JPS5838938B2 - 半導体集積回路 - Google Patents
半導体集積回路Info
- Publication number
- JPS5838938B2 JPS5838938B2 JP51092467A JP9246776A JPS5838938B2 JP S5838938 B2 JPS5838938 B2 JP S5838938B2 JP 51092467 A JP51092467 A JP 51092467A JP 9246776 A JP9246776 A JP 9246776A JP S5838938 B2 JPS5838938 B2 JP S5838938B2
- Authority
- JP
- Japan
- Prior art keywords
- region
- impurity density
- channel
- low impurity
- main surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title claims description 17
- 239000012535 impurity Substances 0.000 claims description 70
- 239000013078 crystal Substances 0.000 claims description 10
- 230000006698 induction Effects 0.000 claims description 10
- 238000009792 diffusion process Methods 0.000 claims description 6
- 230000003068 static effect Effects 0.000 claims description 6
- 239000000758 substrate Substances 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims 2
- 239000002184 metal Substances 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 8
- 230000010354 integration Effects 0.000 description 7
- 238000000206 photolithography Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 230000003321 amplification Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 5
- 239000000969 carrier Substances 0.000 description 5
- 238000003199 nucleic acid amplification method Methods 0.000 description 5
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 238000005530 etching Methods 0.000 description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
- H03K19/082—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using bipolar transistors
- H03K19/091—Integrated injection logic or merged transistor logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0214—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L
- H01L27/0218—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L of field effect structures
- H01L27/0225—Charge injection in static induction transistor logic structures [SITL]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0705—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type
- H01L27/0711—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors
- H01L27/0716—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors in combination with vertical bipolar transistors and diodes, or capacitors, or resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0705—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type
- H01L27/0711—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors
- H01L27/0722—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with bipolar transistors and diodes, or capacitors, or resistors in combination with lateral bipolar transistors and diodes, or capacitors, or resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/0804—Emitter regions of bipolar transistors
- H01L29/0808—Emitter regions of bipolar transistors of lateral transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1066—Gate region of field-effect devices with PN junction gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
- H01L29/732—Vertical transistors
- H01L29/7327—Inverse vertical transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
- H01L29/735—Lateral transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Junction Field-Effect Transistors (AREA)
- Bipolar Transistors (AREA)
- Logic Circuits (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51092467A JPS5838938B2 (ja) | 1976-08-03 | 1976-08-03 | 半導体集積回路 |
| GB32256/77A GB1599177A (en) | 1976-08-03 | 1977-08-01 | Semiconductor integrated circuit devices |
| IT26427/77A IT1085678B (it) | 1976-08-03 | 1977-08-02 | Circuito logico integrato a semiconduttori a transistor ad induzione statica |
| NLAANVRAGE7708526,A NL186282C (nl) | 1976-08-03 | 1977-08-02 | Geintegreerde schakeling omvattende ten minste een halfgeleiderpoortschakeling van het injektietype met een statische inductietransistor. |
| DE19772734997 DE2734997A1 (de) | 1976-08-03 | 1977-08-03 | Integrierte halbleiterschaltung |
| FR7723955A FR2360994A1 (fr) | 1976-08-03 | 1977-08-03 | Circuit integre semi-conducteur, logique a transistors a induction statique |
| US07/009,017 US4811064A (en) | 1976-08-03 | 1987-01-28 | Static induction transistor and integrated circuit device using same |
| NL8903191A NL8903191A (nl) | 1976-08-03 | 1989-12-29 | Geintegreerde logische keten met statische inductietransistorlogica. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51092467A JPS5838938B2 (ja) | 1976-08-03 | 1976-08-03 | 半導体集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5318392A JPS5318392A (en) | 1978-02-20 |
| JPS5838938B2 true JPS5838938B2 (ja) | 1983-08-26 |
Family
ID=14055136
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51092467A Expired JPS5838938B2 (ja) | 1976-08-03 | 1976-08-03 | 半導体集積回路 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4811064A (de) |
| JP (1) | JPS5838938B2 (de) |
| DE (1) | DE2734997A1 (de) |
| FR (1) | FR2360994A1 (de) |
