (en) * 1979-05-02 1981-02-24 Ncr Corporation Method and apparatus for diagnosing faults in a processor having a pipeline architecture
US4369511A (en) * 1979-11-21 1983-01-18 Nippon Telegraph & Telephone Public Corp. Semiconductor memory test equipment
JPS57105897A (en) * 1980-12-23 1982-07-01 Fujitsu Ltd Semiconductor storage device
US4412327A (en) * 1981-02-25 1983-10-25 Western Electric Company, Inc. Test circuit for checking memory output state continuously during time window
US4429389A (en) * 1981-05-26 1984-01-31 Burroughs Corporation Test pattern address generator
US4460997A (en) * 1981-07-15 1984-07-17 Pacific Western Systems Inc. Memory tester having memory repair analysis capability
US4460999A (en) * 1981-07-15 1984-07-17 Pacific Western Systems, Inc. Memory tester having memory repair analysis under pattern generator control
US4481627A (en) * 1981-10-30 1984-11-06 Honeywell Information Systems Inc. Embedded memory testing method and apparatus
US4456995A (en) * 1981-12-18 1984-06-26 International Business Machines Corporation Apparatus for high speed fault mapping of large memories
US4464747A (en) * 1982-02-18 1984-08-07 The Singer Company High reliability memory
JPS58207152A (ja) * 1982-05-28 1983-12-02 Nec Corp パイプライン演算装置テスト方式
US4498172A (en) * 1982-07-26 1985-02-05 General Electric Company System for polynomial division self-testing of digital networks
US4534028A (en) * 1983-12-01 1985-08-06 Siemens Corporate Research & Support, Inc. Random testing using scan path technique

Also Published As

Publication number Publication date
JPH0223890B2 (enExample) 1990-05-25
DE3379354D1 (en) 1989-04-13
EP0126785A1 (de) 1984-12-05
EP0126785B1 (de) 1989-03-08
US4604746A (en) 1986-08-05

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