JPS59183317A - 参照位置を再生するための装置 - Google Patents

参照位置を再生するための装置

Info

Publication number
JPS59183317A
JPS59183317A JP5639884A JP5639884A JPS59183317A JP S59183317 A JPS59183317 A JP S59183317A JP 5639884 A JP5639884 A JP 5639884A JP 5639884 A JP5639884 A JP 5639884A JP S59183317 A JPS59183317 A JP S59183317A
Authority
JP
Japan
Prior art keywords
measured
reference mark
objects
scale
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5639884A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0352808B2 (de
Inventor
ホルスト・ブルクハルト
アルフオンス・エルンスト
ホルメル・ドンクシヤツト
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Publication of JPS59183317A publication Critical patent/JPS59183317A/ja
Publication of JPH0352808B2 publication Critical patent/JPH0352808B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/06—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for operation by a null method
    • G01D3/063—Comparing the measuring value with a reference value which periodically or incidentally scans the measuring range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36—Forming the light into pulses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Manipulator (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP5639884A 1983-03-26 1984-03-26 参照位置を再生するための装置 Granted JPS59183317A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19833311203 DE3311203A1 (de) 1983-03-26 1983-03-26 Verfahren zum reproduzieren einer bezugsposition
DE3311203.7 1983-03-26
DE3340866.1 1983-11-11

Publications (2)

Publication Number Publication Date
JPS59183317A true JPS59183317A (ja) 1984-10-18
JPH0352808B2 JPH0352808B2 (de) 1991-08-13

Family

ID=6194855

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5639884A Granted JPS59183317A (ja) 1983-03-26 1984-03-26 参照位置を再生するための装置

Country Status (2)

Country Link
JP (1) JPS59183317A (de)
DE (1) DE3311203A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3340866A1 (de) * 1983-03-26 1985-05-23 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Wegmesseinrichtung
DE3509838A1 (de) * 1985-03-19 1986-10-02 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Positionsmesseinrichtung
DE3527546C1 (de) * 1985-08-01 1986-10-02 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Vorrichtung zum Verbinden einer Positionsmesseinrichtung mit zwei relativ zueinander beweglichen Objekten
DD284772A5 (de) * 1989-06-02 1990-11-21 Veb Carl Zeiss Jena,Dd Verfahren und anordnung zur ueberwachung eines winkel- oder laengenmesssystems an einer maschine
DE10030038B4 (de) * 2000-06-17 2020-10-01 Sew-Eurodrive Gmbh & Co Kg Verfahren zum Betreiben verschiedener Absolutwertgeber für einen Umrichter und Umrichter

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52101065A (en) * 1976-02-20 1977-08-24 Sony Corp Magnetic scale
JPS5349639A (en) * 1976-10-15 1978-05-06 Nippon Denso Co Ltd Detector for rotary reference position
JPS5369657A (en) * 1976-12-02 1978-06-21 Mitsutoyo Seisakusho Digital apparatus for position detection
JPS57191539A (en) * 1981-05-21 1982-11-25 Nec Corp Semiconductor ion sensor

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1673887A1 (de) * 1968-01-16 1972-01-20 Heidenhain Gmbh Dr Johannes Anordnung zur Bestimmung der Lage zweier relativ zueinander beweglicher Teile
DE1933254C3 (de) * 1969-07-01 1979-08-16 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Inkrementales Längen- oder Winkelmeßsystem
DE7101141U (de) * 1971-01-14 1972-01-13 Haeberle G Messeinrichtung fuer werkzeugmaschinen
DE2952106C2 (de) * 1979-12-22 1982-11-04 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Lichtelektrische inkrementale Längen- oder Winkelmeßeinrichtung

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52101065A (en) * 1976-02-20 1977-08-24 Sony Corp Magnetic scale
JPS5349639A (en) * 1976-10-15 1978-05-06 Nippon Denso Co Ltd Detector for rotary reference position
JPS5369657A (en) * 1976-12-02 1978-06-21 Mitsutoyo Seisakusho Digital apparatus for position detection
JPS57191539A (en) * 1981-05-21 1982-11-25 Nec Corp Semiconductor ion sensor

Also Published As

Publication number Publication date
DE3311203C2 (de) 1987-06-11
DE3311203A1 (de) 1984-10-04
JPH0352808B2 (de) 1991-08-13

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