JPS59140442U - 半導体素子のマ−キング装置 - Google Patents

半導体素子のマ−キング装置

Info

Publication number
JPS59140442U
JPS59140442U JP3496183U JP3496183U JPS59140442U JP S59140442 U JPS59140442 U JP S59140442U JP 3496183 U JP3496183 U JP 3496183U JP 3496183 U JP3496183 U JP 3496183U JP S59140442 U JPS59140442 U JP S59140442U
Authority
JP
Japan
Prior art keywords
semiconductor devices
marking
marking equipment
chip
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3496183U
Other languages
English (en)
Japanese (ja)
Other versions
JPS638131Y2 (OSRAM
Inventor
藤田　年男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3496183U priority Critical patent/JPS59140442U/ja
Publication of JPS59140442U publication Critical patent/JPS59140442U/ja
Application granted granted Critical
Publication of JPS638131Y2 publication Critical patent/JPS638131Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3496183U 1983-03-11 1983-03-11 半導体素子のマ−キング装置 Granted JPS59140442U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3496183U JPS59140442U (ja) 1983-03-11 1983-03-11 半導体素子のマ−キング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3496183U JPS59140442U (ja) 1983-03-11 1983-03-11 半導体素子のマ−キング装置

Publications (2)

Publication Number Publication Date
JPS59140442U true JPS59140442U (ja) 1984-09-19
JPS638131Y2 JPS638131Y2 (OSRAM) 1988-03-10

Family

ID=30165675

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3496183U Granted JPS59140442U (ja) 1983-03-11 1983-03-11 半導体素子のマ−キング装置

Country Status (1)

Country Link
JP (1) JPS59140442U (OSRAM)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55122351U (OSRAM) * 1979-02-20 1980-08-30
JPS57170551U (OSRAM) * 1981-04-22 1982-10-27

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55122351U (OSRAM) * 1979-02-20 1980-08-30
JPS57170551U (OSRAM) * 1981-04-22 1982-10-27

Also Published As

Publication number Publication date
JPS638131Y2 (OSRAM) 1988-03-10

Similar Documents

Publication Publication Date Title
JPS59140442U (ja) 半導体素子のマ−キング装置
JPS5918432U (ja) 半導体素子特性測定装置
JPS6056285U (ja) 半導体ｉｃ試験装置
JPS59151441U (ja) 半導体試験装置
JPS60183442U (ja) 集積回路測定治具
JPS60118237U (ja) 半導体素子のマ−キング装置
JPS5896276U (ja) 集積回路用測定治具
JPS60116241U (ja) 半導体ウエハ−検査装置
JPS59115642U (ja) 半導体ウエフア
JPS59166447U (ja) 半導体集積回路
JPS5916139U (ja) 集積回路
JPS59103441U (ja) 半導体集積回路
JPS58148933U (ja) 集積回路測定装置
JPS60144237U (ja) 半導体装置の検査装置
JPS60113992U (ja) 半導体集積回路装置用ソケツト
JPS58164236U (ja) 半導体ウエ−ハ特性測定装置
JPS6117737U (ja) 半導体装置
JPS59125837U (ja) 半導体検査装置
JPS5955873U (ja) 半導体ｉｃ用ソケツト
JPS58148941U (ja) 半導体装置
JPS59121834U (ja) ワイヤボンデイング装置
JPS598171U (ja) 電子部品試験装置の端子接続装置
JPS5887343U (ja) Ｉｃテスタ−のテストプロ−バ−構造
JPS5939933U (ja) プロ−ブカ−ド
JPS5998445U (ja) ホトマスク