JPS59217339A - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法Info
- Publication number
- JPS59217339A JPS59217339A JP58092642A JP9264283A JPS59217339A JP S59217339 A JPS59217339 A JP S59217339A JP 58092642 A JP58092642 A JP 58092642A JP 9264283 A JP9264283 A JP 9264283A JP S59217339 A JPS59217339 A JP S59217339A
- Authority
- JP
- Japan
- Prior art keywords
- film
- mask material
- mask
- material film
- etching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10W10/0143—
-
- H10W10/17—
Landscapes
- Element Separation (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58092642A JPS59217339A (ja) | 1983-05-26 | 1983-05-26 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58092642A JPS59217339A (ja) | 1983-05-26 | 1983-05-26 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59217339A true JPS59217339A (ja) | 1984-12-07 |
| JPH0562463B2 JPH0562463B2 (enExample) | 1993-09-08 |
Family
ID=14060101
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58092642A Granted JPS59217339A (ja) | 1983-05-26 | 1983-05-26 | 半導体装置の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59217339A (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61141171A (ja) * | 1984-12-14 | 1986-06-28 | Toshiba Corp | 半導体装置の製造方法 |
| JPH01276641A (ja) * | 1988-03-24 | 1989-11-07 | Motorola Inc | 半導体デバイスの製造方法 |
| JPH0366145A (ja) * | 1989-07-28 | 1991-03-20 | American Teleph & Telegr Co <Att> | 半導体装置 |
| JPH03148155A (ja) * | 1989-10-25 | 1991-06-24 | Internatl Business Mach Corp <Ibm> | 誘電体充填分離トレンチ形成方法 |
| JPH06177236A (ja) * | 1992-08-31 | 1994-06-24 | Hyundai Electron Ind Co Ltd | トレンチ構造の素子分離膜の製造方法 |
| KR970030214A (ko) * | 1995-11-06 | 1997-06-26 | 김주용 | 웨이퍼 평탄화 방법 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5320873A (en) * | 1976-08-11 | 1978-02-25 | Hitachi Ltd | Semiconductor integrated circuit device |
-
1983
- 1983-05-26 JP JP58092642A patent/JPS59217339A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5320873A (en) * | 1976-08-11 | 1978-02-25 | Hitachi Ltd | Semiconductor integrated circuit device |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61141171A (ja) * | 1984-12-14 | 1986-06-28 | Toshiba Corp | 半導体装置の製造方法 |
| JPH01276641A (ja) * | 1988-03-24 | 1989-11-07 | Motorola Inc | 半導体デバイスの製造方法 |
| JPH0366145A (ja) * | 1989-07-28 | 1991-03-20 | American Teleph & Telegr Co <Att> | 半導体装置 |
| JPH03148155A (ja) * | 1989-10-25 | 1991-06-24 | Internatl Business Mach Corp <Ibm> | 誘電体充填分離トレンチ形成方法 |
| JPH06177236A (ja) * | 1992-08-31 | 1994-06-24 | Hyundai Electron Ind Co Ltd | トレンチ構造の素子分離膜の製造方法 |
| KR970030214A (ko) * | 1995-11-06 | 1997-06-26 | 김주용 | 웨이퍼 평탄화 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0562463B2 (enExample) | 1993-09-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5989977A (en) | Shallow trench isolation process | |
| JPH10199969A (ja) | トレンチ隔離構造を持つ半導体装置の製造方法 | |
| JPH10303290A (ja) | 半導体装置の素子分離方法 | |
| JPH0214782B2 (enExample) | ||
| JPH09129877A (ja) | 半導体装置の製造方法、絶縁ゲート型半導体装置の製造方法および絶縁ゲート型半導体装置 | |
| JPH0427702B2 (enExample) | ||
| JPS59217339A (ja) | 半導体装置の製造方法 | |
| US6849521B2 (en) | Method for manufacturing a semiconductor device | |
| JPS61247051A (ja) | 半導体装置の製造方法 | |
| JP2003243293A (ja) | 半導体装置の製造方法 | |
| US6066543A (en) | Method of manufacturing a gap filling for shallow trench isolation | |
| JP4989817B2 (ja) | 半導体装置およびその製造方法 | |
| JPH07111288A (ja) | 素子分離の形成方法 | |
| JP3483090B2 (ja) | 半導体装置の製造方法 | |
| JPH04209534A (ja) | 半導体装置の製造方法 | |
| KR100520196B1 (ko) | 반도체 장치의 소자 분리막 형성방법 | |
| JPS5976442A (ja) | 半導体装置の製造方法 | |
| US7468298B2 (en) | Method of manufacturing flash memory device | |
| JPS60161632A (ja) | 半導体装置及びその製造方法 | |
| JPH10144660A (ja) | 半導体装置の製造方法 | |
| JPH05190565A (ja) | 半導体装置の製造方法 | |
| KR100532839B1 (ko) | 반도체 제조공정의 샐로우 트렌치 형성방법 | |
| JPS60206039A (ja) | 半導体装置およびその製造方法 | |
| JPS61214537A (ja) | 半導体装置の製造方法 | |
| JPH0758194A (ja) | 半導体装置の製造方法 |