| GB (1) | GB1599177A (de) |
| IT (1) | IT1085678B (de) |
| NL (2) | NL186282C (de) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01106029U (de) * | 1988-01-08 | 1989-07-17 | ||
| JPH0523362U (ja) * | 1991-03-14 | 1993-03-26 | 株式会社カンセイ | ハンドルスイツチ |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5335477A (en) * | 1976-09-14 | 1978-04-01 | Toshiba Corp | Semiconductor unit |
| US4284997A (en) * | 1977-07-07 | 1981-08-18 | Zaidan Hojin Handotai Kenkyu Shinkokai | Static induction transistor and its applied devices |
| JPS5466080A (en) * | 1977-11-05 | 1979-05-28 | Nippon Gakki Seizo Kk | Semiconductor device |
| JPS5936832B2 (ja) * | 1978-03-14 | 1984-09-06 | 株式会社日立製作所 | 半導体スイッチング素子 |
| JP2538984B2 (ja) * | 1988-04-20 | 1996-10-02 | 株式会社豊田自動織機製作所 | 静電誘導形半導体装置 |
| US5177029A (en) * | 1989-03-28 | 1993-01-05 | Matsushita Electric Works, Ltd. | Method for manufacturing static induction type semiconductor device enhancement mode power |
| JP3086713B2 (ja) * | 1991-05-10 | 2000-09-11 | 株式会社豊田自動織機製作所 | 静電誘導形半導体装置 |
| US5313234A (en) * | 1991-07-26 | 1994-05-17 | Sayett Group, Inc. | Liquid crystal projector |
| US5612547A (en) * | 1993-10-18 | 1997-03-18 | Northrop Grumman Corporation | Silicon carbide static induction transistor |
| US5498997A (en) * | 1994-12-23 | 1996-03-12 | Schiebold; Cristopher F. | Transformerless audio amplifier |
| WO2004104825A1 (en) * | 2003-05-15 | 2004-12-02 | Applianz Technologies, Inc. | Systems and methods of creating and accessing software simulated computers |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5156185A (de) * | 1974-11-12 | 1976-05-17 | Tokyo Shibaura Electric Co | |
| JPS5160177A (en) * | 1974-09-03 | 1976-05-25 | Western Electric Co | Handotaisochi oyobi sonoseizohoho |
| JPS5292468A (en) * | 1975-12-09 | 1977-08-03 | Handotai Kenkyu Shinkokai | Ic having inverted electrostatic induction transistor |
| JPS52128082A (en) * | 1976-04-20 | 1977-10-27 | Matsushita Electric Ind Co Ltd | Semiconductor device and its manufacture |
| JPS52154387A (en) * | 1976-06-17 | 1977-12-22 | Matsushita Electric Ind Co Ltd | Semiconductor device |
| JPS52155072A (en) * | 1976-06-18 | 1977-12-23 | Matsushita Electric Ind Co Ltd | Production of semiconductor device |
| JPS535585A (en) * | 1976-07-05 | 1978-01-19 | Nippon Gakki Seizo Kk | Semiconductor ic unit |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3354362A (en) * | 1965-03-23 | 1967-11-21 | Hughes Aircraft Co | Planar multi-channel field-effect tetrode |
| US3430113A (en) * | 1965-10-04 | 1969-02-25 | Us Air Force | Current modulated field effect transistor |
| DE1764911A1 (de) * | 1968-09-02 | 1971-12-02 | Telefunken Patent | Unipolaranordnung |
| NL7107040A (de) * | 1971-05-22 | 1972-11-24 | ||
| US3827034A (en) * | 1972-09-14 | 1974-07-30 | Ferranti Ltd | Semiconductor information storage devices |
-
1976
- 1976-08-03 JP JP51092467A patent/JPS5838938B2/ja not_active Expired
-
1977
- 1977-08-01 GB GB32256/77A patent/GB1599177A/en not_active Expired
- 1977-08-02 NL NLAANVRAGE7708526,A patent/NL186282C/xx not_active IP Right Cessation
- 1977-08-02 IT IT26427/77A patent/IT1085678B/it active
- 1977-08-03 DE DE19772734997 patent/DE2734997A1/de active Granted
- 1977-08-03 FR FR7723955A patent/FR2360994A1/fr active Granted
-
1987
- 1987-01-28 US US07/009,017 patent/US4811064A/en not_active Expired - Fee Related
-
1989
- 1989-12-29 NL NL8903191A patent/NL8903191A/nl not_active Application Discontinuation
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5160177A (en) * | 1974-09-03 | 1976-05-25 | Western Electric Co | Handotaisochi oyobi sonoseizohoho |
| JPS5156185A (de) * | 1974-11-12 | 1976-05-17 | Tokyo Shibaura Electric Co | |
| JPS5292468A (en) * | 1975-12-09 | 1977-08-03 | Handotai Kenkyu Shinkokai | Ic having inverted electrostatic induction transistor |
| JPS52128082A (en) * | 1976-04-20 | 1977-10-27 | Matsushita Electric Ind Co Ltd | Semiconductor device and its manufacture |
| JPS52154387A (en) * | 1976-06-17 | 1977-12-22 | Matsushita Electric Ind Co Ltd | Semiconductor device |
| JPS52155072A (en) * | 1976-06-18 | 1977-12-23 | Matsushita Electric Ind Co Ltd | Production of semiconductor device |
| JPS535585A (en) * | 1976-07-05 | 1978-01-19 | Nippon Gakki Seizo Kk | Semiconductor ic unit |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01106029U (de) * | 1988-01-08 | 1989-07-17 | ||
| JPH0523362U (ja) * | 1991-03-14 | 1993-03-26 | 株式会社カンセイ | ハンドルスイツチ |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5318392A (en) | 1978-02-20 |
| FR2360994A1 (fr) | 1978-03-03 |
| DE2734997A1 (de) | 1978-02-16 |
| NL7708526A (nl) | 1978-02-07 |
| NL8903191A (nl) | 1990-04-02 |
| DE2734997C2 (de) | 1993-07-01 |
| FR2360994B1 (de) | 1983-11-04 |
| GB1599177A (en) | 1981-09-30 |
| NL186282B (nl) | 1990-05-16 |
| NL186282C (nl) | 1990-10-16 |
| IT1085678B (it) | 1985-05-28 |
| US4811064A (en) | 1989-03-07 |
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