JPS57191539A - Semiconductor ion sensor - Google Patents
Semiconductor ion sensorInfo
- Publication number
- JPS57191539A JPS57191539A JP56076959A JP7695981A JPS57191539A JP S57191539 A JPS57191539 A JP S57191539A JP 56076959 A JP56076959 A JP 56076959A JP 7695981 A JP7695981 A JP 7695981A JP S57191539 A JPS57191539 A JP S57191539A
- Authority
- JP
- Japan
- Prior art keywords
- area
- silicon layer
- substrate
- drain
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- Molecular Biology (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
Abstract
PURPOSE:To facilitate manufacture and to improve yield by providing a silicon layer on a sapphire insulating substrate. CONSTITUTION:At one end on a thin and long sapphire substrate 1, a semiconductor silicon area for constitution part of a sensor covered with an ion sensitive film 9 is formed. From this area 2, a drain area 4, a source area 3, and an earth area the extended to the other end of the substrate 1; the drain area 4 is connected to a drain electrode, and the source area 3 and earth area 5 are short- circuited by a source electrode. Consequently, the reverse surface of the silicon layer is insulated already in the stage of a wafer, and the silicon layer is etched into an island and oxidized thermally to form an insulating film over the surface, thus completely insulating and separating the silicon layer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56076959A JPS57191539A (en) | 1981-05-21 | 1981-05-21 | Semiconductor ion sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56076959A JPS57191539A (en) | 1981-05-21 | 1981-05-21 | Semiconductor ion sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57191539A true JPS57191539A (en) | 1982-11-25 |
JPH027423B2 JPH027423B2 (en) | 1990-02-19 |
Family
ID=13620318
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56076959A Granted JPS57191539A (en) | 1981-05-21 | 1981-05-21 | Semiconductor ion sensor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57191539A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59183317A (en) * | 1983-03-26 | 1984-10-18 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | Method and device for regenerating position of reference |
JPS6082846A (en) * | 1983-10-12 | 1985-05-11 | Sumitomo Electric Ind Ltd | Electric field effect type semiconductor sensor |
JPS6150263U (en) * | 1984-09-05 | 1986-04-04 | ||
JPS6150262U (en) * | 1984-09-05 | 1986-04-04 | ||
JPS63165747A (en) * | 1986-12-26 | 1988-07-09 | Kanegafuchi Chem Ind Co Ltd | Amorphous semiconductor ion sensor |
US8502277B2 (en) | 2003-08-29 | 2013-08-06 | Japan Science And Technology Agency | Field-effect transistor, single-electron transistor and sensor using the same |
-
1981
- 1981-05-21 JP JP56076959A patent/JPS57191539A/en active Granted
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59183317A (en) * | 1983-03-26 | 1984-10-18 | ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミト・ベシユレンクテル・ハフツング | Method and device for regenerating position of reference |
JPH0352808B2 (en) * | 1983-03-26 | 1991-08-13 | Dokutoru Yohanesu Haidenhain Gmbh | |
JPS6082846A (en) * | 1983-10-12 | 1985-05-11 | Sumitomo Electric Ind Ltd | Electric field effect type semiconductor sensor |
JPS6150263U (en) * | 1984-09-05 | 1986-04-04 | ||
JPS6150262U (en) * | 1984-09-05 | 1986-04-04 | ||
JPH0345177Y2 (en) * | 1984-09-05 | 1991-09-24 | ||
JPS63165747A (en) * | 1986-12-26 | 1988-07-09 | Kanegafuchi Chem Ind Co Ltd | Amorphous semiconductor ion sensor |
JPH0432344B2 (en) * | 1986-12-26 | 1992-05-29 | ||
US8502277B2 (en) | 2003-08-29 | 2013-08-06 | Japan Science And Technology Agency | Field-effect transistor, single-electron transistor and sensor using the same |
US8766326B2 (en) | 2003-08-29 | 2014-07-01 | Japan Science And Technology Agency | Field-effect transistor, single-electron transistor and sensor |
US8772099B2 (en) | 2003-08-29 | 2014-07-08 | Japan Science And Technology Agency | Method of use of a field-effect transistor, single-electron transistor and sensor |
US9506892B2 (en) | 2003-08-29 | 2016-11-29 | Japan Science And Technology Agency | Field-effect transistor, single-electron transistor and sensor using the same |
Also Published As
Publication number | Publication date |
---|---|
JPH027423B2 (en) | 1990-02-19 |
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