JPS58159161A - 自己診断機能を有する電子機器 - Google Patents

自己診断機能を有する電子機器

Info

Publication number
JPS58159161A
JPS58159161A JP57042131A JP4213182A JPS58159161A JP S58159161 A JPS58159161 A JP S58159161A JP 57042131 A JP57042131 A JP 57042131A JP 4213182 A JP4213182 A JP 4213182A JP S58159161 A JPS58159161 A JP S58159161A
Authority
JP
Japan
Prior art keywords
display
diagnosis
ram
cpu
self
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57042131A
Other languages
English (en)
Japanese (ja)
Other versions
JPS635782B2 (enrdf_load_stackoverflow
Inventor
Hidemi Yokogawa
横川　秀美
Teruo Manome
馬目　輝夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Priority to JP57042131A priority Critical patent/JPS58159161A/ja
Publication of JPS58159161A publication Critical patent/JPS58159161A/ja
Publication of JPS635782B2 publication Critical patent/JPS635782B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57042131A 1982-03-17 1982-03-17 自己診断機能を有する電子機器 Granted JPS58159161A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57042131A JPS58159161A (ja) 1982-03-17 1982-03-17 自己診断機能を有する電子機器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57042131A JPS58159161A (ja) 1982-03-17 1982-03-17 自己診断機能を有する電子機器

Publications (2)

Publication Number Publication Date
JPS58159161A true JPS58159161A (ja) 1983-09-21
JPS635782B2 JPS635782B2 (enrdf_load_stackoverflow) 1988-02-05

Family

ID=12627375

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57042131A Granted JPS58159161A (ja) 1982-03-17 1982-03-17 自己診断機能を有する電子機器

Country Status (1)

Country Link
JP (1) JPS58159161A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3016752U (ja) * 1995-04-07 1995-10-09 義英 土橋 前方傾斜式画面フィルター

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51126729A (en) * 1975-04-26 1976-11-05 Nec Corp Control system of storage.
JPS52104023A (en) * 1976-02-27 1977-09-01 Hitachi Ltd Information processing unit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51126729A (en) * 1975-04-26 1976-11-05 Nec Corp Control system of storage.
JPS52104023A (en) * 1976-02-27 1977-09-01 Hitachi Ltd Information processing unit

Also Published As

Publication number Publication date
JPS635782B2 (enrdf_load_stackoverflow) 1988-02-05

Similar Documents

Publication Publication Date Title
JPS60124744A (ja) エラ−・テスト及び診断装置
JPS5833576B2 (ja) 計算機システムの故障診断装置
JPH0743429A (ja) 物理アドレス変換回路
JPS58159161A (ja) 自己診断機能を有する電子機器
JPS588018B2 (ja) 多重プロセッサシステム
US4725976A (en) Programmable controller
JPH0662114A (ja) プロセッサ間診断処理方式
JPS58121459A (ja) 電子計算機のサ−ビスプロセツサ
JPS5810853A (ja) 集積回路
JPS59123056A (ja) 冗長機能自動切替システム
JPS6127778B2 (enrdf_load_stackoverflow)
JP2876606B2 (ja) 情報処理装置
JPH04257042A (ja) メモリの診断方法
JPS61840A (ja) 携帯用デ−タ端末の自己診断装置
JPS61117630A (ja) デ−タ処理装置の構成検査方法
JPS6255157B2 (enrdf_load_stackoverflow)
JP2704935B2 (ja) テスト機能付きプロセッサ
JPH0116193Y2 (enrdf_load_stackoverflow)
JPS628829B2 (enrdf_load_stackoverflow)
JPS627582B2 (enrdf_load_stackoverflow)
JPS5878233A (ja) マイクロプログラム制御装置
JPS62235664A (ja) 記憶装置
JPS5918741B2 (ja) 自動診断方式
JPS59128653A (ja) 状態履歴記憶制御装置
JPH0423152A (ja) 演算処理装置における診断装置