JPS58128735A - X線アライナ - Google Patents

X線アライナ

Info

Publication number
JPS58128735A
JPS58128735A JP57010005A JP1000582A JPS58128735A JP S58128735 A JPS58128735 A JP S58128735A JP 57010005 A JP57010005 A JP 57010005A JP 1000582 A JP1000582 A JP 1000582A JP S58128735 A JPS58128735 A JP S58128735A
Authority
JP
Japan
Prior art keywords
mask
wafer
stage
alignment
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57010005A
Other languages
English (en)
Japanese (ja)
Other versions
JPS632137B2 (cg-RX-API-DMAC7.html
Inventor
Yoshihiro Yoneyama
米山 義弘
Motoya Taniguchi
素也 谷口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57010005A priority Critical patent/JPS58128735A/ja
Publication of JPS58128735A publication Critical patent/JPS58128735A/ja
Publication of JPS632137B2 publication Critical patent/JPS632137B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Details Of Measuring And Other Instruments (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP57010005A 1982-01-27 1982-01-27 X線アライナ Granted JPS58128735A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57010005A JPS58128735A (ja) 1982-01-27 1982-01-27 X線アライナ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57010005A JPS58128735A (ja) 1982-01-27 1982-01-27 X線アライナ

Publications (2)

Publication Number Publication Date
JPS58128735A true JPS58128735A (ja) 1983-08-01
JPS632137B2 JPS632137B2 (cg-RX-API-DMAC7.html) 1988-01-18

Family

ID=11738290

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57010005A Granted JPS58128735A (ja) 1982-01-27 1982-01-27 X線アライナ

Country Status (1)

Country Link
JP (1) JPS58128735A (cg-RX-API-DMAC7.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07209876A (ja) * 1995-01-30 1995-08-11 Canon Inc X線転写装置及び方法
US5443932A (en) * 1988-09-30 1995-08-22 Canon Kabushiki Kaisha Exposure method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01187434A (ja) * 1988-01-22 1989-07-26 Mc Sci:Kk 熱機械分析装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5021232A (cg-RX-API-DMAC7.html) * 1973-06-28 1975-03-06
JPS51111076A (en) * 1975-03-26 1976-10-01 Hitachi Ltd Exposure device
JPS541553A (en) * 1977-06-07 1979-01-08 Toshiba Corp Group management control method of elevator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5021232A (cg-RX-API-DMAC7.html) * 1973-06-28 1975-03-06
JPS51111076A (en) * 1975-03-26 1976-10-01 Hitachi Ltd Exposure device
JPS541553A (en) * 1977-06-07 1979-01-08 Toshiba Corp Group management control method of elevator

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5443932A (en) * 1988-09-30 1995-08-22 Canon Kabushiki Kaisha Exposure method
JPH07209876A (ja) * 1995-01-30 1995-08-11 Canon Inc X線転写装置及び方法

Also Published As

Publication number Publication date
JPS632137B2 (cg-RX-API-DMAC7.html) 1988-01-18

Similar Documents

Publication Publication Date Title
EP0992855B1 (en) Apparatus for projecting a mask pattern on a substrate
JP4171159B2 (ja) リソグラフィック投影装置のオフアキシレベリング
US7694426B2 (en) Method for eliminating sources of error in the system correction of a coordinate measuring machine
JP6316800B2 (ja) 半導体検査ツールにおいてサンプルステージの運動を時間遅延積分電荷結合素子で同期させる装置および方法
TW201142236A (en) Lithographic apparatus and device manufacturing method
JPS6351241B2 (cg-RX-API-DMAC7.html)
US20090073458A1 (en) Means and method for determining the spatial position of moving elements of a coordinate measuring machine
JPH05226223A (ja) 露光装置
JP3598983B2 (ja) 超精密形状測定方法及びその装置
JPS63140989A (ja) 位置決め装置
JPS58128735A (ja) X線アライナ
US20070035731A1 (en) Direct alignment in mask aligners
JP2868548B2 (ja) アライメント装置
JPH11194022A (ja) 半導体ウェーハの平坦度測定装置
JP3940819B2 (ja) 半導体ウェーハの表面形状測定装置および表面形状測定方法
JPH01228130A (ja) 投影露光方法およびその装置
JPH04150012A (ja) 露光方法及び装置
JP2860567B2 (ja) 露光装置
JPH0766115A (ja) 露光装置
JP3237022B2 (ja) 投影露光装置
JP2829649B2 (ja) アライメント装置
JPH0782390B2 (ja) ステージ位置決め方法
JP2882821B2 (ja) アライメント装置
JP3326290B2 (ja) 露光方法
JPH01292206A (ja) 物体の表面状態測定装置及び表面の高さ測定装置